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Title: Fast Scanning Diamond Detector for Electron Beam Profile Monitoring

Journal Article · · Proceedings of the International Beam Instrumentation Conference (IBIC)
 [1];  [2];  [2];  [2];  [2];  [2]
  1. Applied Diamond, Inc., Wilmington, DE (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States)

The first prototype of a fast scanning diamond beam profile detector (DBPD) suitable for invasive high power CW electron beam core profile measurements in transmittance mode was developed. It consists of a multi-strip solid state diamond detector to scan with high speed (up to 1 m/s) and precision (about 5 μm) through the core of an electron beam. The diamond sensor was made from a thin polycrystalline diamond (PCD) plate with highly B-doped diamond conductive strips both grown by CVD. Transient currents from the multi-strip detector were measured with fast digitizing electrometers. Successful operation of the DBPD was demonstrated for pulsed (5 Hz) and CW (78 kHz) CeC beams, including the detector’s ability to withstand a 20 sec insertion into the CW CeC beam core. The X-Y beam spatial profile was measured in one scan. Thermal modelling demonstrated a manageable thermal impact even from a relatively long insertion of the diamond sensor into the CW CeC core and very short (0.2 s) insertion into the CW LEReC beam core. Electrical impedance modelling of the detector and vacuum chamber assembly demonstrated minimal impact on beam line impedance with diamond sensor insertion.

Research Organization:
Applied Diamond, Inc., Wilmington, DE (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
Grant/Contract Number:
SC0020498
OSTI ID:
1864809
Journal Information:
Proceedings of the International Beam Instrumentation Conference (IBIC), Vol. 2021; Conference: 10.International Beam Instrumentation Conference (IBIC21), Pohang (Korea, Republic of), 24-28 May 2021; ISSN 2673-5350
Publisher:
JACoW PublishingCopyright Statement
Country of Publication:
United States
Language:
English