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Title: Grain-resolved temperature-dependent anisotropy in hexagonal Ti-7Al revealed by synchrotron X-ray diffraction

Journal Article · · Materials Characterization
 [1];  [2];  [3];  [4];  [5];  [1]
  1. Carnegie Mellon University, Pittsburgh, PA (United States)
  2. Pennsylvania State University, University Park, PA (United States)
  3. Cornell University, Ithaca, NY (United States)
  4. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  5. Air Force Research Laboratory. (AFRL), Wright-Patterson AFB, OH (United States)

Hexagonal metals have anisotropic coefficients of thermal expansion causing grain-level internal stresses during heating. High energy x-ray diffraction microscopy, a non-destructive, in situ, micromechanical and microstructural characterization technique, has been used to determine the anisotropic coefficients of thermal expansion (CTEs) for Ti-7Al. Two samples of polycrystalline α-phase Ti-7Al were continuously heated from room temperature to 850 °C while far-field HEDM scans were collected. The results showed a change in the ratio of the CTEs in the ‘a’ and ‘c’ directions which explains discrepancies found in the literature. The CTE additionally appears to be affected by the dissolution of α2 precipitates. Analysis of the grain-resolved micromechanical data also shows reconfiguration of the grain scale stresses likely due to anisotropic expansion driving crystallographic slip.

Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Organization:
Air Force Office of Scientific Research (AFOSR); National Science Foundation (NSF); USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC52-07NA27344
OSTI ID:
1888634
Report Number(s):
LLNL-JRNL-839363; 1060323
Journal Information:
Materials Characterization, Journal Name: Materials Characterization Journal Issue: N/A Vol. 174; ISSN 1044-5803
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English

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