Measuring and Modeling Single Event Transients in 12-nm Inverters

Journal Article · 28 February 2022 · IEEE Transactions on Nuclear Science

DOI: https://doi.org/10.1109/TNS.2022.3147745 · OSTI ID:1854965

Agarwal, Sapan ; Clark, Lawrence T. ; Youngsciortino, Clifford ; Ng, Garrick ; Black, Dolores ; Cannon, Matthew ; Black, Jeffrey ; Quinn, Heather ; Brunhaver, John; Barnaby, Hugh ; Manuel, Jack; Blansett, Ethan; Marinella, Matthew J.

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• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE; USDOE National Nuclear Security Administration (NNSA)
• Grant/Contract Number: NA0003525
• OSTI ID: 1854965
• Report Number(s): SAND2022-1331J; 9696339
• Journal Information: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 3 Vol. 69; ISSN 0018-9499
• Publisher: Institute of Electrical and Electronics EngineersCopyright Statement
• Country of Publication: United States
• Language: English