Temperature and processing effects on lithium ion conductivity of solution‐deposited lithium zirconium phosphate (LiZr 2 P 3 O 12 ) thin films
Abstract
Abstract Lithium zirconium phosphate (LiZr 2 P 3 O 12 ) thin films have been prepared on platinized silicon substrates via a chemical solution deposition approach with processing temperatures between 700°C and 775°C. Films that were subject to a single high‐temperature anneal were found to crystallize at temperatures above 725°C. Crystallization was observed in films annealed after each deposited layer at 700°C and above. In both cases, grain size was found to increase with annealing temperature. Ion conductivity was found to increase with annealing temperature in singly annealed films. In per‐layer annealed films ion conductivity was found to initially increase then decrease with increasing annealing temperature. A maximum ion conductivity of 1.6 × 10 −6 S/cm was observed for the singly annealed 775°C condition, while a maximum ion conductivity of 5.8 × 10 −7 S/cm was observed for the 725°C per‐layer annealed condition. These results are consistent with an increasing influence of cross‐plane, internal interface resistance and vapor phase carrier loss in the per‐layer annealed samples. This work demonstrates that post‐deposition processing methods can strongly affect the ion conducting properties of LiZr 2 P 3 O 12 thin films.
- Authors:
-
- Department of Materials Science and Engineering University of Virginia Charlottesville VA USA
- Sandia National Laboratories Albuquerque NM USA
- Sandia National Laboratories Livermore CA USA
- Department of Materials Science and Engineering University of Virginia Charlottesville VA USA, Sandia National Laboratories Albuquerque NM USA, Charles L. Brown Department of Electrical and Computer Engineering University of Virginia Charlottesville VA USA
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1805093
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Journal of the American Ceramic Society
- Additional Journal Information:
- Journal Name: Journal of the American Ceramic Society Journal Volume: 104 Journal Issue: 2; Journal ID: ISSN 0002-7820
- Publisher:
- Wiley-Blackwell
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Brummel, Ian A., Drury, Daniel E., Kitahara, Andrew R., El Gabaly, Farid, and Ihlefeld, Jon F. Temperature and processing effects on lithium ion conductivity of solution‐deposited lithium zirconium phosphate (LiZr 2 P 3 O 12 ) thin films. United States: N. p., 2020.
Web. doi:10.1111/jace.17483.
Brummel, Ian A., Drury, Daniel E., Kitahara, Andrew R., El Gabaly, Farid, & Ihlefeld, Jon F. Temperature and processing effects on lithium ion conductivity of solution‐deposited lithium zirconium phosphate (LiZr 2 P 3 O 12 ) thin films. United States. https://doi.org/10.1111/jace.17483
Brummel, Ian A., Drury, Daniel E., Kitahara, Andrew R., El Gabaly, Farid, and Ihlefeld, Jon F. Mon .
"Temperature and processing effects on lithium ion conductivity of solution‐deposited lithium zirconium phosphate (LiZr 2 P 3 O 12 ) thin films". United States. https://doi.org/10.1111/jace.17483.
@article{osti_1805093,
title = {Temperature and processing effects on lithium ion conductivity of solution‐deposited lithium zirconium phosphate (LiZr 2 P 3 O 12 ) thin films},
author = {Brummel, Ian A. and Drury, Daniel E. and Kitahara, Andrew R. and El Gabaly, Farid and Ihlefeld, Jon F.},
abstractNote = {Abstract Lithium zirconium phosphate (LiZr 2 P 3 O 12 ) thin films have been prepared on platinized silicon substrates via a chemical solution deposition approach with processing temperatures between 700°C and 775°C. Films that were subject to a single high‐temperature anneal were found to crystallize at temperatures above 725°C. Crystallization was observed in films annealed after each deposited layer at 700°C and above. In both cases, grain size was found to increase with annealing temperature. Ion conductivity was found to increase with annealing temperature in singly annealed films. In per‐layer annealed films ion conductivity was found to initially increase then decrease with increasing annealing temperature. A maximum ion conductivity of 1.6 × 10 −6 S/cm was observed for the singly annealed 775°C condition, while a maximum ion conductivity of 5.8 × 10 −7 S/cm was observed for the 725°C per‐layer annealed condition. These results are consistent with an increasing influence of cross‐plane, internal interface resistance and vapor phase carrier loss in the per‐layer annealed samples. This work demonstrates that post‐deposition processing methods can strongly affect the ion conducting properties of LiZr 2 P 3 O 12 thin films.},
doi = {10.1111/jace.17483},
journal = {Journal of the American Ceramic Society},
number = 2,
volume = 104,
place = {United States},
year = {Mon Sep 28 00:00:00 EDT 2020},
month = {Mon Sep 28 00:00:00 EDT 2020}
}
https://doi.org/10.1111/jace.17483
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