Study of cluster ions produced from ToF-SIMS analysis of a U-6%Nb target

Sen-Britain, Shohini; Nelson, Art J.

doi:10.1016/j.nimb.2022.01.010

Title: Study of cluster ions produced from ToF-SIMS analysis of a U-6%Nb target

Journal Article · 31 January 2022 · Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms

DOI: https://doi.org/10.1016/j.nimb.2022.01.010 · OSTI ID:1867083

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Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

Cluster ions have been previously observed during time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis of metals and metal oxides. Furthermore, we have used ToF-SIMS to investigate cluster ions formed from the hydrocarbon-containing overlayer, the mixed U and Nb surface oxide, and underlying metal of a U-6 %Nb (U6Nb) target. In the overlayer, we observe U_xO_y+ oxides and U-species likely containing hydrocarbons. In the surface oxide, we observe UO₂+, U₂O₂+, U₃O₅+, and U₄O₆+ as the most intense ions for each family of oxide ions containing x U atoms. Nb oxides for NbO_1-2- were only observed in negative polarity. In contrast to the oxide, analysis of the underlying U6Nb alloy resulted in repeating units of U_n+, U_n(Nb)+, and U_n(Nb₂) + ions for n = 3–11 as the highest intensity ions for each family of ions containing n U atoms. Nb_n+ clusters were not observed. U_n+, U_n(Nb)+, and U_n(Nb₂)+ clusters containing C- and O-species were observed and were likely produced from soluble C or O species or precipitates known to be present in U6Nb.

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Research Organization:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Organization:: USDOE; USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: AC52-07NA27344

OSTI ID:: 1867083

Report Number(s):: LLNL-JRNL-826477; 1040514

Journal Information:: Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms, Journal Name: Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms Vol. 515; ISSN 0168-583X

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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Title: Study of cluster ions produced from ToF-SIMS analysis of a U-6%Nb target

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