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Title: Hole doping in a negative charge transfer insulator

Journal Article · · Communications Physics
ORCiD logo [1];  [2]; ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [3];  [1];  [1]; ORCiD logo [4]; ORCiD logo [4];  [4]; ORCiD logo [2]; ORCiD logo [1]
  1. Indian Institute of Science (India)
  2. S.N. Bose National Centre for Basic Sciences (India)
  3. S.N. Bose National Centre for Basic Sciences (India); Asia Pacific Center for Theoretical Physics (Korea)
  4. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)

RENiO3 is a negative charge transfer energy system and exhibits a temperature-driven metal-insulator transition (MIT), which is also accompanied by a bond disproportionation (BD) transition. In order to explore how hole doping affects the BD transition, we have investigated the electronic structure of single-crystalline thin films of Nd1-xCaxNiO3 by synchrotron based experiments and ab-initio calculations. Here we show that for a small value of x, the doped holes are localized on one or more Ni sites around the dopant Ca2+ ions, while the BD state for the rest of the lattice remains intact. The effective charge transfer energy (Δ) increases with Ca concentration and the formation of BD phase is not favored above a critical x, suppressing the insulating phase. Our present study firmly demonstrates that the appearance of BD mode is essential for the MIT of the RENiO3 series.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
India Department of Science and Technology (DST); India Science and Engineering Research Board (SERB) Early Career Research (ECR); USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1909633
Journal Information:
Communications Physics, Journal Name: Communications Physics Journal Issue: 1 Vol. 5; ISSN 2399-3650
Publisher:
Springer NatureCopyright Statement
Country of Publication:
United States
Language:
English

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