Controlling Thin-Film Stress and Wrinkling during Perovskite Film Formation
Abstract
Significant effort has focused on controlling the deposition of perovskite films to enable uniform films, enabling efficiencies to climb dramatically. However, little attention has been paid to the evolution of thin-film stresses during deposition and the consequent effect on film morphology. While a textured surface topology has potential benefits for light scattering, a smooth surface is desirable to enable the pinhole-free deposition of contact layers. In this paper, we show that the highly textured morphology made by popular antisolvent conversion methods arises because of in-plane compressive stress experienced during the intermediate phase of film formation where the substrate constrains the film from expanding—leading to energy release in the form of wrinkling, resulting in trenches that can be hundreds of nanometers deep with periods of several micrometers. Finally, we demonstrate that the extent of wrinkling is correlated with the rate of film conversion and that ultrasmooth films are obtained by slowing the rate of film formation.
- Authors:
-
- Stanford Univ., CA (United States)
- Stanford Univ., CA (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Arizona State Univ., Tempe, AZ (United States)
- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Stanford Univ., CA (United States); Univ. of Colorado, Boulder, CO (United States)
- Publication Date:
- Research Org.:
- SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States); Stanford Univ., CA (United States)
- Sponsoring Org.:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office; National Science Foundation (NSF)
- OSTI Identifier:
- 1693766
- Alternate Identifier(s):
- OSTI ID: 1469597
- Grant/Contract Number:
- EE0008167; AC02-76SF00515; EE0008154; EE0004946; DGE-1656518; ECCS-1542152
- Resource Type:
- Accepted Manuscript
- Journal Name:
- ACS Energy Letters
- Additional Journal Information:
- Journal Volume: 3; Journal Issue: 6; Journal ID: ISSN 2380-8195
- Publisher:
- American Chemical Society (ACS)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; Stress; Morphology; Thin films; Solar cells; Perovskites
Citation Formats
Bush, Kevin A., Rolston, Nicholas, Gold-Parker, Aryeh, Manzoor, Salman, Hausele, Jakob, Yu, Zhengshan J., Raiford, James A., Cheacharoen, Rongrong, Holman, Zachary C., Toney, Michael F., Dauskardt, Reinhold H., and McGehee, Michael D. Controlling Thin-Film Stress and Wrinkling during Perovskite Film Formation. United States: N. p., 2018.
Web. doi:10.1021/acsenergylett.8b00544.
Bush, Kevin A., Rolston, Nicholas, Gold-Parker, Aryeh, Manzoor, Salman, Hausele, Jakob, Yu, Zhengshan J., Raiford, James A., Cheacharoen, Rongrong, Holman, Zachary C., Toney, Michael F., Dauskardt, Reinhold H., & McGehee, Michael D. Controlling Thin-Film Stress and Wrinkling during Perovskite Film Formation. United States. https://doi.org/10.1021/acsenergylett.8b00544
Bush, Kevin A., Rolston, Nicholas, Gold-Parker, Aryeh, Manzoor, Salman, Hausele, Jakob, Yu, Zhengshan J., Raiford, James A., Cheacharoen, Rongrong, Holman, Zachary C., Toney, Michael F., Dauskardt, Reinhold H., and McGehee, Michael D. Tue .
"Controlling Thin-Film Stress and Wrinkling during Perovskite Film Formation". United States. https://doi.org/10.1021/acsenergylett.8b00544. https://www.osti.gov/servlets/purl/1693766.
@article{osti_1693766,
title = {Controlling Thin-Film Stress and Wrinkling during Perovskite Film Formation},
author = {Bush, Kevin A. and Rolston, Nicholas and Gold-Parker, Aryeh and Manzoor, Salman and Hausele, Jakob and Yu, Zhengshan J. and Raiford, James A. and Cheacharoen, Rongrong and Holman, Zachary C. and Toney, Michael F. and Dauskardt, Reinhold H. and McGehee, Michael D.},
abstractNote = {Significant effort has focused on controlling the deposition of perovskite films to enable uniform films, enabling efficiencies to climb dramatically. However, little attention has been paid to the evolution of thin-film stresses during deposition and the consequent effect on film morphology. While a textured surface topology has potential benefits for light scattering, a smooth surface is desirable to enable the pinhole-free deposition of contact layers. In this paper, we show that the highly textured morphology made by popular antisolvent conversion methods arises because of in-plane compressive stress experienced during the intermediate phase of film formation where the substrate constrains the film from expanding—leading to energy release in the form of wrinkling, resulting in trenches that can be hundreds of nanometers deep with periods of several micrometers. Finally, we demonstrate that the extent of wrinkling is correlated with the rate of film conversion and that ultrasmooth films are obtained by slowing the rate of film formation.},
doi = {10.1021/acsenergylett.8b00544},
journal = {ACS Energy Letters},
number = 6,
volume = 3,
place = {United States},
year = {Tue May 01 00:00:00 EDT 2018},
month = {Tue May 01 00:00:00 EDT 2018}
}
Web of Science
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