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Title: The electrical sintering and fusing effects of Aerosol-Jet printed silver conductive line

Journal Article · · Materials Letters

Sponsoring Organization:
USDOE Office of Electricity (OE), Advanced Grid Research & Development. Power Systems Engineering Research
Grant/Contract Number:
BE2015071; 2016YFA0200700
OSTI ID:
1682445
Journal Information:
Materials Letters, Journal Name: Materials Letters Vol. 246 Journal Issue: C; ISSN 0167-577X
Publisher:
ElsevierCopyright Statement
Country of Publication:
Netherlands
Language:
English

References (15)

A Circuits and Systems Perspective of Organic/Printed Electronics: Review, Challenges, and Contemporary and Emerging Design Approaches journal March 2017
Conductive Nanomaterials for Printed Electronics journal January 2014
Electrical sintering of nanoparticle structures journal March 2008
Inkjet-Printed Multi-Bit Low-Voltage Fuse-Type Write-Once-Read-Many Memory Cell journal July 2016
A simple technique to prevent electromigration damage in printed Ag thin wires journal August 2018
A percolative approach to investigate electromigration failure in printed Ag structures journal September 2016
Morphological influences on the electrical sintering process of Aerosol Jet and Ink Jet printed silver microstructures journal August 2013
Metal aerosol jet printing for solar cell metallization journal January 2007
Optimization of Aerosol Jet Printing for High-Resolution, High-Aspect Ratio Silver Lines journal May 2013
Aerosol jet printed grid for ITO-free inverted organic solar cells journal December 2012
Advanced Package Prototyping Using Nano-Particle Silver Printed Interconnects journal April 2010
Printed-Sensor-on-Chip devices – Aerosol jet deposition of thin film relative humidity sensors onto packaged integrated circuits journal February 2018
Additive Manufacturing Technologies Compared: Morphology of Deposits of Silver Ink Using Inkjet and Aerosol Jet Printing journal January 2015
Flexible transparent conductive films combining flexographic printed silver grids with CNT coating journal January 2016
Current-crowding-induced electromigration failure in flip chip solder joints journal January 2002

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