Title: Broadband X-ray ptychography using multi-wavelength algorithm

Abstract

Ptychography is a rapidly developing scanning microscopy which is able to view the internal structures of samples at a high resolution beyond the illumination size. The achieved spatial resolution is theoretically dose-limited. A broadband source can provide much higher flux compared with a monochromatic source; however, it conflicts with the necessary coherence requirements of this coherent diffraction imaging technique. In this paper, a multi-wavelength reconstruction algorithm has been developed to deal with the broad bandwidth in ptychography. Compared with the latest development of mixed-state reconstruction approach, this multi-wavelength approach is more accurate in the physical model, and also considers the spot size variation as a function of energy due to the chromatic focusing optics. Therefore, this method has been proved in both simulation and experiment to significantly improve the reconstruction when the source bandwidth, illumination size and scan step size increase. It is worth mentioning that the accurate and detailed information of the energy spectrum for the incident beam is not required in advance for the proposed method. Further, we combine multi-wavelength and mixed-state approaches to jointly solve temporal and spatial partial coherence in ptychography so that it can handle various disadvantageous experimental effects. The significant relaxation in coherence requirements bymore » our approaches allows the use of high-flux broadband X-ray sources for high-efficient and high-resolution ptychographic imaging.« less

Authors:

Yao, Yudong ;

• Search DOE PAGES for author "Yao, Yudong"
• Search DOE PAGES for ORCID "0000-0001-6442-7079"

Jiang, Yi; Klug, Jeffrey; Nashed, Youssef; Roehrig, Christian; Preissner, Curt; Marin, Fabricio; Wojcik, Michael; Cossairt, Oliver; Cai, Zhonghou; Vogt, Stefan; Lai, Barry; Deng, Junjing

• Search DOE PAGES for author "Deng, Junjing"
• Search DOE PAGES for ORCID "0000-0003-4472-3385"

Publication Date:

Fri Jan 01 00:00:00 EST 2021

Research Org.:

Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS) and Center for Nanoscale Materials (CNM)

Sponsoring Org.:

USDOE Laboratory Directed Research and Development (LDRD) Program; USDOE Office of Science (SC); Office of the Director of National Intelligence (ODNI); Intelligence Advanced Research Projects Activity (IARPA)

OSTI Identifier:

1745073

Alternate Identifier(s):

OSTI ID: 1760013

Grant/Contract Number:  

AC02-06CH11357; 2015-153-N0

Resource Type:

Published Article

Journal Name:

Journal of Synchrotron Radiation (Online)

Additional Journal Information:

Journal Name: Journal of Synchrotron Radiation (Online) Journal Volume: 28 Journal Issue: 1; Journal ID: ISSN 1600-5775

Publisher:

International Union of Crystallography

Country of Publication:

Denmark

Language:

English

Subject:

73 NUCLEAR PHYSICS AND RADIATION PHYSICS; coherent diffraction imaging; ptychography; partial coherence; high-throughput