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Title: Quantitative Characterization of a Desalination Membrane Model System by X-ray Photoelectron Spectroscopy

Abstract

Aromatic polyamide films form the active layer in reverse osmosis desalination membranes. Despite widespread use of this technology, it suffers from low rejection rates for certain water contaminants and from membrane fouling. Through a better understanding of the fundamental surface chemical processes during reverse osmosis desalination, advances in membrane and material design are expected. The recent invention of a molecular layer-by-layer (mLbL) preparation technique yields films that are sufficiently smooth to warrant investigation with high-resolution microscopy and spectroscopy methods. In this study, we present high-resolution, quantitative X-ray photoelectron spectroscopy (XPS) data on the surface chemistry of ultrathin polyamide films that can serve as a model system for desalination membranes. We show that a quantitative analysis of the XPS spectra gives information about the functional groups of the film as well as other compounds present due to the synthesis under ambient conditions. Unpolymerized functional groups are identified and aid in understanding the degree of cross-linking. Investigation of polymers with synchrotron-based XPS requires taking beam-induced changes into account. We quantify X-ray beam damage and show that beam damage to the polyamide is limited, allowing long-term investigation of thin polyamide films. Characterizing mLbL-grown films via high-resolution XPS is the basis for a bettermore » understanding of the chemical interplay of polyamide surface functional groups with the major components of desalination systems.« less

Authors:
 [1];  [1]; ORCiD logo [1]; ORCiD logo [1];  [1]; ORCiD logo [1]
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  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Chemical Sciences, Geosciences & Biosciences Division
OSTI Identifier:
1770762
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Accepted Manuscript
Journal Name:
Langmuir
Additional Journal Information:
Journal Volume: 35; Journal Issue: 35; Journal ID: ISSN 0743-7463
Publisher:
American Chemical Society
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; thin films; amides; binding energy; monomers; x-ray photoelectron spectroscopy

Citation Formats

Buechner, Christin, Gericke, Sabrina M., Trotochaud, Lena, Karslıoǧlu, Osman, Raso, Joseph, and Bluhm, Hendrik. Quantitative Characterization of a Desalination Membrane Model System by X-ray Photoelectron Spectroscopy. United States: N. p., 2019. Web. doi:10.1021/acs.langmuir.9b01838.
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Buechner, Christin, Gericke, Sabrina M., Trotochaud, Lena, Karslıoǧlu, Osman, Raso, Joseph, & Bluhm, Hendrik. Quantitative Characterization of a Desalination Membrane Model System by X-ray Photoelectron Spectroscopy. United States. https://doi.org/10.1021/acs.langmuir.9b01838
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Buechner, Christin, Gericke, Sabrina M., Trotochaud, Lena, Karslıoǧlu, Osman, Raso, Joseph, and Bluhm, Hendrik. Fri . "Quantitative Characterization of a Desalination Membrane Model System by X-ray Photoelectron Spectroscopy". United States. https://doi.org/10.1021/acs.langmuir.9b01838. https://www.osti.gov/servlets/purl/1770762.
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@article{osti_1770762,
title = {Quantitative Characterization of a Desalination Membrane Model System by X-ray Photoelectron Spectroscopy},
author = {Buechner, Christin and Gericke, Sabrina M. and Trotochaud, Lena and Karslıoǧlu, Osman and Raso, Joseph and Bluhm, Hendrik},
abstractNote = {Aromatic polyamide films form the active layer in reverse osmosis desalination membranes. Despite widespread use of this technology, it suffers from low rejection rates for certain water contaminants and from membrane fouling. Through a better understanding of the fundamental surface chemical processes during reverse osmosis desalination, advances in membrane and material design are expected. The recent invention of a molecular layer-by-layer (mLbL) preparation technique yields films that are sufficiently smooth to warrant investigation with high-resolution microscopy and spectroscopy methods. In this study, we present high-resolution, quantitative X-ray photoelectron spectroscopy (XPS) data on the surface chemistry of ultrathin polyamide films that can serve as a model system for desalination membranes. We show that a quantitative analysis of the XPS spectra gives information about the functional groups of the film as well as other compounds present due to the synthesis under ambient conditions. Unpolymerized functional groups are identified and aid in understanding the degree of cross-linking. Investigation of polymers with synchrotron-based XPS requires taking beam-induced changes into account. We quantify X-ray beam damage and show that beam damage to the polyamide is limited, allowing long-term investigation of thin polyamide films. Characterizing mLbL-grown films via high-resolution XPS is the basis for a better understanding of the chemical interplay of polyamide surface functional groups with the major components of desalination systems.},
doi = {10.1021/acs.langmuir.9b01838},
journal = {Langmuir},
number = 35,
volume = 35,
place = {United States},
year = {2019},
month = {8}
}
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Publisher's Version of Record
https://doi.org/10.1021/acs.langmuir.9b01838
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