Building Atomic and Plasmonic Devices via Electron Beams: from Desired Structures to Desired Properties

Journal Article · 21 July 2022 · Microscopy and Microanalysis

DOI: https://doi.org/10.1017/s1431927622006857 · OSTI ID:1887652

Roccapriore, Kevin M.  ^[1]; Ghosh, Ayana ^[1]; Vasudevan, Rama  ^[1]; Unocic, Raymond R.  ^[1]; Boebinger, Matthew G.  ^[1]; Ziatdinov, Maxim  ^[1]; Kalinin, Sergei V. ^[2]

---

1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
2. Univ. of Tennessee, Knoxville, TN (United States)

The evolution of the aberration correction in Scanning Transmission Electron Microscopy (STEM) has enabled multiple advances including high-resolution structural imaging, pm-level position detection of atomic columns, and ~3-5 mV resolution electron energy loss spectroscopy of the chemical and physical functionalities. These developments have further enabled the precise manipulation of the atomic structure of materials, including removal and formation of atomic planes in 3D materials, controlled atomic motion, and even direct atomic assembly of homo- and heteroatomic artificial molecules. Here, we will discuss several recent advances in STEM-EELS automated experiments as applied to quantum and nanoplasmonic systems.

• Research Organization: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE
• Grant/Contract Number: AC05-00OR22725
• OSTI ID: 1887652
• Journal Information: Microscopy and Microanalysis, Journal Name: Microscopy and Microanalysis Journal Issue: S1 Vol. 28; ISSN 1431-9276
• Publisher: Microscopy Society of America (MSA)Copyright Statement
• Country of Publication: United States
• Language: English