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Title: Local characterization of a heavy-fermion superconductor via sub-Kelvin magnetic force microscopy

Authors:
ORCiD logo [1];  [2];  [3];  [3];  [4];  [4];  [4];  [2]
  1. Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul 08826, South Korea, Department of Physics and Astronomy, Seoul National University (SNU), Seoul 08826, South Korea
  2. Max Planck POSTECH Center for Complex Phase Materials, Pohang University of Science and Technology, Pohang 37673, South Korea, Department of Physics, Pohang University of Science and Technology, Pohang 37673, South Korea
  3. Department of Physics, Pohang University of Science and Technology, Pohang 37673, South Korea, Center for Artificial Low Dimensional Electronic Systems, Institute for Basic Science, Pohang 37673, South Korea
  4. Los Alamos National Laboratory, MPA-CMMS, Los Alamos, New Mexico 87545, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1737702
Grant/Contract Number:  
Basic Energy Sciences; Division of Materials Sciences; Engineering
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Name: Applied Physics Letters Journal Volume: 117 Journal Issue: 25; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Wulferding, Dirk, Kim, Geunyong, Kim, Hoon, Yang, Ilkyu, Bauer, E. D., Ronning, F., Movshovich, R., and Kim, Jeehoon. Local characterization of a heavy-fermion superconductor via sub-Kelvin magnetic force microscopy. United States: N. p., 2020. Web. https://doi.org/10.1063/5.0028517.
Wulferding, Dirk, Kim, Geunyong, Kim, Hoon, Yang, Ilkyu, Bauer, E. D., Ronning, F., Movshovich, R., & Kim, Jeehoon. Local characterization of a heavy-fermion superconductor via sub-Kelvin magnetic force microscopy. United States. https://doi.org/10.1063/5.0028517
Wulferding, Dirk, Kim, Geunyong, Kim, Hoon, Yang, Ilkyu, Bauer, E. D., Ronning, F., Movshovich, R., and Kim, Jeehoon. Mon . "Local characterization of a heavy-fermion superconductor via sub-Kelvin magnetic force microscopy". United States. https://doi.org/10.1063/5.0028517.
@article{osti_1737702,
title = {Local characterization of a heavy-fermion superconductor via sub-Kelvin magnetic force microscopy},
author = {Wulferding, Dirk and Kim, Geunyong and Kim, Hoon and Yang, Ilkyu and Bauer, E. D. and Ronning, F. and Movshovich, R. and Kim, Jeehoon},
abstractNote = {},
doi = {10.1063/5.0028517},
journal = {Applied Physics Letters},
number = 25,
volume = 117,
place = {United States},
year = {2020},
month = {12}
}

Journal Article:
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