SILIA: software implementation of a multi-channel, multi-frequency lock-in amplifier for spectroscopy and imaging applications

Nadgir, Amrut; Thurston, Richard; Larsen, Kirk A.; Shivaram, Niranjan; Brister, Matthew M.; Slaughter, Daniel S.

doi:10.1088/1361-6501/ac2436

Title: SILIA: software implementation of a multi-channel, multi-frequency lock-in amplifier for spectroscopy and imaging applications

Journal Article · 20 September 2021 · Measurement Science and Technology

DOI: https://doi.org/10.1088/1361-6501/ac2436 · OSTI ID:1822870

^[1]; Thurston, Richard ^[1]; Larsen, Kirk A. ^[2]; Shivaram, Niranjan ^[3]; Brister, Matthew M. ^[1];

^[1]

Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Berkeley, CA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Purdue Univ., West Lafayette, IN (United States)

In this work, we describe a software implementation of a multi-channel, multi-frequency Lock-in Amplifier (SILIA) to extract modulated signals from noisy data distributed over multiple channels of arbitrary number and size. This software implementation emulates the functionality of a multi-channel, multi-frequency lock-in amplifier in a post-processing step following data acquisition. Unlike most traditional lock-in amplifiers, SILIA can work with any number of input channels and is especially useful to analyze data distributed over many channels. We demonstrate the versatility and performance for extracting weak signals in spectroscopy and fluorescence microscopy. We also discuss more general applications and exhibit a method to automatically estimate error from a lock-in result.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1822870

Journal Information:: Measurement Science and Technology, Journal Name: Measurement Science and Technology Journal Issue: 12 Vol. 32; ISSN 0957-0233

Publisher:: IOP PublishingCopyright Statement

Country of Publication:: United States

Language:: English

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