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Title: Mechanical performance of co-deposited immiscible Cu–Ta thin films

Abstract

Abstract The immiscible alloy Cu–Ta has the potential for enhanced mechanical performance in applications as a functional coating. To establish baseline mechanical properties, four Cu–Ta films were co-sputtered at the temperatures 23, 400, 600, and 800 °C and tested with nanoindentation at strain rates 5 $$$$\times $$$$ × 10 −3  s −1 to 10 s −1 . Each film had a unique microstructure morphology. The hardness and elastic modulus of the four films were insensitive to strain rate changes. Instead, the measured properties were spatially dependent, particularly in the 600 and 800 °C films. In those two films, there is a bimodal deformation behavior due to Cu-agglomeration under protruding grains and planar Ta-rich regions. Increasing the indentation depth revealed shear band suppression which is related to a homogenous distribution of flow stresses for all four microstructure morphologies. Finally, the Cu–Ta hardness appeared to follow a rule-of-mixtures when compared to extrapolated data of Cu and Ta monolithic films.

Authors:
; ;
Publication Date:
Research Org.:
Univ. of Michigan, Ann Arbor, MI (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1678789
Alternate Identifier(s):
OSTI ID: 1678705
Grant/Contract Number:  
NA0003857
Resource Type:
Published Article
Journal Name:
Scientific Reports
Additional Journal Information:
Journal Name: Scientific Reports Journal Volume: 10 Journal Issue: 1; Journal ID: ISSN 2045-2322
Publisher:
Nature Publishing Group
Country of Publication:
United Kingdom
Language:
English
Subject:
36 MATERIALS SCIENCE; Immiscible Alloys; Nanoindentation; Cu-Ta; Strain-rate sensitivity; Mechanical properties; Metals and alloys; Structural properties; Synthesis and processing

Citation Formats

Raeker, Evan, Powers, Max, and Misra, Amit. Mechanical performance of co-deposited immiscible Cu–Ta thin films. United Kingdom: N. p., 2020. Web. doi:10.1038/s41598-020-74903-2.
Raeker, Evan, Powers, Max, & Misra, Amit. Mechanical performance of co-deposited immiscible Cu–Ta thin films. United Kingdom. https://doi.org/10.1038/s41598-020-74903-2
Raeker, Evan, Powers, Max, and Misra, Amit. Tue . "Mechanical performance of co-deposited immiscible Cu–Ta thin films". United Kingdom. https://doi.org/10.1038/s41598-020-74903-2.
@article{osti_1678789,
title = {Mechanical performance of co-deposited immiscible Cu–Ta thin films},
author = {Raeker, Evan and Powers, Max and Misra, Amit},
abstractNote = {Abstract The immiscible alloy Cu–Ta has the potential for enhanced mechanical performance in applications as a functional coating. To establish baseline mechanical properties, four Cu–Ta films were co-sputtered at the temperatures 23, 400, 600, and 800 °C and tested with nanoindentation at strain rates 5 $$\times $$ × 10 −3  s −1 to 10 s −1 . Each film had a unique microstructure morphology. The hardness and elastic modulus of the four films were insensitive to strain rate changes. Instead, the measured properties were spatially dependent, particularly in the 600 and 800 °C films. In those two films, there is a bimodal deformation behavior due to Cu-agglomeration under protruding grains and planar Ta-rich regions. Increasing the indentation depth revealed shear band suppression which is related to a homogenous distribution of flow stresses for all four microstructure morphologies. Finally, the Cu–Ta hardness appeared to follow a rule-of-mixtures when compared to extrapolated data of Cu and Ta monolithic films.},
doi = {10.1038/s41598-020-74903-2},
journal = {Scientific Reports},
number = 1,
volume = 10,
place = {United Kingdom},
year = {Tue Oct 20 00:00:00 EDT 2020},
month = {Tue Oct 20 00:00:00 EDT 2020}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1038/s41598-020-74903-2

Figures / Tables:

Figure 1 Figure 1: HAADF-STEM cross-sectional micrographs of the films of the four deposition temperatures. Ta-rich regions are lighter contrast, Cu-rich regions are darker contrast. (top left, (a)) 23 °C, with nanocrystalline Cu–Ta phase separated regions as indicated by high resolution TEM inset. (top right, (b)) 400 °C, alternating concentration modulations orientedmore » perpendicular to the growth direction. (bottom left, (c)) 600 °C, Cu-rich agglomerates surrounded by Ta-rich veins, note the fine Ta-rich groups in the Cu-rich agglomerates. (bottom right, (d)) 800 °C, similar agglomerate-vein microstructure but with noticeably larger hierarchical features, particularly the Ta-rich clusters in the Cu agglomerates.« less

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Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.