py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis

Savitzky, Benjamin H.; Zeltmann, Steven E.; Hughes, Lauren A.; Brown, Hamish G.; Zhao, Shiteng; Pelz, Philipp M.; Pekin, Thomas C.; Barnard, Edward S.; Donohue, Jennifer; DaCosta, Luis Rangel; Kennedy, Ellis; Xie, Yujun; Janish, Matthew T.; Schneider, Matthew M.; Herring, Patrick; Gopal, Chirranjeevi; Anapolsky, Abraham; Dhall, Rohan; Bustillo, Karen C.; Ercius, Peter; Scott, Mary C.; Ciston, Jim; Minor, Andrew M.; Ophus, Colin

doi:10.1017/s1431927621000477

Title: py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis

Abstract

Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full two-dimensional (2D) image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, including signatures of the local structure, orientation, deformation, electromagnetic fields, and other sample-dependent properties. However, extracting this information requires complex analysis pipelines that include data wrangling, calibration, analysis, and visualization, all while maintaining robustness against imaging distortions and artifacts. In this paper, we present py4DSTEM, an analysis toolkit for measuring material properties from 4D-STEM datasets, written in the Python language and released with an open-source license. We describe the algorithmic steps for dataset calibration and various 4D-STEM property measurements in detail and present results from several experimental datasets. We also implement a simple and universal file format appropriate for electron microscopy data in py4DSTEM, which uses the open-source HDF5 standard. We hope this tool will benefit the research community and help improve the standards for data and computational methods in electron microscopy, and we invite the community tomore » contribute to this ongoing project.« less

Authors:

^[1]; Zeltmann, Steven E. ^[2]; Hughes, Lauren A. ^[1];

^[1]; Zhao, Shiteng ^[3]; Pelz, Philipp M. ^[3]; Pekin, Thomas C. ^[4]; Barnard, Edward S. ^[1]; Donohue, Jennifer ^[3];

^[5]; Kennedy, Ellis ^[3]; Xie, Yujun ^[1]; Janish, Matthew T. ^[6]; Schneider, Matthew M. ^[6]; Herring, Patrick ^[7]; Gopal, Chirranjeevi ^[7]; Anapolsky, Abraham ^[7]; Dhall, Rohan ^[1]; Bustillo, Karen C. ^[1]; Ercius, Peter ^[1] more »

Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Univ. of California, Berkeley, CA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Berkeley, CA (United States)
Humboldt-Univ. zu Berlin (Germany)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of Michigan, Ann Arbor, MI (United States)
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Toyota Research Inst., Los Altos, CA (United States)

Publication Date:: Fri May 21 00:00:00 EDT 2021

Research Org.:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division; National Science Foundation (NSF); US Department of the Navy, Office of Naval Research (ONR); USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division; USDOE National Nuclear Security Administration (NNSA)

OSTI Identifier:: 1798795

Alternate Identifier(s):: OSTI ID: 1894621

Grant/Contract Number:: AC02-05CH11231; DMR 1548924; N00014-17-1-228; KC22ZH; 89233218CNA000001

Resource Type:: Accepted Manuscript

Journal Name:: Microscopy and Microanalysis

Additional Journal Information:: Journal Volume: 27; Journal Issue: 4; Journal ID: ISSN 1431-9276

Publisher:: Microscopy Society of America (MSA)

Country of Publication:: United States

Language:: English

Subject:: 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; calibration; diffraction; open source; STEM; 4D-STEM

Citation Formats


                    Savitzky, Benjamin H., Zeltmann, Steven E., Hughes, Lauren A., Brown, Hamish G., Zhao, Shiteng, Pelz, Philipp M., Pekin, Thomas C., Barnard, Edward S., Donohue, Jennifer, DaCosta, Luis Rangel, Kennedy, Ellis, Xie, Yujun, Janish, Matthew T., Schneider, Matthew M., Herring, Patrick, Gopal, Chirranjeevi, Anapolsky, Abraham, Dhall, Rohan, Bustillo, Karen C., Ercius, Peter, Scott, Mary C., Ciston, Jim, Minor, Andrew M., and Ophus, Colin. py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis.  United States: N. p., 2021. 
Web.  doi:10.1017/s1431927621000477.

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                    Savitzky, Benjamin H., Zeltmann, Steven E., Hughes, Lauren A., Brown, Hamish G., Zhao, Shiteng, Pelz, Philipp M., Pekin, Thomas C., Barnard, Edward S., Donohue, Jennifer, DaCosta, Luis Rangel, Kennedy, Ellis, Xie, Yujun, Janish, Matthew T., Schneider, Matthew M., Herring, Patrick, Gopal, Chirranjeevi, Anapolsky, Abraham, Dhall, Rohan, Bustillo, Karen C., Ercius, Peter, Scott, Mary C., Ciston, Jim, Minor, Andrew M., & Ophus, Colin. py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis.  United States.  https://doi.org/10.1017/s1431927621000477

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                    Savitzky, Benjamin H., Zeltmann, Steven E., Hughes, Lauren A., Brown, Hamish G., Zhao, Shiteng, Pelz, Philipp M., Pekin, Thomas C., Barnard, Edward S., Donohue, Jennifer, DaCosta, Luis Rangel, Kennedy, Ellis, Xie, Yujun, Janish, Matthew T., Schneider, Matthew M., Herring, Patrick, Gopal, Chirranjeevi, Anapolsky, Abraham, Dhall, Rohan, Bustillo, Karen C., Ercius, Peter, Scott, Mary C., Ciston, Jim, Minor, Andrew M., and Ophus, Colin. Fri .  
"py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis".  United States.  https://doi.org/10.1017/s1431927621000477.  https://www.osti.gov/servlets/purl/1798795.

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@article{osti_1798795,

  title        = {py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis},

  author       = {Savitzky, Benjamin H. and Zeltmann, Steven E. and Hughes, Lauren A. and Brown, Hamish G. and Zhao, Shiteng and Pelz, Philipp M. and Pekin, Thomas C. and Barnard, Edward S. and Donohue, Jennifer and DaCosta, Luis Rangel and Kennedy, Ellis and Xie, Yujun and Janish, Matthew T. and Schneider, Matthew M. and Herring, Patrick and Gopal, Chirranjeevi and Anapolsky, Abraham and Dhall, Rohan and Bustillo, Karen C. and Ercius, Peter and Scott, Mary C. and Ciston, Jim and Minor, Andrew M. and Ophus, Colin},

  abstractNote = {Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full two-dimensional (2D) image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, including signatures of the local structure, orientation, deformation, electromagnetic fields, and other sample-dependent properties. However, extracting this information requires complex analysis pipelines that include data wrangling, calibration, analysis, and visualization, all while maintaining robustness against imaging distortions and artifacts. In this paper, we present py4DSTEM, an analysis toolkit for measuring material properties from 4D-STEM datasets, written in the Python language and released with an open-source license. We describe the algorithmic steps for dataset calibration and various 4D-STEM property measurements in detail and present results from several experimental datasets. We also implement a simple and universal file format appropriate for electron microscopy data in py4DSTEM, which uses the open-source HDF5 standard. We hope this tool will benefit the research community and help improve the standards for data and computational methods in electron microscopy, and we invite the community to contribute to this ongoing project.},

  doi          = {10.1017/s1431927621000477},

  journal      = {Microscopy and Microanalysis},

  number       = 4,

  volume       = 27,

  place        = {United States},

  year         = {Fri May 21 00:00:00 EDT 2021},

  month        = {Fri May 21 00:00:00 EDT 2021}

}

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Works referenced in this record:

Correcting nonlinear drift distortion of scanning probe and scanning transmission electron microscopies from image pairs with orthogonal scan directions
journal, March 2016

Ophus, Colin; Ciston, Jim; Nelson, Chris T.
Ultramicroscopy, Vol. 162
DOI: 10.1016/j.ultramic.2015.12.002

Simulating high-angle annular dark-field stem images including inelastic thermal diffuse scattering
journal, December 1989

Wang, Z. L.; Cowley, J. M.
Ultramicroscopy, Vol. 31, Issue 4
DOI: 10.1016/0304-3991(89)90340-9

Revolving scanning transmission electron microscopy: Correcting sample drift distortion without prior knowledge
journal, March 2014

Sang, Xiahan; LeBeau, James M.
Ultramicroscopy, Vol. 138
DOI: 10.1016/j.ultramic.2013.12.004

Atomic-scale quantification of charge densities in two-dimensional materials
journal, September 2018

Müller-Caspary, Knut; Duchamp, Martial; Rösner, Malte
Physical Review B, Vol. 98, Issue 12
DOI: 10.1103/PhysRevB.98.121408

Image registration of low signal-to-noise cryo-STEM data
journal, August 2018

Savitzky, Benjamin H.; El Baggari, Ismail; Clement, Colin B.
Ultramicroscopy, Vol. 191
DOI: 10.1016/j.ultramic.2018.04.008

USID and Pycroscopy – Open Source Frameworks for Storing and Analyzing Imaging and Spectroscopy Data
journal, August 2019

Somnath, Suhas; Smith, Chris R.; Laanait, Nouamane
Microscopy and Microanalysis, Vol. 25, Issue S2
DOI: 10.1017/S1431927619001831

Local, atomic-level elastic strain measurements of metallic glass thin films by electron diffraction
journal, June 2016

Ebner, C.; Sarkar, R.; Rajagopalan, J.
Ultramicroscopy, Vol. 165
DOI: 10.1016/j.ultramic.2016.04.004

A high-speed area detector for novel imaging techniques in a scanning transmission electron microscope
journal, March 2009

Caswell, T. A.; Ercius, P.; Tate, M. W.
Ultramicroscopy, Vol. 109, Issue 4
DOI: 10.1016/j.ultramic.2008.11.023

Efficient subpixel image registration algorithms
journal, January 2008

Guizar-Sicairos, Manuel; Thurman, Samuel T.; Fienup, James R.
Optics Letters, Vol. 33, Issue 2
DOI: 10.1364/OL.33.000156

Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images
journal, July 2018

Fatermans, J.; den Dekker, A. J.; Müller-Caspary, K.
Physical Review Letters, Vol. 121, Issue 5
DOI: 10.1103/PhysRevLett.121.056101

Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector
journal, March 2019

Song, Jiamei; Allen, Christopher S.; Gao, Si
Scientific Reports, Vol. 9, Issue 1
DOI: 10.1038/s41598-019-40413-z

Polycrystal orientation maps from TEM
journal, August 2003

Fundenberger, J. -J.; Morawiec, A.; Bouzy, E.
Ultramicroscopy, Vol. 96, Issue 2
DOI: 10.1016/S0304-3991(02)00435-7

Evaluation of two-dimensional strain distribution by STEM/NBD
journal, July 2011

Uesugi, Fumihiko; Hokazono, Akira; Takeno, Shiro
Ultramicroscopy, Vol. 111, Issue 8
DOI: 10.1016/j.ultramic.2011.01.035

Variable Coherence Microscopy: a Rich Source of Structural Information from Disordered Materials
journal, March 1996

Treacy, M. M. J.; Gibson, J. M.
Acta Crystallographica Section A Foundations of Crystallography, Vol. 52, Issue 2
DOI: 10.1107/S0108767395012876

Dynamische Theorie der Kristallstrukturanalyse durch Elektronenbeugung im inhomogenen Primärstrahlwellenfeld
journal, November 1970

Hegerl, R.; Hoppe, W.
Berichte der Bunsengesellschaft für physikalische Chemie, Vol. 74, Issue 11
DOI: 10.1002/bbpc.19700741112

Development of Diffraction Imaging for Orientation Analysis of Grains in Scanning Transmission Electron Microscopy
journal, August 2007

Watanabe, M.; Williams, D.
Microscopy and Microanalysis, Vol. 13, Issue S02
DOI: 10.1017/S1431927607075204

Linear-scaling algorithm for rapid computation of inelastic transitions in the presence of multiple electron scattering
journal, December 2019

Brown, Hamish G.; Ciston, Jim; Ophus, Colin
Physical Review Research, Vol. 1, Issue 3
DOI: 10.1103/PhysRevResearch.1.033186

Practical aspects of diffractive imaging using an atomic-scale coherent electron probe
journal, October 2016

Chen, Z.; Weyland, M.; Ercius, P.
Ultramicroscopy, Vol. 169
DOI: 10.1016/j.ultramic.2016.06.009

Underneath the Bragg Peaks
journal, June 2003

Egami, T.; Billinge, S. J. L.
Materials Today, Vol. 6, Issue 6
DOI: 10.1016/S1369-7021(03)00635-7

Patterned probes for high precision 4D-STEM bragg measurements
journal, February 2020

Zeltmann, Steven E.; Müller, Alexander; Bustillo, Karen C.
Ultramicroscopy, Vol. 209
DOI: 10.1016/j.ultramic.2019.112890

A streaming multi-GPU implementation of image simulation algorithms for scanning transmission electron microscopy
journal, October 2017

Pryor, Alan; Ophus, Colin; Miao, Jianwei
Advanced Structural and Chemical Imaging, Vol. 3, Issue 1
DOI: 10.1186/s40679-017-0048-z

Computationally Mediated Experimental Science
journal, August 2003

Zaluzec, Nestor J.
Microscopy and Microanalysis, Vol. 9, Issue S02
DOI: 10.1017/S1431927603440427

Using STEM with quasi-parallel illumination and an automated peak-finding routine for strain analysis at the nanometre scale
conference, July 2009

Sourty, E.; Stanley, J.; Freitag, B.
2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
DOI: 10.1109/IPFA.2009.5232604

Vortex beam production and contrast enhancement from a magnetic spiral phase plate
journal, January 2014

Blackburn, A. M.; Loudon, J. C.
Ultramicroscopy, Vol. 136
DOI: 10.1016/j.ultramic.2013.08.009

Differential phase-contrast microscopy at atomic resolution
journal, June 2012

Shibata, Naoya; Findlay, Scott D.; Kohno, Yuji
Nature Physics, Vol. 8, Issue 8
DOI: 10.1038/nphys2337

Experimental tests on double-resolution coherent imaging via STEM
journal, March 1993

Rodenburg, J. M.; McCallum, B. C.; Nellist, P. D.
Ultramicroscopy, Vol. 48, Issue 3
DOI: 10.1016/0304-3991(93)90105-7

Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons
journal, December 2015

Close, R.; Chen, Z.; Shibata, N.
Ultramicroscopy, Vol. 159
DOI: 10.1016/j.ultramic.2015.09.002

Direct observation of Σ7 domain boundary core structure in magnetic skyrmion lattice
journal, February 2016

Matsumoto, Takao; So, Yeong-Gi; Kohno, Yuji
Science Advances, Vol. 2, Issue 2
DOI: 10.1126/sciadv.1501280

Design considerations and performance of an analytical stem
journal, January 1981

Craven, A. J.; Buggy, T. W.
Ultramicroscopy, Vol. 7, Issue 1
DOI: 10.1016/0304-3991(81)90020-6

Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction
journal, January 2010

Rauch, Edgar F.; Portillo, Joaquin; Nicolopoulos, Stavros
Zeitschrift für Kristallographie, Vol. 225, Issue 2-3
DOI: 10.1524/zkri.2010.1205

Electroplating lithium transition metal oxides
journal, May 2017

Zhang, Huigang; Ning, Hailong; Busbee, John
Science Advances, Vol. 3, Issue 5
DOI: 10.1126/sciadv.1602427

Linear phase imaging using differential interference contrast microscopy
journal, April 2004

Arnison, M. R.; Larkin, K. G.; Sheppard, C. J. R.
Journal of Microscopy, Vol. 214, Issue 1
DOI: 10.1111/j.0022-2720.2004.01293.x

The theory of super-resolution electron microscopy via Wigner-distribution deconvolution
journal, June 1992

Rodenburg, J. M.; Bates, R. H. T.
Philosophical Transactions of the Royal Society of London. Series A: Physical and Engineering Sciences, Vol. 339, Issue 1655, p. 521-553
DOI: 10.1098/rsta.1992.0050

Metal-organic framework crystal-glass composites
journal, June 2019

Hou, Jingwei; Ashling, Christopher W.; Collins, Sean M.
Nature Communications, Vol. 10, Issue 1
DOI: 10.1038/s41467-019-10470-z

(Invited) Nano-Beam Diffraction: Crystal Structure and Strain Analysis at the Nanoscale
journal, October 2010

Favia, Paola; Popovici, Mihaela; Eneman, G.
ECS Transactions, Vol. 33, Issue 11
DOI: 10.1149/1.3485694

Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectors
journal, November 2017

Brown, H. G.; Shibata, N.; Sasaki, H.
Ultramicroscopy, Vol. 182
DOI: 10.1016/j.ultramic.2017.07.002

Realistic models of paracrystalline silicon
journal, May 2001

Nakhmanson, S. M.; Voyles, P. M.; Mousseau, Normand
Physical Review B, Vol. 63, Issue 23, Article No. 235207
DOI: 10.1103/PhysRevB.63.235207

Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction
journal, January 2019

Mahr, Christoph; Müller-Caspary, Knut; Ritz, Robert
Ultramicroscopy, Vol. 196
DOI: 10.1016/j.ultramic.2018.09.010

Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping
journal, May 2017

Pekin, Thomas C.; Gammer, Christoph; Ciston, Jim
Ultramicroscopy, Vol. 176
DOI: 10.1016/j.ultramic.2016.12.021

Phase contrast STEM for thin samples: Integrated differential phase contrast
journal, January 2016

Lazić, Ivan; Bosch, Eric G. T.; Lazar, Sorin
Ultramicroscopy, Vol. 160
DOI: 10.1016/j.ultramic.2015.10.011

Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry
journal, February 2016

Ophus, Colin; Ciston, Jim; Pierce, Jordan
Nature Communications, Vol. 7, Issue 1
DOI: 10.1038/ncomms10719

Radial distribution function and structural relaxation in amorphous solids
journal, December 1981

Srolovitz, D.; Egami, T.; Vitek, V.
Physical Review B, Vol. 24, Issue 12
DOI: 10.1103/PhysRevB.24.6936

A fast image simulation algorithm for scanning transmission electron microscopy
journal, May 2017

Ophus, Colin
Advanced Structural and Chemical Imaging, Vol. 3, Issue 1
DOI: 10.1186/s40679-017-0046-1

Nanoscale mosaicity revealed in peptide microcrystals by scanning electron nanodiffraction
journal, January 2019

Gallagher-Jones, Marcus; Ophus, Colin; Bustillo, Karen C.
Communications Biology, Vol. 2, Issue 1
DOI: 10.1038/s42003-018-0263-8

Combination of in situ straining and ACOM TEM: A novel method for analysis of plastic deformation of nanocrystalline metals
journal, May 2013

Kobler, A.; Kashiwar, A.; Hahn, H.
Ultramicroscopy, Vol. 128, p. 68-81
DOI: 10.1016/j.ultramic.2012.12.019

Fluctuation microscopy in the STEM
journal, November 2002

Voyles, P. M.; Muller, D. A.
Ultramicroscopy, Vol. 93, Issue 2
DOI: 10.1016/S0304-3991(02)00155-9

Electron Vortex Beams with High Quanta of Orbital Angular Momentum
journal, January 2011

McMorran, B. J.; Agrawal, A.; Anderson, I. M.
Science, Vol. 331, Issue 6014, p. 192-195
DOI: 10.1126/science.1198804

Accurate evaluation of size and refractive index for spherical objects in quantitative phase imaging
journal, January 2018

Müller, Paul; Schürmann, Mirjam; Girardo, Salvatore
Optics Express, Vol. 26, Issue 8
DOI: 10.1364/OE.26.010729

Confirmation of the Domino-Cascade Model by LiFePO ₄ /FePO ₄ Precession Electron Diffraction
journal, October 2011

Brunetti, G.; Robert, D.; Bayle-Guillemaud, P.
Chemistry of Materials, Vol. 23, Issue 20
DOI: 10.1021/cm201783z

Improved precision in strain measurement using nanobeam electron diffraction
journal, September 2009

Béché, A.; Rouvière, J. L.; Clément, L.
Applied Physics Letters, Vol. 95, Issue 12
DOI: 10.1063/1.3224886

Direct Imaging of Nanoscale Phase Separation in ${La}_{0.55} {Ca}_{0.45} {MnO}_{3}$ : Relationship to Colossal Magnetoresistance
journal, August 2009

Tao, J.; Niebieskikwiat, D.; Varela, M.
Physical Review Letters, Vol. 103, Issue 9
DOI: 10.1103/PhysRevLett.103.097202

Quantitative analysis of the accuracy and sensitivity of strain measurements from nanobeam electron diffraction
conference, June 2015

Williamson, M. J.; van Dooren, P.; Flanagan, J.
2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
DOI: 10.1109/IPFA.2015.7224366

Hyperspectral Imaging in TEM: New Ways of Information Extraction and Display
journal, August 2008

Schaffer, B.; Gspan, C.; Grogger, W.
Microscopy and Microanalysis, Vol. 14, Issue S2
DOI: 10.1017/S1431927608081348

Pixelated detectors and improved efficiency for magnetic imaging in STEM differential phase contrast
journal, June 2016

Krajnak, Matus; McGrouther, Damien; Maneuski, Dzmitry
Ultramicroscopy, Vol. 165
DOI: 10.1016/j.ultramic.2016.03.006

Beugung im inhomogenen Primärstrahlwellenfeld. III. Amplituden- und Phasenbestimmung bei unperiodischen Objekten
journal, July 1969

Hoppe, W.
Acta Crystallographica Section A, Vol. 25, Issue 4
DOI: 10.1107/S0567739469001069

Scanning transmission electron microscopy of thin specimens
journal, January 1976

Cowley, J. M.
Ultramicroscopy, Vol. 2
DOI: 10.1016/S0304-3991(76)90161-3

Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence
journal, July 2018

Grieb, Tim; Krause, Florian F.; Schowalter, Marco
Ultramicroscopy, Vol. 190
DOI: 10.1016/j.ultramic.2018.03.013

Demonstration of a 2 × 2 programmable phase plate for electrons
journal, July 2018

Verbeeck, Jo; Béché, Armand; Müller-Caspary, Knut
Ultramicroscopy, Vol. 190
DOI: 10.1016/j.ultramic.2018.03.017

Influence of electron dose rate on electron counting images recorded with the K2 camera
journal, November 2013

Li, Xueming; Zheng, Shawn Q.; Egami, Kiyoshi
Journal of Structural Biology, Vol. 184, Issue 2
DOI: 10.1016/j.jsb.2013.08.005

High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy
journal, January 2016

Tate, Mark W.; Purohit, Prafull; Chamberlain, Darol
Microscopy and Microanalysis, Vol. 22, Issue 1
DOI: 10.1017/S1431927615015664

Correcting the linear and nonlinear distortions for atomically resolved STEM spectrum and diffraction imaging
journal, January 2018

Wang, Yi; Suyolcu, Y. Eren; Salzberger, Ute
Microscopy, Vol. 67, Issue suppl_1
DOI: 10.1093/jmicro/dfy002

The 4D Camera – An 87 kHz Frame-rate Detector for Counted 4D-STEM Experiments
journal, July 2020

Ercius, Peter; Johnson, Ian; Brown, Hamish
Microscopy and Microanalysis, Vol. 26, Issue S2
DOI: 10.1017/S1431927620019753

Topology of covalent non-crystalline solids I: Short-range order in chalcogenide alloys
journal, October 1979

Phillips, J. C.
Journal of Non-Crystalline Solids, Vol. 34, Issue 2
DOI: 10.1016/0022-3093(79)90033-4

Strain relaxation of strained-Si layers on SiGe-on-insulator (SGOI) structures after mesa isolation
journal, March 2004

Usuda, Koji; Mizuno, Tomohisa; Tezuka, Tsutomu
Applied Surface Science, Vol. 224, Issue 1-4
DOI: 10.1016/j.apsusc.2003.11.058

The scattering of electrons by atoms and crystals. I. A new theoretical approach
journal, October 1957

Cowley, J. M.; Moodie, A. F.
Acta Crystallographica, Vol. 10, Issue 10, p. 609-619
DOI: 10.1107/S0365110X57002194

Radial distribution function imaging by STEM diffraction: Phase mapping and analysis of heterogeneous nanostructured glasses
journal, September 2016

Mu, Xiaoke; Wang, Di; Feng, Tao
Ultramicroscopy, Vol. 168
DOI: 10.1016/j.ultramic.2016.05.009

Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
journal, May 2019

Ophus, Colin
Microscopy and Microanalysis, Vol. 25, Issue 3
DOI: 10.1017/S1431927619000497

Size analysis of nanoscale order in amorphous materials by variable-resolution fluctuation electron microscopy
journal, September 2010

Bogle, Stephanie N.; Nittala, Lakshmi N.; Twesten, Ray D.
Ultramicroscopy, Vol. 110, Issue 10
DOI: 10.1016/j.ultramic.2010.05.001

Automated Crystal Orientation Mapping (ACOM) with a Computer-Controlled TEM by Interpreting Transmission Kikuchi Patterns
journal, February 1998

Schwarzer, Robert A.; Sukkau, J.
Materials Science Forum, Vol. 273-275
DOI: 10.4028/www.scientific.net/MSF.273-275.215

RDFTools: A software tool for quantifying short-range ordering in amorphous materials
journal, July 2011

Mitchell, D. R. G.; Petersen, T. C.
Microscopy Research and Technique, Vol. 75, Issue 2
DOI: 10.1002/jemt.21038

High Resolution Radial Distribution Function of Pure Amorphous Silicon
journal, April 1999

Laaziri, Khalid; Kycia, S.; Roorda, S.
Physical Review Letters, Vol. 82, Issue 17
DOI: 10.1103/PhysRevLett.82.3460

Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping
journal, June 2019

Guzzinati, Giulio; Ghielens, Wannes; Mahr, Christoph
Applied Physics Letters, Vol. 114, Issue 24
DOI: 10.1063/1.5096245

Local nanoscale strain mapping of a metallic glass during in situ testing
journal, April 2018

Gammer, Christoph; Ophus, Colin; Pekin, Thomas C.
Applied Physics Letters, Vol. 112, Issue 17
DOI: 10.1063/1.5025686

Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope
journal, August 2018

Hachtel, Jordan A.; Idrobo, Juan Carlos; Chi, Miaofang
Advanced Structural and Chemical Imaging, Vol. 4, Issue 1
DOI: 10.1186/s40679-018-0059-4

Strain characterization in SOI and strained-Si on SGOI MOSFET channel using nano-beam electron diffraction (NBD)
journal, December 2005

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Advanced Computing in Electron Microscopy
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Kirkland, Earl J.
DOI: 10.1007/978-1-4419-6533-2

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Yang, H.; Rutte, R. N.; Jones, L.
Nature Communications, Vol. 7, Issue 1
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The quickhull algorithm for convex hulls
journal, December 1996

Barber, C. Bradford; Dobkin, David P.; Huhdanpaa, Hannu
ACM Transactions on Mathematical Software, Vol. 22, Issue 4
DOI: 10.1145/235815.235821

Beugung im inhomogenen Primärstrahlwellenfeld. I. Prinzip einer Phasenmessung von Elektronenbeungungsinterferenzen
journal, July 1969

Hoppe, W.
Acta Crystallographica Section A, Vol. 25, Issue 4
DOI: 10.1107/S0567739469001045

Averaging of low exposure electron micrographs of non-periodic objects
journal, January 1975

Frank, Joachim
Ultramicroscopy, Vol. 1, Issue 2
DOI: 10.1016/S0304-3991(75)80020-9

Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose
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DOI: 10.1016/j.ultramic.2018.12.018

Fast computation of Lyot-style coronagraph propagation
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Soummer, R.; Pueyo, L.; Sivaramakrishnan, A.
Optics Express, Vol. 15, Issue 24
DOI: 10.1364/OE.15.015935

LiberTEM/LiberTEM: 0.4.1
software, February 2020

Clausen, Alexander; Weber, Dieter; Ruzaeva, Karina
Zenodo
DOI: 10.5281/zenodo.3674003

Simulated calibration dataset for 4D scanning transmission electron microscopy
dataset, January 2019

Ophus, Colin; Savitzky, Benjamin
Zenodo
DOI: 10.5281/zenodo.3592520

Optimization of NBED simulations for disc-detection measurements
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Grieb, Tim; Krause, Florian F.; Mahr, Christoph
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DOI: 10.1016/j.ultramic.2017.04.015

Generation of electron vortex beams using line charges via the electrostatic Aharonov-Bohm effect
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Pozzi, Giulio; Lu, Peng-Han; Tavabi, Amir H.
Ultramicroscopy, Vol. 181
DOI: 10.1016/j.ultramic.2017.06.001

The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision
journal, July 2020

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Liu, J. P.; Li, K.; Pandey, S. M.
Applied Physics Letters, Vol. 93, Issue 22
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Beugung in inhomogenen Primärstrahlenwellenfeld. II. Lichtoptische Analogieversuche zur Phasenmessung von Gitterinterferenzen
journal, July 1969

Hoppe, W.; Strube, G.
Acta Crystallographica Section A, Vol. 25, Issue 4
DOI: 10.1107/S0567739469001057

Diffraction contrast imaging using virtual apertures
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Gammer, Christoph; Burak Ozdol, V.; Liebscher, Christian H.
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DOI: 10.1016/j.ultramic.2015.03.015

Enhanced phase contrast transfer using ptychography combined with a pre-specimen phase plate in a scanning transmission electron microscope
journal, December 2016

Yang, Hao; Ercius, Peter; Nellist, Peter D.
Ultramicroscopy, Vol. 171
DOI: 10.1016/j.ultramic.2016.09.002

The direct determination of magnetic domain wall profiles by differential phase contrast electron microscopy
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Chapman, J. N.; Batson, P. E.; Waddell, E. M.
Ultramicroscopy, Vol. 3
DOI: 10.1016/S0304-3991(78)80027-8

Simulated calibration dataset for 4D scanning transmission electron microscopy
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Ophus, Colin; Savitzky, Benjamin
Zenodo
DOI: 10.5281/zenodo.3592519

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Abstract

Citation Formats

Correcting nonlinear drift distortion of scanning probe and scanning transmission electron microscopies from image pairs with orthogonal scan directions journal, March 2016

Simulating high-angle annular dark-field stem images including inelastic thermal diffuse scattering journal, December 1989

Revolving scanning transmission electron microscopy: Correcting sample drift distortion without prior knowledge journal, March 2014

Atomic-scale quantification of charge densities in two-dimensional materials journal, September 2018

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Patterned probes for high precision 4D-STEM bragg measurements journal, February 2020

A streaming multi-GPU implementation of image simulation algorithms for scanning transmission electron microscopy journal, October 2017

Computationally Mediated Experimental Science journal, August 2003

Using STEM with quasi-parallel illumination and an automated peak-finding routine for strain analysis at the nanometre scale conference, July 2009

Vortex beam production and contrast enhancement from a magnetic spiral phase plate journal, January 2014

Differential phase-contrast microscopy at atomic resolution journal, June 2012

Experimental tests on double-resolution coherent imaging via STEM journal, March 1993

Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons journal, December 2015

Direct observation of Σ7 domain boundary core structure in magnetic skyrmion lattice journal, February 2016

Design considerations and performance of an analytical stem journal, January 1981

Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction journal, January 2010

Electroplating lithium transition metal oxides journal, May 2017

Linear phase imaging using differential interference contrast microscopy journal, April 2004

The theory of super-resolution electron microscopy via Wigner-distribution deconvolution journal, June 1992

Metal-organic framework crystal-glass composites journal, June 2019

(Invited) Nano-Beam Diffraction: Crystal Structure and Strain Analysis at the Nanoscale journal, October 2010

Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectors journal, November 2017

Realistic models of paracrystalline silicon journal, May 2001

Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction journal, January 2019

Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping journal, May 2017

Phase contrast STEM for thin samples: Integrated differential phase contrast journal, January 2016

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A fast image simulation algorithm for scanning transmission electron microscopy journal, May 2017

Nanoscale mosaicity revealed in peptide microcrystals by scanning electron nanodiffraction journal, January 2019

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Fluctuation microscopy in the STEM journal, November 2002

Electron Vortex Beams with High Quanta of Orbital Angular Momentum journal, January 2011

Accurate evaluation of size and refractive index for spherical objects in quantitative phase imaging journal, January 2018

Confirmation of the Domino-Cascade Model by LiFePO 4 /FePO 4 Precession Electron Diffraction journal, October 2011

Improved precision in strain measurement using nanobeam electron diffraction journal, September 2009

Direct Imaging of Nanoscale Phase Separation in La 0.55 Ca 0.45 MnO 3 : Relationship to Colossal Magnetoresistance journal, August 2009

Quantitative analysis of the accuracy and sensitivity of strain measurements from nanobeam electron diffraction conference, June 2015

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Pixelated detectors and improved efficiency for magnetic imaging in STEM differential phase contrast journal, June 2016

Beugung im inhomogenen Primärstrahlwellenfeld. III. Amplituden- und Phasenbestimmung bei unperiodischen Objekten journal, July 1969

Scanning transmission electron microscopy of thin specimens journal, January 1976

Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence journal, July 2018

Demonstration of a 2 × 2 programmable phase plate for electrons journal, July 2018

Influence of electron dose rate on electron counting images recorded with the K2 camera journal, November 2013

High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy journal, January 2016

Correcting the linear and nonlinear distortions for atomically resolved STEM spectrum and diffraction imaging journal, January 2018

The 4D Camera – An 87 kHz Frame-rate Detector for Counted 4D-STEM Experiments journal, July 2020

Topology of covalent non-crystalline solids I: Short-range order in chalcogenide alloys journal, October 1979

Strain relaxation of strained-Si layers on SiGe-on-insulator (SGOI) structures after mesa isolation journal, March 2004

The scattering of electrons by atoms and crystals. I. A new theoretical approach journal, October 1957

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Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond journal, May 2019

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RDFTools: A software tool for quantifying short-range ordering in amorphous materials journal, July 2011

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Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope journal, August 2018

Strain characterization in SOI and strained-Si on SGOI MOSFET channel using nano-beam electron diffraction (NBD) journal, December 2005

Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy journal, June 2015

Quantitative Measurements of Magnetic Vortices using Position Resolved Diffraction in Lorentz Stem journal, August 2002

Correcting nonlinear drift distortion of scanning probe and scanning transmission electron microscopies from image pairs with orthogonal scan directions
journal, March 2016

Simulating high-angle annular dark-field stem images including inelastic thermal diffuse scattering
journal, December 1989

Revolving scanning transmission electron microscopy: Correcting sample drift distortion without prior knowledge
journal, March 2014

Atomic-scale quantification of charge densities in two-dimensional materials
journal, September 2018

Image registration of low signal-to-noise cryo-STEM data
journal, August 2018

USID and Pycroscopy – Open Source Frameworks for Storing and Analyzing Imaging and Spectroscopy Data
journal, August 2019

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journal, June 2016

A high-speed area detector for novel imaging techniques in a scanning transmission electron microscope
journal, March 2009

Efficient subpixel image registration algorithms
journal, January 2008

Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images
journal, July 2018

Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector
journal, March 2019

Polycrystal orientation maps from TEM
journal, August 2003

Evaluation of two-dimensional strain distribution by STEM/NBD
journal, July 2011

Variable Coherence Microscopy: a Rich Source of Structural Information from Disordered Materials
journal, March 1996

Dynamische Theorie der Kristallstrukturanalyse durch Elektronenbeugung im inhomogenen Primärstrahlwellenfeld
journal, November 1970

Development of Diffraction Imaging for Orientation Analysis of Grains in Scanning Transmission Electron Microscopy
journal, August 2007

Linear-scaling algorithm for rapid computation of inelastic transitions in the presence of multiple electron scattering
journal, December 2019

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journal, October 2016

Underneath the Bragg Peaks
journal, June 2003

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journal, February 2020

A streaming multi-GPU implementation of image simulation algorithms for scanning transmission electron microscopy
journal, October 2017

Computationally Mediated Experimental Science
journal, August 2003

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conference, July 2009

Vortex beam production and contrast enhancement from a magnetic spiral phase plate
journal, January 2014

Differential phase-contrast microscopy at atomic resolution
journal, June 2012

Experimental tests on double-resolution coherent imaging via STEM
journal, March 1993

Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons
journal, December 2015

Direct observation of Σ7 domain boundary core structure in magnetic skyrmion lattice
journal, February 2016

Design considerations and performance of an analytical stem
journal, January 1981

Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction
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journal, May 2017

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journal, June 2019

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journal, October 2010

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journal, November 2017

Realistic models of paracrystalline silicon
journal, May 2001

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journal, January 2019

Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping
journal, May 2017

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journal, January 2016

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journal, February 2016

Radial distribution function and structural relaxation in amorphous solids
journal, December 1981

A fast image simulation algorithm for scanning transmission electron microscopy
journal, May 2017

Nanoscale mosaicity revealed in peptide microcrystals by scanning electron nanodiffraction
journal, January 2019

Combination of in situ straining and ACOM TEM: A novel method for analysis of plastic deformation of nanocrystalline metals
journal, May 2013

Fluctuation microscopy in the STEM
journal, November 2002

Electron Vortex Beams with High Quanta of Orbital Angular Momentum
journal, January 2011

Accurate evaluation of size and refractive index for spherical objects in quantitative phase imaging
journal, January 2018

Confirmation of the Domino-Cascade Model by LiFePO ₄ /FePO ₄ Precession Electron Diffraction
journal, October 2011

Improved precision in strain measurement using nanobeam electron diffraction
journal, September 2009

Direct Imaging of Nanoscale Phase Separation in ${La}_{0.55} {Ca}_{0.45} {MnO}_{3}$ : Relationship to Colossal Magnetoresistance
journal, August 2009

Quantitative analysis of the accuracy and sensitivity of strain measurements from nanobeam electron diffraction
conference, June 2015

Hyperspectral Imaging in TEM: New Ways of Information Extraction and Display
journal, August 2008

Pixelated detectors and improved efficiency for magnetic imaging in STEM differential phase contrast
journal, June 2016

Beugung im inhomogenen Primärstrahlwellenfeld. III. Amplituden- und Phasenbestimmung bei unperiodischen Objekten
journal, July 1969

Scanning transmission electron microscopy of thin specimens
journal, January 1976

Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence
journal, July 2018

Demonstration of a 2 × 2 programmable phase plate for electrons
journal, July 2018

Influence of electron dose rate on electron counting images recorded with the K2 camera
journal, November 2013

High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy
journal, January 2016

Correcting the linear and nonlinear distortions for atomically resolved STEM spectrum and diffraction imaging
journal, January 2018

The 4D Camera – An 87 kHz Frame-rate Detector for Counted 4D-STEM Experiments
journal, July 2020

Topology of covalent non-crystalline solids I: Short-range order in chalcogenide alloys
journal, October 1979

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journal, March 2004

The scattering of electrons by atoms and crystals. I. A new theoretical approach
journal, October 1957

Radial distribution function imaging by STEM diffraction: Phase mapping and analysis of heterogeneous nanostructured glasses
journal, September 2016

Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
journal, May 2019

Size analysis of nanoscale order in amorphous materials by variable-resolution fluctuation electron microscopy
journal, September 2010

Automated Crystal Orientation Mapping (ACOM) with a Computer-Controlled TEM by Interpreting Transmission Kikuchi Patterns
journal, February 1998

RDFTools: A software tool for quantifying short-range ordering in amorphous materials
journal, July 2011

High Resolution Radial Distribution Function of Pure Amorphous Silicon
journal, April 1999

Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping
journal, June 2019

Local nanoscale strain mapping of a metallic glass during in situ testing
journal, April 2018

Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope
journal, August 2018

Strain characterization in SOI and strained-Si on SGOI MOSFET channel using nano-beam electron diffraction (NBD)
journal, December 2005

Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy
journal, June 2015

Quantitative Measurements of Magnetic Vortices using Position Resolved Diffraction in Lorentz Stem
journal, August 2002

Advanced Computing in Electron Microscopy
book, January 2010

Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures
journal, August 2016

The quickhull algorithm for convex hulls
journal, December 1996