Investigating the sources of low-energy events in a SuperCDMS-HVeV detector
Abstract
Recent experiments searching for sub-GeV/c2 dark matter have observed event excesses close to their respective energy thresholds. Although specic to the individual technologies, the measured excess event rates have been consistently reported at or below event energies of a few-hundred eV, or with charges of a few electron-hole pairs. In the present work, we operated a 1-gram silicon SuperCDMS-HVeV detector at three voltages across the crystal (0 V, 60V and 100 V). The 0V data show an excess of events in the tens of eV region. Despite this event excess, we demonstrate the ability to set a competitive exclusion limit on the spin-independent dark matter{nucleon elastic scattering cross section for dark matter masses of O(100) MeV/c2, enabled by operation of the detector at 0V potential and achievement of a very low O(10) eV threshold for nuclear recoils. Comparing the data acquired at 0 V, 60V and 100V potentials across the crystal, we investigated possible sources of the unexpected events observed at low energy. The data indicate that the dominant contribution to the excess is consistent with a hypothesized luminescence from the printed circuit boards used in the detector holder.
- Authors:
- more »
- Publication Date:
- Research Org.:
- SLAC National Accelerator Lab., Menlo Park, CA (United States); Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), High Energy Physics (HEP); National Science Foundation (NSF); Arthur B. McDonald Canadian Astroparticle Physics Research Institute; Natural Sciences and Engineering Research Council of Canada (NSERC); Canada Excellence Research Chair Fund; German Research Foundation (DFG); Government of India, Department of Atomic Energy (DAE)
- Contributing Org.:
- SuperCDMS
- OSTI Identifier:
- 1873591
- Alternate Identifier(s):
- OSTI ID: 1877648; OSTI ID: 1879843; OSTI ID: 1886815
- Report Number(s):
- FERMILAB-PUB-22-496-PPD-SQMS; arXiv:2204.08038; PNNL-SA-172447
Journal ID: ISSN 2470-0010; PRVDAQ; 112006
- Grant/Contract Number:
- AC02-37407CH11359; AC05-76RL01830; DEAC02-76SF00515; AC02-07CH11359; 1809730; 1707704; 420484612; 390833306; AC02-76SF00515
- Resource Type:
- Published Article
- Journal Name:
- Physical Review D
- Additional Journal Information:
- Journal Name: Physical Review D Journal Volume: 105 Journal Issue: 11; Journal ID: ISSN 2470-0010
- Publisher:
- American Physical Society
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 79 ASTRONOMY AND ASTROPHYSICS; particle dark matter
Citation Formats
Albakry, M. F., Alkhatib, I., Amaral, D. W. P., Aralis, T., Aramaki, T., Arnquist, I. J., Ataee Langroudy, I., Azadbakht, E., Banik, S., Bathurst, C., Bauer, D. A., Bhattacharyya, R., Brink, P. L., Bunker, R., Cabrera, B., Calkins, R., Cameron, R. A., Cartaro, C., Cerdeño, D. G., Chang, Y. -Y., Chaudhuri, M., Chen, R., Chott, N., Cooley, J., Coombes, H., Corbett, J., Cushman, P., De Brienne, F., Dharani, S., di Vacri, M. L., Diamond, M. D., Fascione, E., Figueroa-Feliciano, E., Fink, C. W., Fouts, K., Fritts, M., Gerbier, G., Germond, R., Ghaith, M., Golwala, S. R., Hall, J., Hassan, N., Hines, B. A., Hollister, M. I., Hong, Z., Hoppe, E. W., Hsu, L., Huber, M. E., Iyer, V., Jastram, A., Kashyap, V. K. S., Kelsey, M. H., Kubik, A., Kurinsky, N. A., Lawrence, R. E., Lee, M., Li, A., Liu, J., Liu, Y., Loer, B., Lopez Asamar, E., Lukens, P., MacFarlane, D. B., Mahapatra, R., Mandic, V., Mast, N., Mayer, A. J., Meyer zu Theenhausen, H., Michaud, É., Michielin, E., Mirabolfathi, N., Mohanty, B., Nagorny, S., Nelson, J., Neog, H., Novati, V., Orrell, J. L., Osborne, M. D., Oser, S. M., Page, W. A., Partridge, R., Pedreros, D. S., Podviianiuk, R., Ponce, F., Poudel, S., Pradeep, A., Pyle, M., Rau, W., Reid, E., Ren, R., Reynolds, T., Roberts, A., Robinson, A. E., Saab, T., Sadoulet, B., Saikia, I., Sander, J., Sattari, A., Schmidt, B., Schnee, R. W., Scorza, S., Serfass, B., Poudel, S. S., Sincavage, D. J., Stanford, C., Street, J., Sun, H., Thasrawala, F. K., Toback, D., Underwood, R., Verma, S., Villano, A. N., von Krosigk, B., Watkins, S. L., Wen, O., Williams, Z., Wilson, M. J., Winchell, J., Wykoff, K., Yellin, S., Young, B. A., Yu, T. C., Zatschler, B., Zatschler, S., Zaytsev, A., Zhang, E., Zheng, L., and Zuber, S. Investigating the sources of low-energy events in a SuperCDMS-HVeV detector. United States: N. p., 2022.
Web. doi:10.1103/PhysRevD.105.112006.
Albakry, M. F., Alkhatib, I., Amaral, D. W. P., Aralis, T., Aramaki, T., Arnquist, I. J., Ataee Langroudy, I., Azadbakht, E., Banik, S., Bathurst, C., Bauer, D. A., Bhattacharyya, R., Brink, P. L., Bunker, R., Cabrera, B., Calkins, R., Cameron, R. A., Cartaro, C., Cerdeño, D. G., Chang, Y. -Y., Chaudhuri, M., Chen, R., Chott, N., Cooley, J., Coombes, H., Corbett, J., Cushman, P., De Brienne, F., Dharani, S., di Vacri, M. L., Diamond, M. D., Fascione, E., Figueroa-Feliciano, E., Fink, C. W., Fouts, K., Fritts, M., Gerbier, G., Germond, R., Ghaith, M., Golwala, S. R., Hall, J., Hassan, N., Hines, B. A., Hollister, M. I., Hong, Z., Hoppe, E. W., Hsu, L., Huber, M. E., Iyer, V., Jastram, A., Kashyap, V. K. S., Kelsey, M. H., Kubik, A., Kurinsky, N. A., Lawrence, R. E., Lee, M., Li, A., Liu, J., Liu, Y., Loer, B., Lopez Asamar, E., Lukens, P., MacFarlane, D. B., Mahapatra, R., Mandic, V., Mast, N., Mayer, A. J., Meyer zu Theenhausen, H., Michaud, É., Michielin, E., Mirabolfathi, N., Mohanty, B., Nagorny, S., Nelson, J., Neog, H., Novati, V., Orrell, J. L., Osborne, M. D., Oser, S. M., Page, W. A., Partridge, R., Pedreros, D. S., Podviianiuk, R., Ponce, F., Poudel, S., Pradeep, A., Pyle, M., Rau, W., Reid, E., Ren, R., Reynolds, T., Roberts, A., Robinson, A. E., Saab, T., Sadoulet, B., Saikia, I., Sander, J., Sattari, A., Schmidt, B., Schnee, R. W., Scorza, S., Serfass, B., Poudel, S. S., Sincavage, D. J., Stanford, C., Street, J., Sun, H., Thasrawala, F. K., Toback, D., Underwood, R., Verma, S., Villano, A. N., von Krosigk, B., Watkins, S. L., Wen, O., Williams, Z., Wilson, M. J., Winchell, J., Wykoff, K., Yellin, S., Young, B. A., Yu, T. C., Zatschler, B., Zatschler, S., Zaytsev, A., Zhang, E., Zheng, L., & Zuber, S. Investigating the sources of low-energy events in a SuperCDMS-HVeV detector. United States. https://doi.org/10.1103/PhysRevD.105.112006
Albakry, M. F., Alkhatib, I., Amaral, D. W. P., Aralis, T., Aramaki, T., Arnquist, I. J., Ataee Langroudy, I., Azadbakht, E., Banik, S., Bathurst, C., Bauer, D. A., Bhattacharyya, R., Brink, P. L., Bunker, R., Cabrera, B., Calkins, R., Cameron, R. A., Cartaro, C., Cerdeño, D. G., Chang, Y. -Y., Chaudhuri, M., Chen, R., Chott, N., Cooley, J., Coombes, H., Corbett, J., Cushman, P., De Brienne, F., Dharani, S., di Vacri, M. L., Diamond, M. D., Fascione, E., Figueroa-Feliciano, E., Fink, C. W., Fouts, K., Fritts, M., Gerbier, G., Germond, R., Ghaith, M., Golwala, S. R., Hall, J., Hassan, N., Hines, B. A., Hollister, M. I., Hong, Z., Hoppe, E. W., Hsu, L., Huber, M. E., Iyer, V., Jastram, A., Kashyap, V. K. S., Kelsey, M. H., Kubik, A., Kurinsky, N. A., Lawrence, R. E., Lee, M., Li, A., Liu, J., Liu, Y., Loer, B., Lopez Asamar, E., Lukens, P., MacFarlane, D. B., Mahapatra, R., Mandic, V., Mast, N., Mayer, A. J., Meyer zu Theenhausen, H., Michaud, É., Michielin, E., Mirabolfathi, N., Mohanty, B., Nagorny, S., Nelson, J., Neog, H., Novati, V., Orrell, J. L., Osborne, M. D., Oser, S. M., Page, W. A., Partridge, R., Pedreros, D. S., Podviianiuk, R., Ponce, F., Poudel, S., Pradeep, A., Pyle, M., Rau, W., Reid, E., Ren, R., Reynolds, T., Roberts, A., Robinson, A. E., Saab, T., Sadoulet, B., Saikia, I., Sander, J., Sattari, A., Schmidt, B., Schnee, R. W., Scorza, S., Serfass, B., Poudel, S. S., Sincavage, D. J., Stanford, C., Street, J., Sun, H., Thasrawala, F. K., Toback, D., Underwood, R., Verma, S., Villano, A. N., von Krosigk, B., Watkins, S. L., Wen, O., Williams, Z., Wilson, M. J., Winchell, J., Wykoff, K., Yellin, S., Young, B. A., Yu, T. C., Zatschler, B., Zatschler, S., Zaytsev, A., Zhang, E., Zheng, L., and Zuber, S. Wed .
"Investigating the sources of low-energy events in a SuperCDMS-HVeV detector". United States. https://doi.org/10.1103/PhysRevD.105.112006.
@article{osti_1873591,
title = {Investigating the sources of low-energy events in a SuperCDMS-HVeV detector},
author = {Albakry, M. F. and Alkhatib, I. and Amaral, D. W. P. and Aralis, T. and Aramaki, T. and Arnquist, I. J. and Ataee Langroudy, I. and Azadbakht, E. and Banik, S. and Bathurst, C. and Bauer, D. A. and Bhattacharyya, R. and Brink, P. L. and Bunker, R. and Cabrera, B. and Calkins, R. and Cameron, R. A. and Cartaro, C. and Cerdeño, D. G. and Chang, Y. -Y. and Chaudhuri, M. and Chen, R. and Chott, N. and Cooley, J. and Coombes, H. and Corbett, J. and Cushman, P. and De Brienne, F. and Dharani, S. and di Vacri, M. L. and Diamond, M. D. and Fascione, E. and Figueroa-Feliciano, E. and Fink, C. W. and Fouts, K. and Fritts, M. and Gerbier, G. and Germond, R. and Ghaith, M. and Golwala, S. R. and Hall, J. and Hassan, N. and Hines, B. A. and Hollister, M. I. and Hong, Z. and Hoppe, E. W. and Hsu, L. and Huber, M. E. and Iyer, V. and Jastram, A. and Kashyap, V. K. S. and Kelsey, M. H. and Kubik, A. and Kurinsky, N. A. and Lawrence, R. E. and Lee, M. and Li, A. and Liu, J. and Liu, Y. and Loer, B. and Lopez Asamar, E. and Lukens, P. and MacFarlane, D. B. and Mahapatra, R. and Mandic, V. and Mast, N. and Mayer, A. J. and Meyer zu Theenhausen, H. and Michaud, É. and Michielin, E. and Mirabolfathi, N. and Mohanty, B. and Nagorny, S. and Nelson, J. and Neog, H. and Novati, V. and Orrell, J. L. and Osborne, M. D. and Oser, S. M. and Page, W. A. and Partridge, R. and Pedreros, D. S. and Podviianiuk, R. and Ponce, F. and Poudel, S. and Pradeep, A. and Pyle, M. and Rau, W. and Reid, E. and Ren, R. and Reynolds, T. and Roberts, A. and Robinson, A. E. and Saab, T. and Sadoulet, B. and Saikia, I. and Sander, J. and Sattari, A. and Schmidt, B. and Schnee, R. W. and Scorza, S. and Serfass, B. and Poudel, S. S. and Sincavage, D. J. and Stanford, C. and Street, J. and Sun, H. and Thasrawala, F. K. and Toback, D. and Underwood, R. and Verma, S. and Villano, A. N. and von Krosigk, B. and Watkins, S. L. and Wen, O. and Williams, Z. and Wilson, M. J. and Winchell, J. and Wykoff, K. and Yellin, S. and Young, B. A. and Yu, T. C. and Zatschler, B. and Zatschler, S. and Zaytsev, A. and Zhang, E. and Zheng, L. and Zuber, S.},
abstractNote = {Recent experiments searching for sub-GeV/c2 dark matter have observed event excesses close to their respective energy thresholds. Although specic to the individual technologies, the measured excess event rates have been consistently reported at or below event energies of a few-hundred eV, or with charges of a few electron-hole pairs. In the present work, we operated a 1-gram silicon SuperCDMS-HVeV detector at three voltages across the crystal (0 V, 60V and 100 V). The 0V data show an excess of events in the tens of eV region. Despite this event excess, we demonstrate the ability to set a competitive exclusion limit on the spin-independent dark matter{nucleon elastic scattering cross section for dark matter masses of O(100) MeV/c2, enabled by operation of the detector at 0V potential and achievement of a very low O(10) eV threshold for nuclear recoils. Comparing the data acquired at 0 V, 60V and 100V potentials across the crystal, we investigated possible sources of the unexpected events observed at low energy. The data indicate that the dominant contribution to the excess is consistent with a hypothesized luminescence from the printed circuit boards used in the detector holder.},
doi = {10.1103/PhysRevD.105.112006},
journal = {Physical Review D},
number = 11,
volume = 105,
place = {United States},
year = {Wed Jun 22 00:00:00 EDT 2022},
month = {Wed Jun 22 00:00:00 EDT 2022}
}
https://doi.org/10.1103/PhysRevD.105.112006
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