Correlation between structural phase transition and surface chemical properties of thin film SrRuO3/SrTiO3 (001)

Kim, Dongwoo; Lim, Hojoon; Ha, Sung Soo; Seo, Okkyun; Lee, Sung Su; Kim, Jinwoo; Kim, Ki-jeong; Perez Ramirez, Lucia; Gallet, Jean-Jacques; Bournel, Fabrice; Jo, Ji Young; Nemsak, Slavomir; Noh, Do Young; Mun, Bongjin Simon

doi:10.1063/1.5134653

Title: Correlation between structural phase transition and surface chemical properties of thin film SrRuO₃/SrTiO₃ (001)

Journal Article · 15 January 2020 · Journal of Chemical Physics

DOI: https://doi.org/10.1063/1.5134653 · OSTI ID:1760195

Kim, Dongwoo ^[1]; Lim, Hojoon ^[1];

^[1]; Seo, Okkyun ^[2]; Lee, Sung Su ^[1]; Kim, Jinwoo ^[3]; Kim, Ki-jeong ^[3]; Perez Ramirez, Lucia ^[4]; Gallet, Jean-Jacques ^[5]; Bournel, Fabrice ^[5]; Jo, Ji Young ^[1]; Nemsak, Slavomir ^[6]; Noh, Do Young ^[1];

^[1]

Gwangju Inst. of Science and Technology (South Korea)
National Inst. for Materials Science (NIMS), Kouto (Japan). Synchrotron X-ray Station at Spring-8
Pohang Univ. of Science and Technology (POSTECH) (Korea, Republic of)
Sorbonne Univ., Paris Cedex (France). Lab. de Chimie Physique Matiere et Rayonnement, CNRS
Sorbonne Univ., Paris Cedex (France). Lab. de Chimie Physique Matiere et Rayonnement, CNRS; L'Orme des Marisiers, Gif-sur-Yvette (France). Synchrotron SOLEIL
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)

The correlation between the structural phase transition (SPT) and oxygen vacancy in SrRuO₃ (SRO) thin films was investigated by in situ X-ray diffraction (XRD) and ambient pressure X-ray photoelectron spectroscopy (AP-XPS). In situ XRD shows that the SPT occurs from a monoclinic SRO phase to a tetragonal SRO phase near ~200 °C, regardless of the pressure environment. On the other hand, significant core level shifts in both the Ru and Sr photoemission spectra are found under ultrahigh vacuum, but not under the oxygen pressure environment. The directions and behavior of the core level shift of Ru and Sr are attributed to the formation of oxygen vacancy across the SPT temperature of SRO. The analysis of in situ XRD and AP-XPS results provides an evidence for the formation of metastable surface oxide possibly due to the migration of internal oxygen atoms across the SPT temperature, indicating the close relationship between oxygen vacancy and SPT in SRO thin films.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: National Research Foundation of Korea (NRF); USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1760195

Journal Information:: Journal of Chemical Physics, Journal Name: Journal of Chemical Physics Journal Issue: 3 Vol. 152; ISSN 0021-9606

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Title: Correlation between structural phase transition and surface chemical properties of thin film SrRuO₃/SrTiO₃ (001)