Wave optics simulations for new soft x-ray beamlines at NSLS-II

Journal Article · 21 August 2020 · SPIE Seminar Proceedings (Online)

DOI: https://doi.org/10.1117/12.2567423 · OSTI ID:1788063

He, An ^[1]; Chubar, Oleg ^[1]; Dvorak, Joseph ^[1]; Hu, Wen ^[1]; Hulbert, Steven ^[1]; Walter, Andrew ^[1]; Wilkins, Stuart ^[1]; Salort, Coral ^[2]

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1. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
2. Univ. of Puerto Rico, Mayaguez, PR (United States)

In this work, we performed fully- and partially-coherent synchrotron emission and propagation simulations with the "Synchrotron Radiation Workshop" computer code to analyze the performance of two soft X-ray beamlines under development at the National Synchrotron Light Source II: Soft X-ray Nanoprobe (SXN), and Angle-Resolved Photoemission Spectroscopy (ARPES) and Resonant Inelastic X-ray Scattering (RIXS) Imaging (ARI). The SXN beamline intends to provide high flux and high spatial resolution coherent soft X-ray imaging capabilities using both zone plate and lensless coherent imaging techniques. The ARI beamline aims to perform high flux ARPES and RIXS experiments with a focal spot size at the sample approaching 100 nm using highly-demagnifying mirrors in Kirkpatrick-Baez geometry. To accurately calculate the resolution and the degree of X-ray coherence provided by the two state-of-the-art beamlines, partial coherence effects are required to be taken into account in wave optics simulations for these two beamlines. In this talk, beamline performance parameters such as spot size, degree of coherence, flux, and energy resolution at the sample are presented. The effects of mirror surface slope errors on beamline performance were studied and some suggestions for further optimization are discussed.

• Research Organization: Brookhaven National Laboratory (BNL), Upton, NY (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES)
• Grant/Contract Number: SC0012704; AC02-05CH11231
• OSTI ID: 1788063
• Report Number(s): BNL-221648-2021-JAAM
• Journal Information: SPIE Seminar Proceedings (Online), Journal Issue: 11493; Conference: SPIE Optical Engineering + Applications, San Diego (Held Virtually), CA (United States), 24-28 Aug 2020
• Publisher: SPIECopyright Statement
• Country of Publication: United States
• Language: English