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Title: Reconstruction of simulated electrostatic potentials by automatic differentiation-based phase retrieval in electron microscopy imaging

Journal Article · · MRS communications

Measuring interfacial electrostatic potentials is vital to understanding many fundamental materials properties. A variety of TEM methods exist for measuring electric potentials from the phase shift produced on an electron wave as it passes through a sample. However, most are either experimentally challenging or poorly suited to resolving nanoscale features. Here, we demonstrate the viability of a simple, automatic differentiation-based exit wave reconstruction from a focal series of images to accurately measure nanoscale electric potentials. Here, the analysis suggests that under optimal measurement conditions, electric potentials can be resolved to less than 0.06 V in magnitude and less than 1 nm in spatial extent.

Research Organization:
Northwestern University, Evanston, IL (United States)
Sponsoring Organization:
Division of Materials Research; USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC02-06CH11357; SC0023438
OSTI ID:
1996494
Journal Information:
MRS communications, Journal Name: MRS communications Journal Issue: 5 Vol. 13; ISSN 2159-6867
Publisher:
Springer NatureCopyright Statement
Country of Publication:
United States
Language:
English

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