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A Deep Learning Approach to Identify Local Structures in Atomic-Resolution Transmission Electron Microscopy Images
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journal
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July 2018 |
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Improving Shape Deformation in Unsupervised Image-to-Image Translation
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book
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January 2018 |
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Advanced Computing in Electron Microscopy
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book
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January 2020 |
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The Fréchet distance between multivariate normal distributions
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journal
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September 1982 |
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Pros and cons of GAN evaluation measures
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journal
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February 2019 |
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Carbon contamination in scanning transmission electron microscopy and its impact on phase-plate applications
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journal
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May 2017 |
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Correcting scanning instabilities from images of periodic structures
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journal
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July 2012 |
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Control of radiation damage in the TEM
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journal
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April 2013 |
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Correcting nonlinear drift distortion of scanning probe and scanning transmission electron microscopies from image pairs with orthogonal scan directions
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journal
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March 2016 |
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A deep convolutional neural network to analyze position averaged convergent beam electron diffraction patterns
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journal
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May 2018 |
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Image registration of low signal-to-noise cryo-STEM data
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journal
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August 2018 |
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Theoretical framework of statistical noise in scanning transmission electron microscopy
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journal
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October 2018 |
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Improving electron micrograph signal-to-noise with an atrous convolutional encoder-decoder
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journal
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July 2019 |
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Atomic resolution convergent beam electron diffraction analysis using convolutional neural networks
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journal
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March 2020 |
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Training artificial neural networks for precision orientation and strain mapping using 4D electron diffraction datasets
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journal
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March 2021 |
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Contamination of TEM Holders Quantified and Mitigated With the Open-Hardware, High-Vacuum Bakeout System
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journal
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July 2020 |
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Optimal STEM Convergence Angle Selection Using a Convolutional Neural Network and the Strehl Ratio
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journal
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August 2020 |
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Automated Acquisition and Deep Learning of 2D Materials on the Million-Atom Scale
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journal
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August 2022 |
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An Automated Scanning Transmission Electron Microscope Guided by Sparse Data Analytics
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journal
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June 2022 |
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Towards Augmented Microscopy with Reinforcement Learning-Enhanced Workflows
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journal
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December 2022 |
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Deep Learning Enabled Strain Mapping of Single-Atom Defects in Two-Dimensional Transition Metal Dichalcogenides with Sub-Picometer Precision
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journal
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April 2020 |
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Defect Coupling and Sub-Angstrom Structural Distortions in W 1– x Mo x S 2 Monolayers
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journal
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April 2017 |
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Probing Electron Beam Induced Transformations on a Single-Defect Level via Automated Scanning Transmission Electron Microscopy
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journal
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October 2022 |
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Deep Learning of Atomically Resolved Scanning Transmission Electron Microscopy Images: Chemical Identification and Tracking Local Transformations
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journal
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October 2016 |
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Mechanism of Gold-Assisted Exfoliation of Centimeter-Sized Transition-Metal Dichalcogenide Monolayers
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journal
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September 2018 |
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Point Defects and Localized Excitons in 2D WSe 2
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journal
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April 2019 |
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Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy
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journal
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March 2010 |
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Deep learning analysis of defect and phase evolution during electron beam-induced transformations in WS2
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journal
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February 2019 |
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Defect detection in atomic-resolution images via unsupervised learning with translational invariance
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journal
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November 2021 |
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Uncovering material deformations via machine learning combined with four-dimensional scanning transmission electron microscopy
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journal
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May 2022 |
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Disentangling multiple scattering with deep learning: application to strain mapping from electron diffraction patterns
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journal
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December 2022 |
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Towards data-driven next-generation transmission electron microscopy
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journal
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October 2020 |
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TEMImageNet training library and AtomSegNet deep-learning models for high-precision atom segmentation, localization, denoising, and deblurring of atomic-resolution images
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journal
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March 2021 |
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Machine learning in scanning transmission electron microscopy
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journal
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March 2022 |
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Machine learning in electron microscopy for advanced nanocharacterization: current developments, available tools and future outlook
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journal
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January 2022 |
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The two-dimensional phase of boron nitride: Few-atomic-layer sheets and suspended membranes
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journal
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March 2008 |
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Quantify point defects in monolayer tungsten diselenide
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journal
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March 2021 |
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Quantitative ADF STEM: acquisition, analysis and interpretation
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journal
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February 2016 |
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Deep learning in electron microscopy
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journal
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March 2021 |
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Intrinsic Instability of Aberration-Corrected Electron Microscopes
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journal
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October 2012 |
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Image-to-Image Translation with Conditional Adversarial Networks
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conference
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July 2017 |
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Unpaired Image-to-Image Translation Using Cycle-Consistent Adversarial Networks
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conference
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October 2017 |
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Removing Imaging Artifacts in Electron Microscopy using an Asymmetrically Cyclic Adversarial Network without Paired Training Data
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conference
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October 2019 |
Deep snow: synthesizing remote sensing imagery with generative adversarial nets
- Ren, Christopher; Ziemann, Amanda K.; Theiler, James
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Algorithms, Technologies, and Applications for Multispectral and Hyperspectral Imagery XXVI
https://doi.org/10.1117/12.2560716
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conference
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May 2020 |
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Decoding crystallography from high-resolution electron imaging and diffraction datasets with deep learning
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journal
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October 2019 |
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Imaging Atomic Rearrangements in Two-Dimensional Silica Glass: Watching Silica's Dance
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journal
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October 2013 |
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Crystal symmetry determination in electron diffraction using machine learning
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journal
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January 2020 |
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Noise2Atom: unsupervised denoising for scanning transmission electron microscopy images
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journal
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October 2020 |
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On Information and Sufficiency
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journal
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March 1951 |