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Title: Wave optics simulations for new soft x-ray beamlines at NSLS-II

Abstract

In this work, we performed fully- and partially-coherent synchrotron emission and propagation simulations with the "Synchrotron Radiation Workshop" computer code to analyze the performance of two soft X-ray beamlines under development at the National Synchrotron Light Source II: Soft X-ray Nanoprobe (SXN), and Angle-Resolved Photoemission Spectroscopy (ARPES) and Resonant Inelastic X-ray Scattering (RIXS) Imaging (ARI). The SXN beamline intends to provide high flux and high spatial resolution coherent soft X-ray imaging capabilities using both zone plate and lensless coherent imaging techniques. The ARI beamline aims to perform high flux ARPES and RIXS experiments with a focal spot size at the sample approaching 100 nm using highly-demagnifying mirrors in Kirkpatrick-Baez geometry. To accurately calculate the resolution and the degree of X-ray coherence provided by the two state-of-the-art beamlines, partial coherence effects are required to be taken into account in wave optics simulations for these two beamlines. In this talk, beamline performance parameters such as spot size, degree of coherence, flux, and energy resolution at the sample are presented. The effects of mirror surface slope errors on beamline performance were studied and some suggestions for further optimization are discussed.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [2]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
  2. Univ. of Puerto Rico, Mayaguez, PR (United States)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1788063
Report Number(s):
BNL-221648-2021-JAAM
Journal ID: 1996-756X
Grant/Contract Number:  
SC0012704; AC02-05CH11231
Resource Type:
Accepted Manuscript
Journal Name:
SPIE Seminar Proceedings (Online)
Additional Journal Information:
Journal Name: SPIE Seminar Proceedings (Online); Journal Issue: 11493; Conference: SPIE Optical Engineering + Applications, San Diego (Held Virtually), CA (United States), 24-28 Aug 2020
Publisher:
SPIE
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; wave optics simulation; partial coherence; SXN; ARPES; RIXS; ARI; SRW; Sirepo

Citation Formats

He, An, Chubar, Oleg, Dvorak, Joseph, Hu, Wen, Hulbert, Steven, Walter, Andrew, Wilkins, Stuart, and Salort, Coral. Wave optics simulations for new soft x-ray beamlines at NSLS-II. United States: N. p., 2020. Web. doi:10.1117/12.2567423.
He, An, Chubar, Oleg, Dvorak, Joseph, Hu, Wen, Hulbert, Steven, Walter, Andrew, Wilkins, Stuart, & Salort, Coral. Wave optics simulations for new soft x-ray beamlines at NSLS-II. United States. https://doi.org/10.1117/12.2567423
He, An, Chubar, Oleg, Dvorak, Joseph, Hu, Wen, Hulbert, Steven, Walter, Andrew, Wilkins, Stuart, and Salort, Coral. Fri . "Wave optics simulations for new soft x-ray beamlines at NSLS-II". United States. https://doi.org/10.1117/12.2567423. https://www.osti.gov/servlets/purl/1788063.
@article{osti_1788063,
title = {Wave optics simulations for new soft x-ray beamlines at NSLS-II},
author = {He, An and Chubar, Oleg and Dvorak, Joseph and Hu, Wen and Hulbert, Steven and Walter, Andrew and Wilkins, Stuart and Salort, Coral},
abstractNote = {In this work, we performed fully- and partially-coherent synchrotron emission and propagation simulations with the "Synchrotron Radiation Workshop" computer code to analyze the performance of two soft X-ray beamlines under development at the National Synchrotron Light Source II: Soft X-ray Nanoprobe (SXN), and Angle-Resolved Photoemission Spectroscopy (ARPES) and Resonant Inelastic X-ray Scattering (RIXS) Imaging (ARI). The SXN beamline intends to provide high flux and high spatial resolution coherent soft X-ray imaging capabilities using both zone plate and lensless coherent imaging techniques. The ARI beamline aims to perform high flux ARPES and RIXS experiments with a focal spot size at the sample approaching 100 nm using highly-demagnifying mirrors in Kirkpatrick-Baez geometry. To accurately calculate the resolution and the degree of X-ray coherence provided by the two state-of-the-art beamlines, partial coherence effects are required to be taken into account in wave optics simulations for these two beamlines. In this talk, beamline performance parameters such as spot size, degree of coherence, flux, and energy resolution at the sample are presented. The effects of mirror surface slope errors on beamline performance were studied and some suggestions for further optimization are discussed.},
doi = {10.1117/12.2567423},
journal = {SPIE Seminar Proceedings (Online)},
number = 11493,
volume = ,
place = {United States},
year = {Fri Aug 21 00:00:00 EDT 2020},
month = {Fri Aug 21 00:00:00 EDT 2020}
}