Reduction of bright exciton lifetimes by radiation-induced disorder

Singh, Christopher Nolan; Liu, Xiang-Yang; Uberuaga, Blas Pedro; Tobin, Stephen Joseph

doi:10.1103/physrevmaterials.5.073802

Title: Reduction of bright exciton lifetimes by radiation-induced disorder

Journal Article · 15 July 2021 · Physical Review Materials

DOI: https://doi.org/10.1103/physrevmaterials.5.073802 · OSTI ID:1879381

^[1];

^[1]; Tobin, Stephen Joseph ^[1]

Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

Quantum-radiative decay is a fundamental process in many optoelectronic systems such as laser diodes and solar cells. The bright exciton lifetime is a critical factor in determining the performance of these systems. Motivated by the ever-increasing need for laser systems in space and nuclear applications, we develop a many-particle approach to predict the radiative lifetime under harsh radiation environments. Here, using GaAs as a model system, we find that radiation-induced band tailing reduces the bright exciton lifetime. This result shows that the efficiency of radiative recombination, in addition to nonradiative recombination, can be affected by ionization radiation. Our approach enables a detailed understanding of the interplay between correlation, localization, and radiation that affect the performance of gain media.

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Research Organization:: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: 89233218CNA000001

OSTI ID:: 1879381

Report Number(s):: LA-UR-21-23098

Journal Information:: Physical Review Materials, Journal Name: Physical Review Materials Journal Issue: 7 Vol. 5; ISSN 2475-9953

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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