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Title: Signal processing to reduce dark noise impact in precision timing

Journal Article · · Journal of Instrumentation
 [1]
  1. University of Virginia, Charlottesville, VA (United States)

We introduce a technique to mitigate the effects of low frequency noise on precision timing. The example of Dark Count Noise Rate (DCR) in Silicon Photomultipliers (SiPMs) is emphasized. This technique exploits the correlation between time shifts on the leading edge of a signal and the residual slope of the baseline (due to noise) which remains after baseline subtraction. In fast timing applications (such as for Time-of-flight particle ID) the signal arrival time is typically captured on the signal leading edge. The signal risetime is often fixed by the physics of the sensor and input circuit. Then accurate pulse timing can be achieved by correcting a leading edge threshold time (depending on a slope proportional to both the Amplitude and the risetime) to a “constant fraction” time. This compensation for time walk due to amplitude fluctuations breaks down once we introduce interference from low frequency noise on the leading edge. In this paper we demonstrate that an additional measurement of the slope at threshold can be used to correct for this noise jitter.

Research Organization:
Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
Grant/Contract Number:
AC02-07CH11359
OSTI ID:
1958462
Report Number(s):
FERMILAB-CONF-23-042-CMS-V; arXiv:2302.02970; oai:inspirehep.net:2629786
Journal Information:
Journal of Instrumentation, Journal Name: Journal of Instrumentation Journal Issue: 07 Vol. 18; ISSN 1748-0221
Publisher:
Institute of Physics (IOP)Copyright Statement
Country of Publication:
United States
Language:
English

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