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Title: Silica: ubiquitous poison of metal oxide interfaces

Journal Article · · Journal of Materials Chemistry. A
DOI: https://doi.org/10.1039/D1TA08469K · OSTI ID:1842237

In this review, we consider the detrimental effects of Si-contamination on electrochemical applications, broadly conceived, in which both ions and electrons play key roles in device operation and where exchange of oxygen between the gas and solid phase is likewise essential for operation.

Research Organization:
Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States); National Energy Technology Laboratory (NETL), Pittsburgh, PA, Morgantown, WV, and Albany, OR (United States)
Sponsoring Organization:
USDOE; USDOE Office of Fossil Energy (FE); USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
FE0031668; SC0002633
OSTI ID:
1842237
Journal Information:
Journal of Materials Chemistry. A, Journal Name: Journal of Materials Chemistry. A Journal Issue: 6 Vol. 10; ISSN JMCAET; ISSN 2050-7488
Publisher:
Royal Society of Chemistry (RSC)Copyright Statement
Country of Publication:
United Kingdom
Language:
English

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