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Title: X-ray Laue Microdiffraction and Raman Spectroscopic Investigation of Natural Silicon and Moissanite

Abstract

Moissanite, SiC, is an uncommon accessory mineral that forms under low oxygen fugacity. Here, we analyze natural SiC from a Miocene tuff-sandstone using synchrotron Laue microdiffraction and Raman spectroscopy, in order to better understand the SiC phases and formation physics. The studied crystals of SiC consist of 4H- and 6H-SiC domains, formed from either, continuous growth or, in one case, intergrown, together with native Si. The native Si is polycrystalline, with a large crystal size relative to the analytical beam dimensions (>1–2 μm). We find that the intergrown region shows low distortion or dislocation density in SiC, but these features are comparatively high in Si. The distortion/deformation observed in Si may have been caused by a mismatch in the coefficients of thermal expansion of the two materials. Raman spectroscopic measurements are discussed in combination with our Laue microdiffraction results. Our results suggest that these SiC grains likely grew from an igneous melt.

Authors:
ORCiD logo [1];  [1];  [2]; ORCiD logo [3]; ORCiD logo [4]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  2. Ore Deposits, Tel Aviv (Israel)
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
  4. Univ. of California, Riverside, CA (United States)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1695719
Alternate Identifier(s):
OSTI ID: 1783438
Report Number(s):
LLNL-JRNL-807178
Journal ID: ISSN 2075-163X; ark:/13030/qt58b7608p
Grant/Contract Number:  
AC02-05CH11231; AC52-07NA27344
Resource Type:
Accepted Manuscript
Journal Name:
Minerals
Additional Journal Information:
Journal Volume: 10; Journal Issue: 3; Journal ID: ISSN 2075-163X
Publisher:
MDPI
Country of Publication:
United States
Language:
English
Subject:
58 GEOSCIENCES; SiC; Laue diffraction; microdiffraction; natural silicon; moissanite; Si; synchrotron; polymorph; mineral deformation

Citation Formats

Stan, Camelia Veronica, O’Bannon, Earl Francis, Mukhin, Pavel, Tamura, Nobumichi, and Dobrzhinetskaya, Larissa. X-ray Laue Microdiffraction and Raman Spectroscopic Investigation of Natural Silicon and Moissanite. United States: N. p., 2020. Web. https://doi.org/10.3390/min10030204.
Stan, Camelia Veronica, O’Bannon, Earl Francis, Mukhin, Pavel, Tamura, Nobumichi, & Dobrzhinetskaya, Larissa. X-ray Laue Microdiffraction and Raman Spectroscopic Investigation of Natural Silicon and Moissanite. United States. https://doi.org/10.3390/min10030204
Stan, Camelia Veronica, O’Bannon, Earl Francis, Mukhin, Pavel, Tamura, Nobumichi, and Dobrzhinetskaya, Larissa. Tue . "X-ray Laue Microdiffraction and Raman Spectroscopic Investigation of Natural Silicon and Moissanite". United States. https://doi.org/10.3390/min10030204. https://www.osti.gov/servlets/purl/1695719.
@article{osti_1695719,
title = {X-ray Laue Microdiffraction and Raman Spectroscopic Investigation of Natural Silicon and Moissanite},
author = {Stan, Camelia Veronica and O’Bannon, Earl Francis and Mukhin, Pavel and Tamura, Nobumichi and Dobrzhinetskaya, Larissa},
abstractNote = {Moissanite, SiC, is an uncommon accessory mineral that forms under low oxygen fugacity. Here, we analyze natural SiC from a Miocene tuff-sandstone using synchrotron Laue microdiffraction and Raman spectroscopy, in order to better understand the SiC phases and formation physics. The studied crystals of SiC consist of 4H- and 6H-SiC domains, formed from either, continuous growth or, in one case, intergrown, together with native Si. The native Si is polycrystalline, with a large crystal size relative to the analytical beam dimensions (>1–2 μm). We find that the intergrown region shows low distortion or dislocation density in SiC, but these features are comparatively high in Si. The distortion/deformation observed in Si may have been caused by a mismatch in the coefficients of thermal expansion of the two materials. Raman spectroscopic measurements are discussed in combination with our Laue microdiffraction results. Our results suggest that these SiC grains likely grew from an igneous melt.},
doi = {10.3390/min10030204},
journal = {Minerals},
number = 3,
volume = 10,
place = {United States},
year = {2020},
month = {2}
}

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