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Title: Understanding SiO x Layer Breakup in poly-Si/SiO x Passivating Contacts for Si Solar Cells Using Precisely Engineered Surface Textures

Journal Article · · ACS Applied Energy Materials
ORCiD logo [1]; ORCiD logo [2];  [3];  [2];  [2];  [2];  [2]; ORCiD logo [1]
  1. Department of Chemical and Biological Engineering, Colorado School of Mines, Golden, Colorado 80401, United States, National Renewable Energy Laboratory, Golden, Colorado 80401, United States
  2. National Renewable Energy Laboratory, Golden, Colorado 80401, United States
  3. Department of Chemical and Biological Engineering, Colorado School of Mines, Golden, Colorado 80401, United States

Not Available

Research Organization:
National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE); USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
Grant/Contract Number:
AC36-08GO28308
OSTI ID:
1846476
Report Number(s):
NREL/JA-5900-82259
Journal Information:
ACS Applied Energy Materials, Journal Name: ACS Applied Energy Materials Journal Issue: 3 Vol. 5; ISSN 2574-0962
Publisher:
American Chemical SocietyCopyright Statement
Country of Publication:
United States
Language:
English

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A simple method for pinhole detection in carrier selective POLO-junctions for high efficiency silicon solar cells journal December 2017
SiO2 surface passivation layers – a key technology for silicon solar cells journal October 2018
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Mechanisms of charge carrier transport in polycrystalline silicon passivating contacts journal October 2021
Effect of Surface Texture on Pinhole Formation in SiO x -Based Passivated Contacts for High-Performance Silicon Solar Cells journal December 2020
Effect of Crystallographic Orientation and Nanoscale Surface Morphology on Poly-Si/SiO x Contacts for Silicon Solar Cells journal October 2019
Design rules for high-efficiency both-sides-contacted silicon solar cells with balanced charge carrier transport and recombination losses journal April 2021
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