Search for neutral-current induced single photon production at the ND280 near detector in T2K

Journal Article · 19 June 2019 · Journal of Physics. G, Nuclear and Particle Physics

DOI: https://doi.org/10.1088/1361-6471/ab227d · OSTI ID:1762108

Abe, K. ^[1]; Akutsu, R.; Ali, A.; Andreopoulos, C.; Anthony, L.; Antonova, M.; Aoki, S.; Ariga, A.; Ashida, Y.; Awataguchi, Y.; Azuma, Y.; Ban, S.; Barbi, M.; Barker, G. J.; Barr, G.; Barry, C.; Batkiewicz-Kwasniak, M.; Bench, F.; Berardi, V.; Berkman, S. ; Berner, R. M.; Berns, L.; Bhadra, S.; Bienstock, S.; Blondel, A.; Bolognesi, S.; Bourguille, B.; Boyd, S. B.; Brailsford, D.; Bravar, A.; Bronner, C.; Avanzini, M. Buizza; Calcutt, J.; Campbell, T.; Cao, S.; Cartwright, S. L.; Catanesi, M. G.; Cervera, A.; Chappell, A.; Checchia, C.; Cherdack, D.; Chikuma, N.; Christodoulou, G.; Coleman, J.; Collazuol, G.; Coplowe, D.; Cudd, A.; Dabrowska, A.; Rosa, G. De; Dealtry, T.; Denner, P. F.; Dennis, S. R.; Densham, C.; Lodovico, F. Di; Dokania, N.; Dolan, S.; Drapier, O.; Duffy, K. E.; Dumarchez, J.; Dunne, P.; Emery-Schrenk, S.; Ereditato, A.; Fernandez, P.; Feusels, T.; Finch, A. J.; Fiorentini, G. A.; Fiorillo, G.; Francois, C.; Friend, M.; Fujii, Y.; Fujita, R.; Fukuda, D.; Fukuda, Y.; Gameil, K.; Giganti, C.; Gizzarelli, F.; Golan, T.; Gonin, M.; Hadley, D. R.; Haigh, J. T.; Hamacher-Baumann, P.; Hartz, M.; Hasegawa, T.; Hastings, N. C.; Hayashino, T.; Hayato, Y.; Hiramoto, A.; Hogan, M.; Holeczek, J.; Van, N. Hong; Hosomi, F.; Ichikawa, A. K.; Ikeda, M.; Inoue, T.; Intonti, R. A.; Ishida, T.; Ishii, T.; Ishitsuka, M.; Iwamoto, K.; Izmaylov, A.; Jamieson, B.; Jesus, C.; Jiang, M.; Johnson, S.; Jonsson, P.; Jung, C. K.; Kabirnezhad, M.; Kaboth, A. C.; Kajita, T.; Kakuno, H.; Kameda, J.; Karlen, D.; Katori, T. ; Kato, Y.; Kearns, E.; Khabibullin, M.; Khotjantsev, A.; Kim, H.; Kim, J.; King, S.; Kisiel, J.; Knight, A.; Knox, A.; Kobayashi, T.; Koch, L.; Koga, T.; Konaka, A.; Kormos, L. L.; Koshio, Y.; Kowalik, K.; Kubo, H.; Kudenko, Y.; Kurjata, R.; Kutter, T.; Kuze, M.; Labarga, L.; Lagoda, J.; Lamoureux, M.; Lasorak, P. ; Laveder, M.; Lawe, M.; Licciardi, M.; Lindner, T.; Litchfield, R. P.; Li, X.; Longhin, A.; Lopez, J. P.; Lou, T.; Ludovici, L.; Lu, X.; Lux, T.; Magaletti, L.; Mahn, K.; Malek, M.; Manly, S.; Maret, L.; Marino, A. D.; Martin, J. F.; Martins, P.; Maruyama, T.; Matsubara, T.; Matveev, V.; Mavrokoridis, K.; Ma, W. Y.; Mazzucato, E.; McCarthy, M.; McCauley, N.; McFarland, K. S.; McGrew, C.; Mefodiev, A.; Metelko, C.; Mezzetto, M.; Minamino, A.; Mineev, O.; Mine, S.; Miura, M.; Moriyama, S.; Morrison, J.; Mueller, Th A.; Murphy, S.; Nagai, Y.; Nakadaira, T.; Nakahata, M.; Nakajima, Y.; Nakamura, A.; Nakamura, K. G.; Nakamura, K.; Nakamura, K. D.; Nakanishi, Y.; Nakayama, S.; Nakaya, T.; Nakayoshi, K.; Nantais, C.; Niewczas, K.; Nishikawa, K.; Nishimura, Y.; Nonnenmacher, T. S.; Novella, P.; Nowak, J.; O’Keeffe, H. M.; O’Sullivan, L.; Okumura, K.; Okusawa, T.; Oser, S. M.; Owen, R. A.; Oyama, Y.; Palladino, V.; Palomino, J. L.; Paolone, V.; Parker, W. C.; Paudyal, P.; Pavin, M.; Payne, D.; Pickering, L.; Pidcott, C.; Guerra, E. Pinzon; Pistillo, C.; Popov, B.; Porwit, K.; Posiadala-Zezula, M.; Pritchard, A.; Quilain, B.; Radermacher, T.; Radicioni, E.; Ratoff, P. N.; Reinherz-Aronis, E.; Riccio, C.; Rondio, E.; Rossi, B.; Roth, S.; Rubbia, A.; Ruggeri, A. C.; Rychter, A.; Sakashita, K.; Sánchez, F.; Sasaki, S.; Scholberg, K.; Schwehr, J.; Scott, M.; Seiya, Y.; Sekiguchi, T.; Sekiya, H.; Sgalaberna, D.; Shah, R.; Shaikhiev, A.; Shaker, F.; Shaw, D.; Shaykina, A.; Shiozawa, M.; Smirnov, A.; Smy, M.; Sobczyk, J. T.; Sobel, H.; Sonoda, Y.; Steinmann, J.; Stewart, T.; Stowell, P.; Suvorov, S.; Suzuki, A.; Suzuki, S. Y.; Suzuki, Y.; Sztuc, A. A.; Tacik, R.; Tada, M.; Takeda, A.; Takeuchi, Y.; Tamura, R.; Tanaka, H. K.; Tanaka, H. A.; Thompson, L. F.; Toki, W.; Touramanis, C.; Tsui, K. M.; Tsukamoto, T.; Tzanov, M.; Uchida, Y.; Uno, W.; Vagins, M.; Vallari, Z.; Vargas, D.; Vasseur, G.; Vilela, C.; Vladisavljevic, T.; Volkov, V. V.; Wachala, T.; Walker, J.; Wang, Y.; Wark, D.; Wascko, M. O.; Weber, A.; Wendell, R.; Wilking, M. J.; Wilkinson, C.; Wilson, J. R.; Wilson, R. J.; Wret, C.; Yamada, Y.; Yamamoto, K.; Yamasu, S.; Yanagisawa, C.; Yang, G.; Yano, T.; Yasutome, K.; Yen, S.; Yershov, N.; Yokoyama, M.; Yoshida, T.; Yu, M.; Zalewska, A.; Zalipska, J.; Zaremba, K.; Zarnecki, G.; Ziembicki, M.; Zimmerman, E. D.; Zito, M.; Zsoldos, S.; Zykova, A.

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1. University of Colorado

Neutrino neutral-current (NC) induced single photon production is a sub-leading order process for accelerator-based neutrino beam experiments including T2K. It is, however, an important process to understand because it is a background for electron (anti)neutrino appearance oscillation experiments. Here, we performed the first search of this process below 1 GeV using the fine-grained detector at the T2K ND280 off-axis near detector. By reconstructing single photon kinematics from electron–positron pairs, we achieved 95% pure gamma ray sample from protons-on-targets neutrino mode data. We do not find positive evidence of NC induced single photon production in this sample. We set the model-dependent upper limit on the cross-section for this process, at 0.114 x 10^–38 cm² (90% C.L.) per nucleon, using the J-PARC off-axis neutrino beam with an average energy of E_v ~ 0.6 GeV. This is the first limit on this process below 1 GeV which is important for current and future oscillation experiments looking for electron neutrino appearance oscillation signals.

• Research Organization: Univ. of Colorado, Boulder, CO (United States)
• Sponsoring Organization: USDOE Office of Science (SC), High Energy Physics (HEP)
• Contributing Organization: The T2K Collaboration
• Grant/Contract Number: SC0010005
• OSTI ID: 1762108
• Alternate ID(s): OSTI ID: 22899644
• Journal Information: Journal of Physics. G, Nuclear and Particle Physics, Journal Name: Journal of Physics. G, Nuclear and Particle Physics Journal Issue: 8 Vol. 46; ISSN 0954-3899
• Publisher: IOP PublishingCopyright Statement
• Country of Publication: United States
• Language: English