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Title: The Effect of Intensity Fluctuations on Sequential X-ray Photon Correlation Spectroscopy at the X-ray Free Electron Laser Facilities

Abstract

How materials evolve at thermal equilibrium and under external excitations at small length and time scales is crucial to the understanding and control of material properties. X-ray photon correlation spectroscopy (XPCS) at X-ray free electron laser (XFEL) facilities can in principle capture dynamics of materials that are substantially faster than a millisecond. However, the analysis and interpretation of XPCS data is hindered by the strongly fluctuating X-ray intensity from XFELs. Here we examine the impact of pulse-to-pulse intensity fluctuations on sequential XPCS analysis. We show that the conventional XPCS analysis can still faithfully capture the characteristic time scales, but with substantial decrease in the signal-to-noise ratio of the g2 function and increase in the uncertainties of the extracted time constants. We also demonstrate protocols for improving the signal-to-noise ratio and reducing the uncertainties.

Authors:
ORCiD logo [1]; ORCiD logo [1];  [2]; ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [3]; ORCiD logo [4]; ORCiD logo [2];  [2]; ORCiD logo [1]; ORCiD logo [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division
  2. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
  3. Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division; Simon Fraser Univ., Burnaby, BC (Canada)
  4. Simon Fraser Univ., Burnaby, BC (Canada)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division; Natural Sciences and Engineering Research Council of Canada (NSERC)
OSTI Identifier:
1734888
Grant/Contract Number:  
AC02-06CH11357; RGPIN-2017-06915
Resource Type:
Accepted Manuscript
Journal Name:
Crystals
Additional Journal Information:
Journal Volume: 10; Journal Issue: 12; Journal ID: ISSN 2073-4352
Publisher:
MDPI
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; X-ray free electron laser; X-ray intensity fluctuations; X-ray photon correlation spectroscopy; speckle visibility

Citation Formats

Cao, Yue, Sheyfer, Dina, Jiang, Zhang, Maddali, Siddharth, You, Hoydoo, Wang, Bi-Xia, Ye, Zuo-Guang, Dufresne, Eric M., Zhou, Hua, Stephenson, G. Brian, and Hruszkewycz, Stephan O.. The Effect of Intensity Fluctuations on Sequential X-ray Photon Correlation Spectroscopy at the X-ray Free Electron Laser Facilities. United States: N. p., 2020. Web. https://doi.org/10.3390/cryst10121109.
Cao, Yue, Sheyfer, Dina, Jiang, Zhang, Maddali, Siddharth, You, Hoydoo, Wang, Bi-Xia, Ye, Zuo-Guang, Dufresne, Eric M., Zhou, Hua, Stephenson, G. Brian, & Hruszkewycz, Stephan O.. The Effect of Intensity Fluctuations on Sequential X-ray Photon Correlation Spectroscopy at the X-ray Free Electron Laser Facilities. United States. https://doi.org/10.3390/cryst10121109
Cao, Yue, Sheyfer, Dina, Jiang, Zhang, Maddali, Siddharth, You, Hoydoo, Wang, Bi-Xia, Ye, Zuo-Guang, Dufresne, Eric M., Zhou, Hua, Stephenson, G. Brian, and Hruszkewycz, Stephan O.. Fri . "The Effect of Intensity Fluctuations on Sequential X-ray Photon Correlation Spectroscopy at the X-ray Free Electron Laser Facilities". United States. https://doi.org/10.3390/cryst10121109. https://www.osti.gov/servlets/purl/1734888.
@article{osti_1734888,
title = {The Effect of Intensity Fluctuations on Sequential X-ray Photon Correlation Spectroscopy at the X-ray Free Electron Laser Facilities},
author = {Cao, Yue and Sheyfer, Dina and Jiang, Zhang and Maddali, Siddharth and You, Hoydoo and Wang, Bi-Xia and Ye, Zuo-Guang and Dufresne, Eric M. and Zhou, Hua and Stephenson, G. Brian and Hruszkewycz, Stephan O.},
abstractNote = {How materials evolve at thermal equilibrium and under external excitations at small length and time scales is crucial to the understanding and control of material properties. X-ray photon correlation spectroscopy (XPCS) at X-ray free electron laser (XFEL) facilities can in principle capture dynamics of materials that are substantially faster than a millisecond. However, the analysis and interpretation of XPCS data is hindered by the strongly fluctuating X-ray intensity from XFELs. Here we examine the impact of pulse-to-pulse intensity fluctuations on sequential XPCS analysis. We show that the conventional XPCS analysis can still faithfully capture the characteristic time scales, but with substantial decrease in the signal-to-noise ratio of the g2 function and increase in the uncertainties of the extracted time constants. We also demonstrate protocols for improving the signal-to-noise ratio and reducing the uncertainties.},
doi = {10.3390/cryst10121109},
journal = {Crystals},
number = 12,
volume = 10,
place = {United States},
year = {2020},
month = {12}
}

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