Control of deviatoric stress in the diamond anvil cell through thermal expansion mismatch stress in thin films
Abstract
Elastic and plastic properties of materials and phase transitions at extreme conditions vary with both hydrostatic pressure and deviatoric stress. To generate and measure controlled deviatoric stress at pressures beyond those accessible with large volume differential and rotational presses and optical access for spectroscopy, experiments tested the combination of diamond anvil cell and thin film technology. Thin films of polycrystalline Cr-doped Al2O3 ruby were prepared using pulsed laser deposition on single-crystal substrates of either Al2O3 sapphire or yttria-stabilized cubic zirconia for contrasting initial film stress, and loaded in diamond anvil cells for confining stress. The piezospectroscopic response of the ruby films demonstrates consistently higher deviatoric stress in the film on zirconia relative to the film on the control sapphire, and an increase in deviatoric stress with applied load. Complementary synchrotron X-ray diffraction of the zirconia substrate confirmed that no pressure-induced phase transitions impacted the stress state of the ruby film, but differences in compressibility of film and substrate result in changes in film stress analogous to thermal expansion mismatch. Furthermore, this technique may be applied to evaluate elastic and plastic response of thin films of a variety of materials under extreme stress.
- Authors:
-
[1];
- Michigan State Univ., East Lansing, MI (United States)
- Northeastern Illinois Univ., Chicago, IL (United States)
- Univ. of Michigan, Ann Arbor, MI (United States)
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Michigan State Univ., East Lansing, MI (United States); Arizona State Univ., Tempe, AZ (United States)
- Publication Date:
- Research Org.:
- Univ. of Illinois, Chicago, IL (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA); USDOE Laboratory Directed Research and Development (LDRD) Program; National Science Foundation (NSF)
- OSTI Identifier:
- 1867017
- Alternate Identifier(s):
- OSTI ID: 1909335
- Grant/Contract Number:
- NA0003975; NA0003858; AC02-06CH11357; FG02-94ER14466
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Physics and Chemistry of Minerals
- Additional Journal Information:
- Journal Volume: 49; Journal Issue: 5; Journal ID: ISSN 0342-1791
- Publisher:
- Springer
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; Diamond anvil cell; Mechanical stress; Piezospectroscopy; Ruby fluorescence; Thin films
Citation Formats
Dorfman, Susannah M., Najiba, Shah, Arroyo, Bella, Theuer, Samantha, Lv, Mingda, and Brugman, Benjamin L. Control of deviatoric stress in the diamond anvil cell through thermal expansion mismatch stress in thin films. United States: N. p., 2022.
Web. doi:10.1007/s00269-022-01191-9.
Dorfman, Susannah M., Najiba, Shah, Arroyo, Bella, Theuer, Samantha, Lv, Mingda, & Brugman, Benjamin L. Control of deviatoric stress in the diamond anvil cell through thermal expansion mismatch stress in thin films. United States. https://doi.org/10.1007/s00269-022-01191-9
Dorfman, Susannah M., Najiba, Shah, Arroyo, Bella, Theuer, Samantha, Lv, Mingda, and Brugman, Benjamin L. Tue .
"Control of deviatoric stress in the diamond anvil cell through thermal expansion mismatch stress in thin films". United States. https://doi.org/10.1007/s00269-022-01191-9. https://www.osti.gov/servlets/purl/1867017.
@article{osti_1867017,
title = {Control of deviatoric stress in the diamond anvil cell through thermal expansion mismatch stress in thin films},
author = {Dorfman, Susannah M. and Najiba, Shah and Arroyo, Bella and Theuer, Samantha and Lv, Mingda and Brugman, Benjamin L.},
abstractNote = {Elastic and plastic properties of materials and phase transitions at extreme conditions vary with both hydrostatic pressure and deviatoric stress. To generate and measure controlled deviatoric stress at pressures beyond those accessible with large volume differential and rotational presses and optical access for spectroscopy, experiments tested the combination of diamond anvil cell and thin film technology. Thin films of polycrystalline Cr-doped Al2O3 ruby were prepared using pulsed laser deposition on single-crystal substrates of either Al2O3 sapphire or yttria-stabilized cubic zirconia for contrasting initial film stress, and loaded in diamond anvil cells for confining stress. The piezospectroscopic response of the ruby films demonstrates consistently higher deviatoric stress in the film on zirconia relative to the film on the control sapphire, and an increase in deviatoric stress with applied load. Complementary synchrotron X-ray diffraction of the zirconia substrate confirmed that no pressure-induced phase transitions impacted the stress state of the ruby film, but differences in compressibility of film and substrate result in changes in film stress analogous to thermal expansion mismatch. Furthermore, this technique may be applied to evaluate elastic and plastic response of thin films of a variety of materials under extreme stress.},
doi = {10.1007/s00269-022-01191-9},
journal = {Physics and Chemistry of Minerals},
number = 5,
volume = 49,
place = {United States},
year = {Tue May 03 00:00:00 EDT 2022},
month = {Tue May 03 00:00:00 EDT 2022}
}
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