Automated High‐Throughput Fatigue Testing of Freestanding Thin Films

Barrios, Alejandro; Kunka, Cody; Nogan, John; Hattar, Khalid; Boyce, Brad L.

doi:10.1002/smtd.202201591

Title: Automated High‐Throughput Fatigue Testing of Freestanding Thin Films

Journal Article · 24 April 2023 · Small Methods

DOI: https://doi.org/10.1002/smtd.202201591 · OSTI ID:1971574

Barrios, Alejandro ^[1]; Kunka, Cody ^[1]; Nogan, John ^[1]; Hattar, Khalid ^[2];

^[1]

Center for Integrated Nanotechnologies Sandia National Laboratories Albuquerque NM 87185 USA
Center for Integrated Nanotechnologies Sandia National Laboratories Albuquerque NM 87185 USA, Department of Nuclear Engineering University of Tennessee Knoxville TN 37996 USA

Abstract Mechanical testing at small length scales has traditionally been resource‐intensive due to difficulties with meticulous sample preparation, exacting load alignments, and precision measurements. Microscale fatigue testing can be particularly challenging due to the time‐intensive, tedious repetition of single fatigue experiments. To mitigate these challenges, this work presents a new methodology for the high‐throughput fatigue testing of thin films at the microscale. This methodology features a microelectromechanical systems‐based Si carrier that can support the simultaneous and independent fatigue testing of an array of samples. To demonstrate this new technique, the microscale fatigue behavior of nanocrystalline Al is efficiently characterized via this Si carrier and automated fatigue testing with in situ scanning electron microscopy. This methodology reduces the total testing time by an order of magnitude, and the high‐throughput fatigue results highlight the stochastic nature of the microscale fatigue response. This manuscript also discusses how this initial capability can be adapted to accommodate more samples, different materials, new geometries, and other loading modes.

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Sponsoring Organization:: USDOE

OSTI ID:: 1971574

Journal Information:: Small Methods, Journal Name: Small Methods Journal Issue: 7 Vol. 7; ISSN 2366-9608

Publisher:: Wiley Blackwell (John Wiley & Sons)Copyright Statement

Country of Publication:: United States

Language:: English

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