Virtual-diagnostic-based time stamping for ultrafast electron diffraction
- Univ. of California, Los Angeles, CA (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Special Circumstances, Seattle, WA (United States)
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Univ. of California, Los Angeles, CA (United States)
In this work, nondestructive virtual diagnostics are applied to retrieve the electron beam time of arrival and energy in a relativistic ultrafast electron diffraction (UED) beamline using independently measured machine parameters. This technique has the potential to improve the temporal resolution of pump and probe UED scans. Fluctuations in time of arrival have multiple components, including a shot-to-shot jitter and a long-term drift which can be separately addressed by closed loop feedback systems. A linear-regression-based model is used to fit the beam energy and time of arrival and is shown to be able to predict accurate behavior for both long- and short-time scales. More advanced time-series analysis based on machine learning techniques can be applied to improve this prediction further.
- Research Organization:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), High Energy Physics (HEP); USDOE Office of Science (SC), Office of Workforce Development for Teachers & Scientists (WDTS); National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- AC02-05CH11231; SC0014664; 89233218CNA000001; PHY-1549132
- OSTI ID:
- 1972403
- Alternate ID(s):
- OSTI ID: 2234124
- Journal Information:
- Physical Review Accelerators and Beams, Vol. 26, Issue 5; ISSN 2469-9888
- Publisher:
- American Physical Society (APS)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
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