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Title: Integrated Optical Addressing of a Trapped Ytterbium Ion

Abstract

We report on the characterization of heating rates and photoinduced electric charging on a microfabricated surface ion trap with integrated waveguides. Microfabricated surface ion traps have received considerable attention as a quantum information platform due to their scalability and manufacturability. Here, we characterize the delivery of 435-nm light through waveguides and diffractive couplers to a single ytterbium ion in a compact trap. We measure an axial heating rate at room temperature of 0.78 ± 0.05 q/ms and see no increase due to the presence of the waveguide. Furthermore, the electric field due to charging of the exposed dielectric outcoupler settles under normal operation after an initial shift. The frequency instability after settling is measured to be 0.9 kHz.

Authors:
ORCiD logo; ORCiD logo; ORCiD logo; ; ; ; ORCiD logo; ; ORCiD logo
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA); Defense Advanced Research Projects Activity (DARPA)
OSTI Identifier:
1830451
Alternate Identifier(s):
OSTI ID: 1831175; OSTI ID: 1831176
Report Number(s):
SAND-2020-12857J; SAND-2020-12920J
Journal ID: ISSN 2160-3308; PRXHAE; 041033
Grant/Contract Number:  
NA0003525
Resource Type:
Published Article
Journal Name:
Physical Review. X
Additional Journal Information:
Journal Name: Physical Review. X Journal Volume: 11 Journal Issue: 4; Journal ID: ISSN 2160-3308
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English
Subject:
Atomic, optical & lattice clocks; Integrated optics; Photonics; Quantum information with trapped ions; Trapped ions; 74 ATOMIC AND MOLECULAR PHYSICS; Atomic and Molecular Physics; Quantum Physics; Quantum Information

Citation Formats

Ivory, M., Setzer, W. J., Karl, N., McGuinness, H., DeRose, C., Blain, M., Stick, D., Gehl, M., and Parazzoli, L. P. Integrated Optical Addressing of a Trapped Ytterbium Ion. United States: N. p., 2021. Web. doi:10.1103/PhysRevX.11.041033.
Ivory, M., Setzer, W. J., Karl, N., McGuinness, H., DeRose, C., Blain, M., Stick, D., Gehl, M., & Parazzoli, L. P. Integrated Optical Addressing of a Trapped Ytterbium Ion. United States. https://doi.org/10.1103/PhysRevX.11.041033
Ivory, M., Setzer, W. J., Karl, N., McGuinness, H., DeRose, C., Blain, M., Stick, D., Gehl, M., and Parazzoli, L. P. Tue . "Integrated Optical Addressing of a Trapped Ytterbium Ion". United States. https://doi.org/10.1103/PhysRevX.11.041033.
@article{osti_1830451,
title = {Integrated Optical Addressing of a Trapped Ytterbium Ion},
author = {Ivory, M. and Setzer, W. J. and Karl, N. and McGuinness, H. and DeRose, C. and Blain, M. and Stick, D. and Gehl, M. and Parazzoli, L. P.},
abstractNote = {We report on the characterization of heating rates and photoinduced electric charging on a microfabricated surface ion trap with integrated waveguides. Microfabricated surface ion traps have received considerable attention as a quantum information platform due to their scalability and manufacturability. Here, we characterize the delivery of 435-nm light through waveguides and diffractive couplers to a single ytterbium ion in a compact trap. We measure an axial heating rate at room temperature of 0.78 ± 0.05 q/ms and see no increase due to the presence of the waveguide. Furthermore, the electric field due to charging of the exposed dielectric outcoupler settles under normal operation after an initial shift. The frequency instability after settling is measured to be 0.9 kHz.},
doi = {10.1103/PhysRevX.11.041033},
journal = {Physical Review. X},
number = 4,
volume = 11,
place = {United States},
year = {2021},
month = {11}
}

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