Structural properties of ferroelectric heterostructures using coherent bragg rod analysis

Lee, Kyeong Jun; Shin, Yeong Jae; Choi, Taeyang; Noh, Tae Won; Zhou, Hua; Chang, Seo Hyoung

doi:10.1016/j.cap.2020.01.015

Title: Structural properties of ferroelectric heterostructures using coherent bragg rod analysis

Journal Article · 23 January 2020 · Current Applied Physics

DOI: https://doi.org/10.1016/j.cap.2020.01.015 · OSTI ID:1756862

Lee, Kyeong Jun ^[1]; Shin, Yeong Jae ^[2]; Choi, Taeyang ^[1]; Noh, Tae Won ^[3]; Zhou, Hua ^[4];

^[1]

Chung-Ang Univ., Seoul (Korea)
Inst. for Basic Science (IBS), Seoul (Korea, Republic of); Seoul National Univ. (Korea, Republic of); Yale Univ., New Haven, CT (United States)
Inst. for Basic Science (IBS), Seoul (Korea, Republic of); Seoul National Univ. (Korea, Republic of)
Argonne National Lab. (ANL), Lemont, IL (United States)

We investigated the crystal structure of SrRuO₃/BaTiO₃/SrRuO₃ (SRO/BTO/SRO) heterostructures grown on a SrTiO₃ (001) substrate using surface X-ray scattering. The interface structure of SRO/BTO/SRO heterostructures can decrease the critical thickness of ferroelectric BTO films reduced to 3.5 unit cells. Owing to weak intensity of ultrathin films, lab-source-based X-ray measurement cannot determine the atomic arrangement of the heterostructures and their lattice parameters. We introduced synchrotron-based X-ray scattering techniques combined with coherent Bragg rod analysis (COBRA) to resolve the details of the heterostructures. Here, we obtained detailed crystal structural information based on the electron density profiles of the SRO/BTO/SRO heterostructures acquired from COBRA results, e.g., lattice parameters and atomic arrangements.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: Chung-Ang Univ.; USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 1756862

Journal Information:: Current Applied Physics, Journal Name: Current Applied Physics Journal Issue: 4 Vol. 20; ISSN 1567-1739

Publisher:: Korean Physical SocietyCopyright Statement

Country of Publication:: United States

Language:: English

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72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
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