Self-absorption correction on 2D X-ray fluorescence maps

Journal Article · 04 May 2023 · Scientific Reports

DOI: https://doi.org/10.1038/s41598-023-33383-w · OSTI ID:1972488

Ge, Mingyuan; Yan, Hanfei; Huang, Xiaojing; Chu, Yong S.

Abstract X-ray fluorescence mapping (XRF) is a highly efficient and non-invasive technique for quantifying material composition with micro and nanoscale spatial resolutions. Quantitative XRF analysis, however, confronts challenges from the long-lasting problem called self-absorption. Moreover, correcting two-dimensional XRF mapping datasets is particularly difficult because it is an ill-posed inverse problem. Here we report a semi-empirical method that can effectively correct 2D XRF mapping data. The correction error is generally less than 10% from a comprehensive evaluation of the accuracy in various configurations. The proposed method was applied to quantify the composition distribution around the grain boundaries in an electrochemically corroded stainless steel sample. Highly localized Cr enrichment was found around the crack sites, which was invisible before the absorption correction.

• Sponsoring Organization: USDOE
• Grant/Contract Number: SC0012704
• OSTI ID: 1972488
• Journal Information: Scientific Reports, Journal Name: Scientific Reports Journal Issue: 1 Vol. 13; ISSN 2045-2322
• Publisher: Nature Publishing GroupCopyright Statement
• Country of Publication: United Kingdom
• Language: English