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Title: Virtual-diagnostic-based time stamping for ultrafast electron diffraction

Journal Article · · Physical Review Accelerators and Beams

In this work, nondestructive virtual diagnostics are applied to retrieve the electron beam time of arrival and energy in a relativistic ultrafast electron diffraction (UED) beamline using independently measured machine parameters. This technique has the potential to improve the temporal resolution of pump and probe UED scans. Fluctuations in time of arrival have multiple components, including a shot-to-shot jitter and a long-term drift which can be separately addressed by closed loop feedback systems. A linear-regression-based model is used to fit the beam energy and time of arrival and is shown to be able to predict accurate behavior for both long- and short-time scales. More advanced time-series analysis based on machine learning techniques can be applied to improve this prediction further.

Research Organization:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), High Energy Physics (HEP); USDOE Office of Science (SC), Office of Workforce Development for Teachers & Scientists (WDTS); National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC02-05CH11231; SC0014664; 89233218CNA000001; PHY-1549132
OSTI ID:
1972403
Alternate ID(s):
OSTI ID: 2234124
Journal Information:
Physical Review Accelerators and Beams, Vol. 26, Issue 5; ISSN 2469-9888
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English

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