How oxygen passivates polycrystalline nickel surfaces

Wong, Chun-Shang; Wang, Chen S.; Whaley, Josh A.; Sugar, Joshua D.; Kolasinski, Robert D.; Thürmer, Konrad

doi:10.1063/5.0060352

Title: How oxygen passivates polycrystalline nickel surfaces

Journal Article · 31 August 2021 · Journal of Chemical Physics

DOI: https://doi.org/10.1063/5.0060352 · OSTI ID:1820421

^[1]; Wang, Chen S. ^[1]; Whaley, Josh A. ^[1]; Sugar, Joshua D. ^[1];

^[1];

^[1]

Sandia National Lab. (SNL-CA), Livermore, CA (United States)

The passivation of polycrystalline nickel surfaces against hydrogen uptake by oxygen is investigated experimentally with low energy ion scattering (LEIS), direct recoil spectroscopy (DRS), and thermal desorption spectroscopy (TDS). These techniques are highly sensitive to surface hydrogen, allowing the change in hydrogen adsorption in response to varying amounts of oxygen exposure to be measured. The chemical composition of a nickel surface during a mixed oxygen and hydrogen exposure was characterized with LEIS and DRS, while the uptake and activation energies of hydrogen on a nickel surface with preadsorbed oxygen were quantified with TDS. By and large, these measurements of how the oxygen and hydrogen surface coverage varied in response to oxygen exposure were found to be consistent with predictions of a simple site-blocking model. This finding suggests that, despite the complexities that arise due to polycrystallinity, the oxygen-induced passivation of a polycrystalline nickel surface against hydrogen uptake can be approximated by a simple site-blocking model.

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Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: NA0003525

OSTI ID:: 1820421

Report Number(s):: SAND--2021-10648J; 699023

Journal Information:: Journal of Chemical Physics, Journal Name: Journal of Chemical Physics Journal Issue: 9 Vol. 155; ISSN 0021-9606

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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