SENSEI: Characterization of Single-Electron Events Using a Skipper Charge-Coupled Device

Journal Article · 18 January 2022 · Physical Review Applied

DOI: https://doi.org/10.1103/physrevapplied.17.014022 · OSTI ID:1855360

Barak, Liron; Bloch, Itay M.; Botti, Ana; Cababie, Mariano ; Cancelo, Gustavo; Chaplinsky, Luke; Chierchie, Fernando; Crisler, Michael; Drlica-Wagner, Alex; Essig, Rouven; Estrada, Juan; Etzion, Erez; Fernandez Moroni, Guillermo; Gift, Daniel; Holland, Stephen E.; Munagavalasa, Sravan; Orly, Aviv; Rodrigues, Dario; Singal, Aman; Haro, Miguel Sofo ; Stefanazzi, Leandro; Tiffenberg, Javier; Uemura, Sho; Volansky, Tomer; Yu, Tien-Tien

We use a science-grade skipper charge-coupled device (skipper CCD) operating in a low-radiation background environment to develop a semi-empirical model that characterizes the origin of single-electron events in CCDs. We identify, separate, and quantify three independent contributions to the single-electron events, which were previously bundled together and classified as "dark counts": dark current, amplifier light, and spurious charge. We measure a dark current, which depends on exposure, of (5.89±0.77)×10^-4e^-/pix/day, and an unprecedentedly low spurious charge contribution of (1.52±0.07)×10^-4e^-/pix, which is exposure independent. In addition, we provide a technique to study events produced by light emitted from the amplifier, which allows the detector's operation to be optimized to minimize this effect to a level below the dark-current contribution. Our accurate characterization of the single-electron events allows one to greatly extend the sensitivity of experiments searching for dark matter or coherent neutrino scattering. Moreover, an accurate understanding of the origin of single-electron events is critical to further progress in ongoing research and development efforts of skipper and conventional CCDs.

• Research Organization: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
• Sponsoring Organization: USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
• Contributing Organization: SENSEI Collaboration
• Grant/Contract Number: AC02-05CH11231
• OSTI ID: 1855360
• Journal Information: Physical Review Applied, Journal Name: Physical Review Applied Journal Issue: 1 Vol. 17; ISSN 2331-7019
• Publisher: American Physical Society (APS)Copyright Statement
• Country of Publication: United States
• Language: English