New precise half-life measurement for the superallowed β+ emitter Ar34

Iacob, V. E.; Hardy, J. C.; Park, H. I.; Bencomo, M.; Chen, L.; Horvat, V.; Nica, N.; Roeder, B. T.; Saastamoinen, A.

doi:10.1103/physrevc.101.015504

Title: New precise half-life measurement for the superallowed β+ emitter Ar34

Journal Article · 20 January 2020 · Physical Review C

DOI: https://doi.org/10.1103/physrevc.101.015504 · OSTI ID:1780902

Iacob, V. E. ^[1];

^[2]; Park, H. I. ^[2]; Bencomo, M. ^[2]; Chen, L. ^[2]; Horvat, V. ^[2]; Nica, N. ^[2]; Roeder, B. T. ^[2]; Saastamoinen, A. ^[2]

Texas A & M Univ., College Station, TX (United States). Cyclotron Institute; Cyclotron Institute, Texas A&M University, TX (United States)
Texas A & M Univ., College Station, TX (United States). Cyclotron Institute

We have measured the half-life of ³⁴Ar, the parent of a superallowed 0⁺ → 0⁺ β transition, to be 0.84646(35) s. With a precision of 0.04%, this result is an essential ingredient needed to complete a third pair of mirror superallowed transitions, ³⁴Ar → ³⁴Cl and ³⁴Cl → ³⁴S, the ratio of whose ft values would provide the most sensitive test yet of the isospin-symmetry-breaking corrections used to obtain V_ud . In a sequence repeated thousands of times, we implanted a very pure ³⁴Ar beam into tape for 0.7 s, and then rapidly transported the collected source to a shielded 4π proportional gas counter, which detected the decay positrons from the combined decays of ³⁴Ar and its daughter ³⁴Cl. The data were analyzed as a linked parent-daughter pair. Our new result replaces one we published 13 years ago.

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Research Organization:: Texas A & M Univ., College Station, TX (United States). Cyclotron Institute

Sponsoring Organization:: USDOE Office of Science (SC), Nuclear Physics (NP); Welch Foundation

Grant/Contract Number:: FG02-93ER40773

OSTI ID:: 1780902

Journal Information:: Physical Review C, Journal Name: Physical Review C Journal Issue: 1 Vol. 101; ISSN 2469-9985

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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