Trapped Electrons and Ions as Particle Detectors

Carney, Daniel; Häffner, Hartmut; Moore, David C.; Taylor, Jacob M.

doi:10.1103/physrevlett.127.061804

Title: Trapped Electrons and Ions as Particle Detectors

Journal Article · 05 August 2021 · Physical Review Letters

DOI: https://doi.org/10.1103/physrevlett.127.061804 · OSTI ID:1819866

Carney, Daniel ^[1]; Häffner, Hartmut ^[2]; Moore, David C. ^[3];

^[4]

Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Univ. of California, Berkeley, CA (United States)
Yale Univ., New Haven, CT (United States)
National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States); Univ. of Maryland, College Park, MD (United States)

Electrons and ions trapped with electromagnetic fields have long served as important high-precision metrological instruments, and more recently have also been proposed as a platform for quantum information processing. Here we point out that these systems can also be used as highly sensitive detectors of passing charged particles, due to the combination of their extreme charge-to-mass ratio and low-noise quantum readout and control. In particular, these systems can be used to detect energy depositions many orders of magnitude below typical ionization scales. As illustrations, we suggest some applications in particle physics. We outline a nondestructive time-of-flight measurement capable of sub-eV energy resolution for slowly moving, collimated particles. We also show that current devices can be used to provide competitive sensitivity to models where ambient dark matter particles carry small electric millicharges $$\ll$$e. Furthermore, our calculations may also be useful in the characterization of noise in quantum computers coming from backgrounds of charged particles.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: NSF; USDOE

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1819866

Journal Information:: Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 6 Vol. 127; ISSN 0031-9007

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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Atom & ion trapping & guiding
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Title: Trapped Electrons and Ions as Particle Detectors

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