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Title: Anomalous Example Detection in Deep Learning: A Survey

Journal Article · · IEEE Access
ORCiD logo [1]; ORCiD logo [2];  [3]; ORCiD logo [1];  [4]
  1. EECS Department, Syracuse University, Syracuse, NY, USA
  2. Lawrence Livermore National Laboratory, Livermore, CA, USA
  3. Computer Science Department, University of Illinois at Urbana--Champaign, Champaign IL, USA
  4. EECS Department, University of California at Berkeley, Berkeley, CA, USA
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Sponsoring Organization:
USDOE
Grant/Contract Number:
AC52-07NA27344
OSTI ID:
1836335
Journal Information:
IEEE Access, Journal Name: IEEE Access Vol. 8; ISSN 2169-3536
Publisher:
Institute of Electrical and Electronics EngineersCopyright Statement
Country of Publication:
United States
Language:
English

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