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Title: Quantitative XPS of plutonium: Evaluation of the Pu4f peak shape, relative sensitivity factors and estimated detection limits

Journal Article · · Surface and Interface Analysis
DOI: https://doi.org/10.1002/sia.7083 · OSTI ID:1860699
ORCiD logo [1];  [2]
  1. AWE plc, Berkshire (United Kingdom)
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

We report that high-resolution X-ray photoelectron spectra have been acquired from sputter cleaned and in situ oxidized samples of α-plutonium and a face-centred cubic δ-plutonium–gallium alloy. The differences in the Pu4f peak shape in these two materials have been investigated, and the poorly screened satellite peaks have been quantified. Curve fitting parameters for the Pu4p3/2, Pu4d5/2, Pu4f and Pu6p3/2 photoelectron peaks are reported, and relative sensitivity factors have been determined. The Pu4f curve fit model has been applied to data acquired using different spectrometers and alloys. Examples of quantification of the plutonium spectra are provided and minimum detection limits are calculated for common impurities in plutonium metal.

Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE; USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC52-07NA27344
OSTI ID:
1860699
Report Number(s):
LLNL-JRNL-827762; 1040560
Journal Information:
Surface and Interface Analysis, Journal Name: Surface and Interface Analysis Journal Issue: 7 Vol. 54; ISSN 0142-2421
Publisher:
WileyCopyright Statement
Country of Publication:
United States
Language:
English

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