Two-dimensional correlation analysis for x-ray photoelectron spectroscopy

Journal Article · 12 August 2021 · Journal of Physics. B, Atomic, Molecular and Optical Physics

DOI: https://doi.org/10.1088/1361-6455/abcdf1 · OSTI ID:1835455

Li, S. ; Driver, T. ; Al Haddad, A.; Champenois, E. G.; Agåker, M.; Alexander, O.; Barillot, T.; Bostedt, C.; Garratt, D.; Kjellsson, L. ; Lutman, A. A.; Rubensson, J-E; Sathe, C.; Marinelli, A.; Marangos, J. P.; Cryan, J. P.

Abstract X-ray photoelectron spectroscopy (XPS) measures the binding energy of core-level electrons, which are well-localised to specific atomic sites in a molecular system, providing valuable information on the local chemical environment. The technique relies on measuring the photoelectron spectrum upon x-ray photoionisation, and the resolution is often limited by the bandwidth of the ionising x-ray pulse. This is particularly problematic for time-resolved XPS, where the desired time resolution enforces a fundamental lower limit on the bandwidth of the x-ray source. In this work, we report a novel correlation analysis which exploits the correlation between the x-ray and photoelectron spectra to improve the resolution of XPS measurements. We show that with this correlation-based spectral-domain ghost imaging method we can achieve sub-bandwidth resolution in XPS measurements. This analysis method enables XPS for sources with large bandwidth or spectral jitter, previously considered unfeasible for XPS measurements.

• Sponsoring Organization: USDOE
• OSTI ID: 1835455
• Journal Information: Journal of Physics. B, Atomic, Molecular and Optical Physics, Journal Name: Journal of Physics. B, Atomic, Molecular and Optical Physics Journal Issue: 14 Vol. 54; ISSN 0953-4075
• Publisher: IOP PublishingCopyright Statement
• Country of Publication: United Kingdom
• Language: English