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Title: Grazing-incidence X-ray diffraction tomography for characterizing organic thin films

Journal Article · · Journal of Applied Crystallography (Online)
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Characterization of thin films is of paramount importance for evaluating material processing outcomes/efficiency as well as establishing structure–property/performance relationships. This article introduces grazing-incidence diffraction tomography (GID tomography), a technique that combines grazing-incidence X-ray scattering and computed tomography to quantitatively determine the dimension and orientation of crystalline domains in thin films without restrictions on the beam coherence, substrate type or film thickness. This computational method extends the capability of synchrotron beamlines by utilizing standard X-ray scattering experiment setups.

Sponsoring Organization:
USDOE
OSTI ID:
1818837
Journal Information:
Journal of Applied Crystallography (Online), Journal Name: Journal of Applied Crystallography (Online) Journal Issue: 5 Vol. 54; ISSN JACGAR; ISSN 1600-5767
Publisher:
International Union of Crystallography (IUCr)Copyright Statement
Country of Publication:
Denmark
Language:
English

References (39)

Rational Design of Organic Semiconductors for Texture Control and Self-Patterning on Halogenated Surfaces journal May 2014
Direct Structural Mapping of Organic Field-Effect Transistors Reveals Bottlenecks to Carrier Transport journal August 2012
Solvent‐Free Coating of Organic Semiconductor Membranes with Centimetric Crystalline Domains journal January 2021
Visualization of Individual Images in Patterned Organic–Inorganic Multilayers Using GISAXS-CT journal May 2017
Large-Scale Organic Single-Crystal Thin Films and Transistor Arrays via the Evaporation-Controlled Fluidic Channel Method journal May 2014
Nanostructure Dependence of Field-Effect Mobility in Regioregular Poly(3-hexylthiophene) Thin Film Field Effect Transistors journal March 2006
High-Mobility Field-Effect Transistors from Large-Area Solution-Grown Aligned C60 Single Crystals journal January 2012
Understanding Polymorphism in Organic Semiconductor Thin Films through Nanoconfinement journal November 2014
Grazing Incidence Small-Angle X-ray Scattering Microtomography Demonstrated on a Self-Ordered Dried Drop of Nanoparticles journal June 2009
A new view on polarization microscopy journal June 1996
Inkjet printing of single-crystal films journal July 2011
Nanostructure surveys of macroscopic specimens by small-angle scattering tensor tomography journal November 2015
Ultra-high mobility transparent organic thin film transistors grown by an off-centre spin-coating method journal January 2014
One-dimensional self-confinement promotes polymorph selection in large-area organic semiconductor thin films journal April 2014
Large modulation of carrier transport by grain-boundary molecular packing and microstructure in organic thin films journal November 2009
Three-dimensional coherent X-ray surface scattering imaging near total external reflection journal August 2012
Efficient, stable and scalable perovskite solar cells using poly(3-hexylthiophene) journal March 2019
Orientation analysis of pentacene molecules in organic field-effect transistor devices using polarization-dependent Raman spectroscopy journal October 2019
Micro-Raman imaging of isomeric segregation in small-molecule organic semiconductors journal February 2019
Nucleation and strain-stabilization during organic semiconductor thin film deposition journal September 2016
Directional crystallization of C8-BTBT-C8 thin films in a temperature gradient journal January 2021
High-performance, semiconducting membrane composed of ultrathin, single-crystal organic semiconductors journal December 2019
Characterization of polymer thin films with small‐angle X‐ray scattering under grazing incidence (GISAXS) journal September 2002
Polarized light imaging of birefringence and diattenuation at high resolution and high sensitivity journal September 2013
The Reconstruction of a Three-Dimensional Structure from Projections and its Application to Electron Microscopy journal June 1970
Estimation of Line Cross Sections Using Critical-Dimension Grazing-Incidence Small-Angle X-Ray Scattering journal October 2019
Indexation scheme for oriented molecular thin films studied with grazing-incidence reciprocal-space mapping journal July 2007
Simulating X-ray diffraction of textured films journal March 2008
Regridding reconstruction algorithm for real-time tomographic imaging journal September 2012
Nebula : reconstruction and visualization of scattering data in reciprocal space journal February 2015
Visualizing patterned thin films by grazing-incidence small-angle X-ray scattering coupled with computed tomography journal October 2015
Improving grazing-incidence small-angle X-ray scattering–computed tomography images by total variation minimization journal February 2020
TomoPy: a framework for the analysis of synchrotron tomographic data journal August 2014
Advanced grazing-incidence techniques for modern soft-matter materials analysis journal January 2015
Small-angle X-ray scattering tensor tomography: model of the three-dimensional reciprocal-space map, reconstruction algorithm and angular sampling requirements journal January 2018
A Fast Sinc Function Gridding Algorithm for Fourier Inversion in Computer Tomography journal December 1985
New polarized light microscope with precision universal compensator journal November 1995
Developments in synchrotron x-ray computed microtomography at the National Synchrotron Light Source
  • Dowd, Betsy A.; Campbell, Graham H.; Marr, Robert B.
  • SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, SPIE Proceedings https://doi.org/10.1117/12.363725
conference September 1999
Principles of Computerized Tomographic Imaging book January 2001

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