Proton irradiation-induced blistering in UO2
Abstract Proton (H + ) irradiation effects in polycrystalline UO 2 have been studied. The irradiation was carried out using three ion energies and two different ion fluxes at 600 °C. Scanning electron microscopy (SEM) investigations showed that significant surface flaking took place. Focused ion beam (FIB) milling in SEM was successfully applied for extracting lamellas from uneven blistered surfaces for transmission electron microscopy (TEM) investigations allowing detailed investigations for the degradation mechanisms. High-resolution TEM for the flaked UO 2 surfaces revealed that the implanted H + formed sharp two-dimensional cavities at the peak ion-stopping region instead of diffusing to the matrix. The resulting lateral stress likely caused UO 2 surface deterioration in good agreement with previous blistering and flaking studies on crystalline materials. Graphical abstract
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 1829737
- Journal Information:
- MRS Advances (Online), Journal Name: MRS Advances (Online) Journal Issue: 47-48 Vol. 6; ISSN 2731-5894
- Publisher:
- Cambridge University Press (CUP)Copyright Statement
- Country of Publication:
- Switzerland
- Language:
- English
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