Prismatic 2.0 – Simulation software for scanning and high resolution transmission electron microscopy (STEM and HRTEM)

Rangel DaCosta, Luis; Brown, Hamish G.; Pelz, Philipp M.; Rakowski, Alexander; Barber, Natolya; O’Donovan, Peter; McBean, Patrick; Jones, Lewys; Ciston, Jim; Scott, M. C.; Ophus, Colin

doi:10.1016/j.micron.2021.103141

Title: Prismatic 2.0 – Simulation software for scanning and high resolution transmission electron microscopy (STEM and HRTEM)

Journal Article · 01 December 2021 · Micron

DOI: https://doi.org/10.1016/j.micron.2021.103141 · OSTI ID:1819473

Rangel DaCosta, Luis;

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; Rakowski, Alexander;

;

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Sponsoring Organization:: USDOE

OSTI ID:: 1819473

Journal Information:: Micron, Journal Name: Micron Journal Issue: C Vol. 151; ISSN 0968-4328

Publisher:: ElsevierCopyright Statement

Country of Publication:: United Kingdom

Language:: English

References (37)

Applications of slow-scan CCD cameras in transmission electron microscopy Krivanek, O. L.; Mooney, P. E. Ultramicroscopy, Vol. 49, Issue 1-4 https://doi.org/10.1016/0304-3991(93)90216-K	journal	February 1993
Three-fold astigmatism in high-resolution transmission electron microscopy Krivanek, O. L. Ultramicroscopy, Vol. 55, Issue 4 https://doi.org/10.1016/0304-3991(94)90177-5	journal	October 1994
Numerical correction of lens aberrations in phase-retrieval HRTEM Thust, A.; Overwijk, M. H. F.; Coene, W. M. J. Ultramicroscopy, Vol. 64, Issue 1-4 https://doi.org/10.1016/0304-3991(96)00022-8	journal	August 1996
Residual wave aberrations in the first spherical aberration corrected transmission electron microscope Uhlemann, Stephan; Haider, Maximilian Ultramicroscopy, Vol. 72, Issue 3-4 https://doi.org/10.1016/S0304-3991(97)00102-2	journal	May 1998
Exit wave reconstruction at atomic resolution Allen, L. J.; McBride, W.; O'Leary, N. L. Ultramicroscopy, Vol. 100, Issue 1-2 https://doi.org/10.1016/j.ultramic.2004.01.012	journal	July 2004
On the optimum probe in aberration corrected ADF-STEM Kirkland, Earl J. Ultramicroscopy, Vol. 111, Issue 11 https://doi.org/10.1016/j.ultramic.2011.09.002	journal	November 2011
A holographic method to measure the source size broadening in STEM Verbeeck, Jo; Béché, Armand; Van den Broek, Wouter Ultramicroscopy, Vol. 120 https://doi.org/10.1016/j.ultramic.2012.05.007	journal	September 2012
Control of radiation damage in the TEM Egerton, R. F. Ultramicroscopy, Vol. 127 https://doi.org/10.1016/j.ultramic.2012.07.006	journal	April 2013
Breaking the Crowther limit: Combining depth-sectioning and tilt tomography for high-resolution, wide-field 3D reconstructions Hovden, Robert; Ercius, Peter; Jiang, Yi Ultramicroscopy, Vol. 140 https://doi.org/10.1016/j.ultramic.2014.01.013	journal	May 2014
MULTEM: A new multislice program to perform accurate and fast electron diffraction and imaging simulations using Graphics Processing Units with CUDA Lobato, I.; Van Dyck, D. Ultramicroscopy, Vol. 156 https://doi.org/10.1016/j.ultramic.2015.04.016	journal	September 2015
Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose Müller-Caspary, Knut; Krause, Florian F.; Winkler, Florian Ultramicroscopy, Vol. 203 https://doi.org/10.1016/j.ultramic.2018.12.018	journal	August 2019
Imaging defect complexes in scanning transmission electron microscopy: Impact of depth, structural relaxation, and temperature investigated by simulations Aarholt, Thomas; Frodason, Ymir K.; Prytz, Øystein Ultramicroscopy, Vol. 209 https://doi.org/10.1016/j.ultramic.2019.112884	journal	February 2020
Atomic resolution convergent beam electron diffraction analysis using convolutional neural networks Zhang, Chenyu; Feng, Jie; DaCosta, Luis Rangel Ultramicroscopy, Vol. 210 https://doi.org/10.1016/j.ultramic.2019.112921	journal	March 2020
Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond Ophus, Colin Microscopy and Microanalysis, Vol. 25, Issue 3 https://doi.org/10.1017/S1431927619000497	journal	May 2019
A Python Based Open-source Multislice Simulation Package for Transmission Electron Microscopy Brown, Hamish; Pelz, Phillipp; Ophus, Colin Microscopy and Microanalysis, Vol. 26, Issue S2 https://doi.org/10.1017/S1431927620023326	journal	July 2020
A Fast Algorithm for Scanning Transmission Electron Microscopy Imaging and 4D-STEM Diffraction Simulations Pelz, Philipp M.; Rakowski, Alexander; Rangel DaCosta, Luis Microscopy and Microanalysis, Vol. 27, Issue 4 https://doi.org/10.1017/S1431927621012083	journal	July 2021
Electron microscopy image enhanced Haider, Maximilian; Uhlemann, Stephan; Schwan, Eugen Nature, Vol. 392, Issue 6678 https://doi.org/10.1038/33823	journal	April 1998
Sub-ångstrom resolution using aberration corrected electron optics Batson, P. E.; Dellby, N.; Krivanek, O. L. Nature, Vol. 418, Issue 6898 https://doi.org/10.1038/nature00972	journal	August 2002
Deciphering chemical order/disorder and material properties at the single-atom level Yang, Yongsoo; Chen, Chien-Chun; Scott, M. C. Nature, Vol. 542, Issue 7639 https://doi.org/10.1038/nature21042	journal	February 2017
Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry Ophus, Colin; Ciston, Jim; Pierce, Jordan Nature Communications, Vol. 7, Issue 1 https://doi.org/10.1038/ncomms10719	journal	February 2016
Free-standing graphene at atomic resolution Gass, Mhairi H.; Bangert, Ursel; Bleloch, Andrew L. Nature Nanotechnology, Vol. 3, Issue 11 https://doi.org/10.1038/nnano.2008.280	journal	September 2008
Vibrational spectroscopy at atomic resolution with electron impact scattering Venkatraman, Kartik; Levin, Barnaby D. A.; March, Katia Nature Physics, Vol. 15, Issue 12 https://doi.org/10.1038/s41567-019-0675-5	journal	October 2019
Observation of room-temperature polar skyrmions Das, S.; Tang, Y. L.; Hong, Z. Nature, Vol. 568, Issue 7752 https://doi.org/10.1038/s41586-019-1092-8	journal	April 2019
Atomic resolution imaging of graphene by transmission electron microscopy Robertson, Alex W.; Warner, Jamie H. Nanoscale, Vol. 5, Issue 10 https://doi.org/10.1039/c3nr00934c	journal	January 2013
Detectors—The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization MacLaren, Ian; Macgregor, Thomas A.; Allen, Christopher S. APL Materials, Vol. 8, Issue 11 https://doi.org/10.1063/5.0026992	journal	November 2020
The Calculation of Electron Diffraction Intensities Sturkey, Lorenzo Proceedings of the Physical Society, Vol. 80, Issue 2 https://doi.org/10.1088/0370-1328/80/2/301	journal	August 1962
New area detector for atomic-resolution scanning transmission electron microscopy Shibata, N.; Kohno, Y.; Findlay, S. D. Journal of Electron Microscopy, Vol. 59, Issue 6 https://doi.org/10.1093/jmicro/dfq014	journal	April 2010
Channeling of a subangstrom electron beam in a crystal mapped to two-dimensional molecular orbitals Hovden, Robert; Xin, Huolin L.; Muller, David A. Physical Review B, Vol. 86, Issue 19 https://doi.org/10.1103/PhysRevB.86.195415	journal	November 2012
Quantitative Atomic Resolution Scanning Transmission Electron Microscopy LeBeau, James M.; Findlay, Scott D.; Allen, Leslie J. Physical Review Letters, Vol. 100, Issue 20 https://doi.org/10.1103/PhysRevLett.100.206101	journal	May 2008
Quantitative Elemental Mapping at Atomic Resolution Using X-Ray Spectroscopy Kothleitner, G.; Neish, M. J.; Lugg, N. R. Physical Review Letters, Vol. 112, Issue 8 https://doi.org/10.1103/PhysRevLett.112.085501	journal	February 2014
Linear-scaling algorithm for rapid computation of inelastic transitions in the presence of multiple electron scattering Brown, Hamish G.; Ciston, Jim; Ophus, Colin Physical Review Research, Vol. 1, Issue 3 https://doi.org/10.1103/PhysRevResearch.1.033186	journal	December 2019
The scattering of electrons by atoms and crystals. I. A new theoretical approach Cowley, J. M.; Moodie, A. F. Acta Crystallographica, Vol. 10, Issue 10, p. 609-619 https://doi.org/10.1107/S0365110X57002194	journal	October 1957
A new theoretical and practical approach to the multislice method Ishizuka, K.; Uyeda, N. Acta Crystallographica Section A, Vol. 33, Issue 5 https://doi.org/10.1107/S0567739477001879	journal	September 1977
Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples Ophus, Colin; Rasool, Haider I.; Linck, Martin Advanced Structural and Chemical Imaging, Vol. 2, Issue 1 https://doi.org/10.1186/s40679-016-0030-1	journal	November 2016
A fast image simulation algorithm for scanning transmission electron microscopy Ophus, Colin Advanced Structural and Chemical Imaging, Vol. 3, Issue 1 https://doi.org/10.1186/s40679-017-0046-1	journal	May 2017
A streaming multi-GPU implementation of image simulation algorithms for scanning transmission electron microscopy Pryor, Alan; Ophus, Colin; Miao, Jianwei Advanced Structural and Chemical Imaging, Vol. 3, Issue 1 https://doi.org/10.1186/s40679-017-0048-z	journal	October 2017
The abTEM code: transmission electron microscopy from first principles Madsen, Jacob; Susi, Toma Open Research Europe, Vol. 1 https://doi.org/10.12688/openreseurope.13015.1	journal	January 2021

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