Title: Growth, characterization, and Chern insulator state in MnBi2⁢Te4 via the chemical vapor transport method

Journal Article · · Physical Review Materials

As the first intrinsic antiferromagnetic topological insulator, MnBi2 Te4 has provided a platform to investigate the interplay of band topology and magnetism as well as the emergent phenomena arising from such an interplay. Here we report the chemical-vapor-transport (CVT) growth and characterization of MnBi2 Te4, as well as the observation of the field-induced quantized Hall conductance in 6-layer devices. Through comparative studies between our CVT-grown and flux-grown MnBi2 Te4 via magnetic, transport, scanning tunneling microscopy, and angle-resolved photoemission spectroscopy measurements, we find that CVT-grown MnBi2 Te4 is marked with higher Mn occupancy on the Mn site, slightly higher MnBi antisites, smaller carrier concentration, and a Fermi level closer to the Dirac point. Furthermore, a 6-layer device made from the CVT-grown sample shows by far the highest mobility of 2500 cm2 V s in MnBi2 Te4 devices with the quantized Hall conductance appearing at 1.8 K and 8 T. Furthermore, our study provides a route to obtain high-quality single crystals of MnBi2 Te4 that are promising to make superior devices and realize emergent phenomena, such as the layer Hall effect and quantized anomalous Hall effect, etc.

Research Organization:
Energy Frontier Research Centers (EFRC) (United States). Center for the Advancement of Topological Semimetals (CATS); Univ. of Colorado, Boulder, CO (United States); University of California, Los Angeles, CA (United States)
Sponsoring Organization:
National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)
Grant/Contract Number:
AC02-05CH11231; AC02-07CH11358; AC02-76SF00515; FG02-03ER46066; SC0021117
OSTI ID:
1980337
Journal Information:
Physical Review Materials, Journal Name: Physical Review Materials Journal Issue: 12 Vol. 5; ISSN 2475-9953
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English

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