Title: Ultraviolet digital holographic microscopy (DHM) of micron-scale particles from shocked Sn ejecta

Journal Article · · Optics Express
DOI: https://doi.org/10.1364/OE.486461 · OSTI ID:1970800

A cloud of very fast, O (km/s), and very fine, O (µm), particles may be ejected when a strong shock impacts and possibly melts the free surface of a solid metal. To quantify these dynamics, this work develops an ultraviolet, long-working distance, two-pulse Digital Holographic Microscopy (DHM) configuration and is the first to replace film recording with digital sensors for this challenging application. A proposed multi-iteration DHM processing algorithm is demonstrated for automated measures of the sizes, velocities, and three-dimensional positions of non-spherical particles. Ejecta as small as 2 µm diameter are successfully tracked, while uncertainty simulations indicate that particle size distributions are accurately quantified for diameters ≥4 µm. These techniques are demonstrated on three explosively driven experiments. Measured ejecta size and velocity statistics are shown to be consistent with prior film-based recording, while also revealing spatial variations in velocities and 3D positions that have yet to be widely investigated. Having eliminated time-consuming analog film processing, the methodologies proposed here are expected to significantly accelerate future experimental investigation of ejecta physics.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States); Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE; USDOE Laboratory Directed Research and Development (LDRD) Program; USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
89233218CNA000001; NA0003525; NA0003624
OSTI ID:
1970800
Report Number(s):
LA-UR-22-32623; SAND-2023-10828J
Journal Information:
Optics Express, Journal Name: Optics Express Journal Issue: 9 Vol. 31; ISSN 1094-4087; ISSN OPEXFF
Publisher:
Optical Society of AmericaCopyright Statement
Country of Publication:
United States
Language:
English

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