Excess noise in high-current diamond diodes

Ghosh, Subhajit; Surdi, Harshad; Kargar, Fariborz; Koeck, Franz A.; Rumyantsev, Sergey; Goodnick, Stephen; Nemanich, Robert J.; Balandin, Alexander A.

doi:10.1063/5.0083383

Title: Excess noise in high-current diamond diodes

Journal Article · 08 February 2022 · Applied Physics Letters

DOI: https://doi.org/10.1063/5.0083383 · OSTI ID:1979039

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University of California, Riverside, CA (United States); Univ. of California, Riverside, CA (United States)
Arizona State University Tempe, AZ (United States)
University of California, Riverside, CA (United States)
Arizona State University Tempe, AZ (United States)A
Polish Academy of Sciences, Warsaw (Poland)
Arizona State University Tempe, AZ (United States); Polish Academy of Sciences, Warsaw (Poland)

We report the results of an investigation of low-frequency excess noise in high-current diamond diodes. It was found that the electronic excess noise of the diamond diodes is dominated by the 1/f and generation-recombination noise, which reveals itself as Lorentzian spectral features (f is the frequency). The generation-recombination bulges are characteristic of diamond diodes with lower turn-on voltages. The noise spectral density dependence on forward current, I, reveals three distinctive regions in all examined devices—it scales as I² at the low (I < 10 μA) and high (I > 10 mA) currents and, rather unusually, remains nearly constant at the intermediate current range. The characteristic trap time constants, extracted from the noise data, show a uniquely strong dependence on current. Interestingly, the performance of the diamond diodes improves with the increasing temperature. The obtained results are important for the development of noise spectroscopy-based approaches for device reliability assessment for high-power diamond electronics.

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Research Organization:: Arizona State University, Tempe, AZ (United States)

Sponsoring Organization:: European Regional Development Fund; European Union; USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0021230

OSTI ID:: 1979039

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 6 Vol. 120; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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