Modulating Electron Beam–Sample Interactions in Imaging and Diffraction Modes by Dose Fractionation with Low Dose Rates

Kisielowski, Christian; Specht, Petra; Rozeveld, Steven J.; Kang, Joo; Fielitz, Alyssa J.; Barton, David; Salazar, Anthony C.; Dubon, Oscar D.; Van Dyck, Dirk; Yancey, David F.

doi:10.1017/S143192762101268X

Title: Modulating Electron Beam–Sample Interactions in Imaging and Diffraction Modes by Dose Fractionation with Low Dose Rates

Journal Article · 01 December 2021 · Microscopy and Microanalysis

DOI: https://doi.org/10.1017/S143192762101268X · OSTI ID:1983419

Kisielowski, Christian; Specht, Petra; Rozeveld, Steven J.; Kang, Joo; Fielitz, Alyssa J.; Barton, David; Salazar, Anthony C.; Dubon, Oscar D.; Van Dyck, Dirk; Yancey, David F.

Abstract Technological opportunities are explored to enhance detection schemes in transmission electron microscopy (TEM) that build on the detection of single-electron scattering events across the typical spectrum of interdisciplinary applications. They range from imaging with high spatiotemporal resolution to diffraction experiments at the window to quantum mechanics, where the wave-particle dualism of single electrons is evident. At the ultimate detection limit, where isolated electrons are delivered to interact with solids, we find that the beam current dominates damage processes instead of the deposited electron charge, which can be exploited to modify electron beam-induced sample alterations. The results are explained by assuming that all electron scattering are inelastic and include phonon excitation that can hardly be distinguished from elastic electron scattering. Consequently, a coherence length and a related coherence time exist that reflect the interaction of the electron with the sample and change linearly with energy loss. Phonon excitations are of small energy (<100 meV), but they occur frequently and scale with beam current in the irradiated area, which is why we can detect their contribution to beam-induced sample alterations and damage.

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Sponsoring Organization:: USDOE

OSTI ID:: 1983419

Journal Information:: Microscopy and Microanalysis, Journal Name: Microscopy and Microanalysis Journal Issue: 6 Vol. 27; ISSN 1431-9276

Publisher:: Oxford University PressCopyright Statement

Country of Publication:: United States

Language:: English

References (49)

Discovering Hidden Material Properties of MgCl ₂ at Atomic Resolution with Structured Temporal Electron Illumination of Picosecond Time Resolution Kisielowski, Christian; Specht, Petra; Freitag, Bert Advanced Functional Materials, Vol. 29, Issue 11 https://doi.org/10.1002/adfm.201807818	journal	January 2019
Observing Atoms at Work by Controlling Beam-Sample Interactions Kisielowski, Christian Advanced Materials, Vol. 27, Issue 38 https://doi.org/10.1002/adma.201500082	journal	June 2015
Visualizing the Stoichiometry of Industrial-Style Co-Mo-S Catalysts with Single-Atom Sensitivity Zhu, Yuanyuan; Ramasse, Quentin M.; Brorson, Michael Angewandte Chemie International Edition, Vol. 53, Issue 40 https://doi.org/10.1002/anie.201405690	journal	July 2014
From Electron Crystallography to Single Particle CryoEM (Nobel Lecture) Henderson, Richard Angewandte Chemie International Edition, Vol. 57, Issue 34 https://doi.org/10.1002/anie.201802731	journal	July 2018
Development of realistic models for Double Metal Cyanide catalyst active sites Wojdeł, Jacek C.; Bromley, Stefan T.; Illas, Francesc Journal of Molecular Modeling, Vol. 13, Issue 6-7 https://doi.org/10.1007/s00894-007-0218-3	journal	June 2007
On the pressing need to address beam–sample interactions in atomic resolution electron microscopy Kisielowski, Christian Journal of Materials Science, Vol. 51, Issue 2 https://doi.org/10.1007/s10853-015-9545-4	journal	November 2015
Aspects of electron diffraction from radiation-damaged crystals Van Dyck, D.; Wilkens, M. Ultramicroscopy, Vol. 14, Issue 3 https://doi.org/10.1016/0304-3991(84)90092-5	journal	January 1984
Quantitative analysis of image contrast in electron micrographs of beam-sensitive crystals Henderson, Richard; Glaeser, Robert M. Ultramicroscopy, Vol. 16, Issue 2 https://doi.org/10.1016/0304-3991(85)90069-5	journal	January 1985
Use of spot-scan procedure for recording low-dose micrographs of beam-sensitive specimens Bullough, Per; Henderson, Richard Ultramicroscopy, Vol. 21, Issue 3 https://doi.org/10.1016/0304-3991(87)90147-1	journal	January 1987
Is there an electron wind? Marks, L. D.; Zhang, J. P. Ultramicroscopy, Vol. 41, Issue 4 https://doi.org/10.1016/0304-3991(92)90221-5	journal	June 1992
Inelastic scattering and holography Van Dyck, D.; Lichte, H.; Spence, J. C. H. Ultramicroscopy, Vol. 81, Issue 3-4 https://doi.org/10.1016/S0304-3991(00)00002-4	journal	April 2000
Inelastic electron holography Lichte, Hannes; Freitag, Bert Ultramicroscopy, Vol. 81, Issue 3-4 https://doi.org/10.1016/S0304-3991(99)00188-6	journal	April 2000
Specimen Behavior in the Electron Beam Glaeser, R. M. Methods in Enzymology https://doi.org/10.1016/bs.mie.2016.04.010	book	January 2016
Primary radiation damage: A review of current understanding and models Nordlund, Kai; Zinkle, Steven J.; Sand, Andrea E. Journal of Nuclear Materials, Vol. 512 https://doi.org/10.1016/j.jnucmat.2018.10.027	journal	December 2018
Instrumental requirements for the detection of electron beam-induced object excitations at the single atom level in high-resolution transmission electron microscopy Kisielowski, C.; Specht, P.; Gygax, S. M. Micron, Vol. 68 https://doi.org/10.1016/j.micron.2014.07.010	journal	January 2015
Do you believe that atoms stay in place when you observe them in HREM? Van Dyck, Dirk; Lobato, Ivan; Chen, Fu-Rong Micron, Vol. 68 https://doi.org/10.1016/j.micron.2014.09.003	journal	January 2015
Radiation damage to organic and inorganic specimens in the TEM Egerton, R. F. Micron, Vol. 119 https://doi.org/10.1016/j.micron.2019.01.005	journal	April 2019
On the chemical homogeneity of InxGa1−xN alloys – Electron microscopy at the edge of technical limits Specht, Petra; Kisielowski, Christian Materials Science in Semiconductor Processing, Vol. 65 https://doi.org/10.1016/j.mssp.2016.07.011	journal	July 2017
Stroboscopic image capture: Reducing the dose per frame by a factor of 30 does not prevent beam-induced specimen movement in paraffin Typke, Dieter; Gilpin, Christopher J.; Downing, Kenneth H. Ultramicroscopy, Vol. 107, Issue 2-3 https://doi.org/10.1016/j.ultramic.2006.06.005	journal	February 2007
Imaging of soft and hard materials using a Boersch phase plate in a transmission electron microscope Alloyeau, D.; Hsieh, W. K.; Anderson, E. H. Ultramicroscopy, Vol. 110, Issue 5 https://doi.org/10.1016/j.ultramic.2009.11.016	journal	April 2010
On the dose-rate threshold of beam damage in TEM Jiang, Nan; Spence, John C. H. Ultramicroscopy, Vol. 113 https://doi.org/10.1016/j.ultramic.2011.11.016	journal	February 2012
Using a monochromator to improve the resolution in TEM to below 0.5Å. Part I: Creating highly coherent monochromated illumination Tiemeijer, P. C.; Bischoff, M.; Freitag, B. Ultramicroscopy, Vol. 114 https://doi.org/10.1016/j.ultramic.2012.01.008	journal	March 2012
Ranking TEM cameras by their response to electron shot noise Grob, Patricia; Bean, Derek; Typke, Dieter Ultramicroscopy, Vol. 133 https://doi.org/10.1016/j.ultramic.2013.01.003	journal	October 2013
Recording low and high spatial frequencies in exit wave reconstructions Haigh, S. J.; Jiang, B.; Alloyeau, D. Ultramicroscopy, Vol. 133 https://doi.org/10.1016/j.ultramic.2013.04.012	journal	October 2013
Controlling electron beam-induced structure modifications and cation exchange in cadmium sulfide–copper sulfide heterostructured nanorods Zheng, Haimei; Sadtler, Bryce; Habenicht, Carsten Ultramicroscopy, Vol. 134 https://doi.org/10.1016/j.ultramic.2013.05.004	journal	November 2013
The correction of electron lens aberrations Hawkes, P. W. Ultramicroscopy, Vol. 156 https://doi.org/10.1016/j.ultramic.2015.03.007	journal	September 2015
High quality ultrafast transmission electron microscopy using resonant microwave cavities Verhoeven, W.; van Rens, J. F. M.; Kieft, E. R. Ultramicroscopy, Vol. 188 https://doi.org/10.1016/j.ultramic.2018.03.012	journal	May 2018
Modelling electron beam induced dynamics in metallic nanoclusters Knez, Daniel; Schnedlitz, Martin; Lasserus, Maximilian Ultramicroscopy, Vol. 192 https://doi.org/10.1016/j.ultramic.2018.05.007	journal	September 2018
Speckle Suppression by Decoherence in Fluctuation Electron Microscopy Rezikyan, Aram; Jibben, Zechariah J.; Rock, Bryan A. Microscopy and Microanalysis, Vol. 21, Issue 6 https://doi.org/10.1017/S1431927615015135	journal	September 2015
The Ultimate Detection Limit: Building Electron Diffraction Patterns One Electron at a Time Kisielowski, Christian; Specht, Petra; Yancey, David Microscopy and Microanalysis, Vol. 26, Issue S2 https://doi.org/10.1017/S1431927620023065	journal	July 2020
Formation of Defects in Two-Dimensional MoS ₂ in the Transmission Electron Microscope at Electron Energies below the Knock-on Threshold: The Role of Electronic Excitations Kretschmer, Silvan; Lehnert, Tibor; Kaiser, Ute Nano Letters, Vol. 20, Issue 4 https://doi.org/10.1021/acs.nanolett.0c00670	journal	March 2020
Reducing Radiation Damage in Soft Matter with Femtosecond-Timed Single-Electron Packets VandenBussche, Elisah J.; Flannigan, David J. Nano Letters, Vol. 19, Issue 9 https://doi.org/10.1021/acs.nanolett.9b03074	journal	August 2019
4D Electron Microscopy: Principles and Applications Flannigan, David J.; Zewail, Ahmed H. Accounts of Chemical Research, Vol. 45, Issue 10 https://doi.org/10.1021/ar3001684	journal	August 2012
The Crystal Structure of Molybdenite Dickinson, Roscoe G.; Pauling, Linus Journal of the American Chemical Society, Vol. 45, Issue 6 https://doi.org/10.1021/ja01659a020	journal	June 1923
Quantitative Measurement of the Surface Self-Diffusion on Au Nanoparticles by Aberration-Corrected Transmission Electron Microscopy Surrey, A.; Pohl, D.; Schultz, L. Nano Letters, Vol. 12, Issue 12, p. 6071-6077 https://doi.org/10.1021/nl302280x	journal	February 2012
Quantum coherent optical phase modulation in an ultrafast transmission electron microscope Feist, Armin; Echternkamp, Katharina E.; Schauss, Jakob Nature, Vol. 521, Issue 7551 https://doi.org/10.1038/nature14463	journal	May 2015
In-line three-dimensional holography of nanocrystalline objects at atomic resolution Chen, F. -R.; Van Dyck, D.; Kisielowski, C. Nature Communications, Vol. 7, Issue 1 https://doi.org/10.1038/ncomms10603	journal	February 2016
Electronics and optoelectronics of two-dimensional transition metal dichalcogenides Wang, Qing Hua; Kalantar-Zadeh, Kourosh; Kis, Andras Nature Nanotechnology, Vol. 7, Issue 11, p. 699-712 https://doi.org/10.1038/nnano.2012.193	journal	November 2012
Visualizing atomic-scale redox dynamics in vanadium oxide-based catalysts Ek, Martin; Ramasse, Quentin M.; Arnarson, Logi Nature Communications, Vol. 8, Issue 1 https://doi.org/10.1038/s41467-017-00385-y	journal	August 2017
Inelastic electron holography – first results with surface plasmons Röder, F.; Lichte, H. The European Physical Journal Applied Physics, Vol. 54, Issue 3 https://doi.org/10.1051/epjap/2010100378	journal	June 2011
Electron nanodiffraction using sharply focused parallel probes Dwyer, Christian; Kirkland, Angus I.; Hartel, Peter Applied Physics Letters, Vol. 90, Issue 15 https://doi.org/10.1063/1.2721120	journal	April 2007
Visualizing and manipulating the spatial and temporal coherence of light with an adjustable light source in an undergraduate experiment Pieper, K.; Bergmann, A.; Dengler, R. European Journal of Physics, Vol. 40, Issue 5 https://doi.org/10.1088/1361-6404/ab3035	journal	August 2019
First application of Cc-corrected imaging for high-resolution and energy-filtered TEM Kabius, B.; Hartel, P.; Haider, M. Journal of Electron Microscopy, Vol. 58, Issue 3 https://doi.org/10.1093/jmicro/dfp021	journal	April 2009
The Coulomb Scattering of Relativistic Electrons by Nuclei McKinley, William A.; Feshbach, Herman Physical Review, Vol. 74, Issue 12 https://doi.org/10.1103/PhysRev.74.1759	journal	December 1948
Real-time sub- Å ngstrom imaging of reversible and irreversible conformations in rhodium catalysts and graphene Kisielowski, Christian; Wang, Lin-Wang; Specht, Petra Physical Review B, Vol. 88, Issue 2 https://doi.org/10.1103/PhysRevB.88.024305	journal	July 2013
Atomic-Resolution Imaging with a Sub-50-pm Electron Probe Erni, Rolf; Rossell, Marta D.; Kisielowski, Christian Physical Review Letters, Vol. 102, Issue 9 https://doi.org/10.1103/PhysRevLett.102.096101	journal	March 2009
Atomic electron tomography: 3D structures without crystals Miao, J.; Ercius, P.; Billinge, S. J. L. Science, Vol. 353, Issue 6306 https://doi.org/10.1126/science.aaf2157	journal	September 2016
Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials Zhang, Daliang; Zhu, Yihan; Liu, Lingmei Science, Vol. 359, Issue 6376 https://doi.org/10.1126/science.aao0865	journal	January 2018
Der Einfluß tiefer Temperaturen auf die Strahlenschädigung von organischen Kristallen durch 100 keV-Elektronen / The Influence of Very Low Temperature on the Radiation Damage of Organic Crystals Irradiated by 100 keV-Electrons Siegel, G. Zeitschrift für Naturforschung A, Vol. 27, Issue 2 https://doi.org/10.1515/zna-1972-0219	journal	February 1972

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