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Title: Lensless X-Ray Nanoimaging: Revolutions and opportunities

Journal Article · · IEEE Signal Processing Magazine
 [1];  [2];  [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS); Northwestern Univ., Evanston, IL (United States)
  2. Stony Brook Univ., NY (United States); Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)

Lensless x-ray nanoimaging is providing 3D views of a wide range of materials with a spatial resolution better than 20 nanometers. These advances are enabled in part by dramatic gains in coherent x-ray flux, but they also rely on advances in signal processing to obtain images from coherent diffraction data. Here, we outline the various imaging approaches, the associated reconstruction methods, and highlight opportunities for future advances.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF)
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1841734
Journal Information:
IEEE Signal Processing Magazine, Journal Name: IEEE Signal Processing Magazine Journal Issue: 1 Vol. 39; ISSN 1053-5888
Publisher:
IEEECopyright Statement
Country of Publication:
United States
Language:
English

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