Applications of analytical electron microscopy to guide the design of boron carbide

Marvel, Christopher J.; Yang, Qirong; Walck, Scott D.; Xie, Kelvin Y.; Behler, Kristopher D.; LaSalvia, Jerry C.; Watanabe, Masashi; Haber, Richard A.; Harmer, Martin P.

doi:10.1111/jace.18039

Title: Applications of analytical electron microscopy to guide the design of boron carbide

Journal Article · 16 July 2021 · Journal of the American Ceramic Society

DOI: https://doi.org/10.1111/jace.18039 · OSTI ID:1830479

Marvel, Christopher J. ^[1]; Yang, Qirong ^[2]; Walck, Scott D. ^[3];

^[4]; Behler, Kristopher D. ^[5]; LaSalvia, Jerry C. ^[5]; Watanabe, Masashi ^[1]; Haber, Richard A. ^[6];

^[1]

Lehigh Univ., Bethlehem, PA (United States)
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
SURVICE Engineering, Belcamp, MD (United States); DEVCOM Army Research Lab, Aberdeen Proving Ground, MD (United States)
Texas A & M Univ., College Station, TX (United States)
DEVCOM Army Research Lab, Aberdeen Proving Ground, MD (United States)
Rutgers Univ., Piscataway, NJ (United States)

Compositional analysis of boron carbide on nanometer length scales to examine or interpret atomic mechanisms, for example, solid-state amorphization or grain-boundary segregation, is challenging. This work reviews advancements in high-resolution microanalysis to characterize multiple generations of boron carbide. First, ζ-factor microanalysis will be introduced as a powerful (scanning) transmission electron microscopy ((S)TEM) analytical framework to accurately characterize boron carbide. Three case studies involving the application of ζ-factor microanalysis will then be presented: (1) accurate stoichiometry determination of B-doped boron carbide using ζ-factor microanalysis and electron energy loss spectroscopy, (2) normalized quantification of silicon grain-boundary segregation in Si-doped boron carbide, and (3) calibration of a scanning electron microscope X-ray energy-dispersive spectroscopy (XEDS) system to measure compositional homogeneity differences of B/Si-doped arc-melted boron carbides in the as-melted and annealed conditions. Overall, the improvement and application of advanced analytical tools have helped better understand processing–microstructure–property relationships and successfully manufacture high-performance ceramics.

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Research Organization:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Organization:: US Army Research Laboratory (USARL); USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: AC52-07NA27344

OSTI ID:: 1830479

Report Number(s):: LLNL-JRNL--822902; 1034992

Journal Information:: Journal of the American Ceramic Society, Journal Name: Journal of the American Ceramic Society Journal Issue: 5 Vol. 105; ISSN 0002-7820

Publisher:: American Ceramic SocietyCopyright Statement

Country of Publication:: United States

Language:: English

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36 MATERIALS SCIENCE
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
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transmission electron microscopy

Title: Applications of analytical electron microscopy to guide the design of boron carbide

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