DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Micromachined Silicon Platform for Precise Assembly of 2D Multilayer Laue Lenses for High-Resolution X-ray Microscopy

Abstract

We report on a developed micromachined silicon platform for the precise assembly of 2D multilayer Laue lenses (MLLs) for high-resolution X-ray microscopy. The platform is 10 × 10 mm2 and is fabricated on ~500 µm thick silicon wafers through multiple steps of photolithography and deep reactive-ion etching. The platform accommodates two linear MLLs in a pre-defined configuration with precise angular and lateral position control. In this work, we discuss the design and microfabrication of the platform, and characterization regarding MLLs assembly, position control, repeatability, and stability. The results demonstrate that a micromachined platform can be used for the assembly of a variety of MLLs with different dimensions and optical parameters. The angular misalignment of 2D MLLs is well controlled in the range of the designed accuracy, down to a few millidegrees. The separation distance between MLLs is adjustable from hundreds to more than one thousand micrometers. The use of the developed platform greatly simplifies the alignment procedure of the MLL optics and reduces the complexity of the X-ray microscope. It is a significant step forward for the development of monolithic 2D MLL nanofocusing optics for high-resolution X-ray microscopy.

Authors:
; ; ORCiD logo; ; ; ; ORCiD logo; ; ; ORCiD logo
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1677518
Alternate Identifier(s):
OSTI ID: 1725765
Report Number(s):
BNL-220655-2020-JAAM
Journal ID: ISSN 2072-666X; PII: mi11100939
Grant/Contract Number:  
LDRD 17-017; SC0012704
Resource Type:
Published Article
Journal Name:
Micromachines
Additional Journal Information:
Journal Name: Micromachines Journal Volume: 11 Journal Issue: 10; Journal ID: ISSN 2072-666X
Publisher:
MDPI
Country of Publication:
Switzerland
Language:
English
Subject:
36 MATERIALS SCIENCE; MEMS; microfabrication; multilayer Laue lenses; x-ray microscopy

Citation Formats

Xu, Wei, Xu, Weihe, Bouet, Nathalie, Zhou, Juan, Yan, Hanfei, Huang, Xiaojing, Lu, Ming, Zalalutdinov, Maxim, Chu, Yong, and Nazaretski, Evgeny. Micromachined Silicon Platform for Precise Assembly of 2D Multilayer Laue Lenses for High-Resolution X-ray Microscopy. Switzerland: N. p., 2020. Web. doi:10.3390/mi11100939.
Xu, Wei, Xu, Weihe, Bouet, Nathalie, Zhou, Juan, Yan, Hanfei, Huang, Xiaojing, Lu, Ming, Zalalutdinov, Maxim, Chu, Yong, & Nazaretski, Evgeny. Micromachined Silicon Platform for Precise Assembly of 2D Multilayer Laue Lenses for High-Resolution X-ray Microscopy. Switzerland. https://doi.org/10.3390/mi11100939
Xu, Wei, Xu, Weihe, Bouet, Nathalie, Zhou, Juan, Yan, Hanfei, Huang, Xiaojing, Lu, Ming, Zalalutdinov, Maxim, Chu, Yong, and Nazaretski, Evgeny. Thu . "Micromachined Silicon Platform for Precise Assembly of 2D Multilayer Laue Lenses for High-Resolution X-ray Microscopy". Switzerland. https://doi.org/10.3390/mi11100939.
@article{osti_1677518,
title = {Micromachined Silicon Platform for Precise Assembly of 2D Multilayer Laue Lenses for High-Resolution X-ray Microscopy},
author = {Xu, Wei and Xu, Weihe and Bouet, Nathalie and Zhou, Juan and Yan, Hanfei and Huang, Xiaojing and Lu, Ming and Zalalutdinov, Maxim and Chu, Yong and Nazaretski, Evgeny},
abstractNote = {We report on a developed micromachined silicon platform for the precise assembly of 2D multilayer Laue lenses (MLLs) for high-resolution X-ray microscopy. The platform is 10 × 10 mm2 and is fabricated on ~500 µm thick silicon wafers through multiple steps of photolithography and deep reactive-ion etching. The platform accommodates two linear MLLs in a pre-defined configuration with precise angular and lateral position control. In this work, we discuss the design and microfabrication of the platform, and characterization regarding MLLs assembly, position control, repeatability, and stability. The results demonstrate that a micromachined platform can be used for the assembly of a variety of MLLs with different dimensions and optical parameters. The angular misalignment of 2D MLLs is well controlled in the range of the designed accuracy, down to a few millidegrees. The separation distance between MLLs is adjustable from hundreds to more than one thousand micrometers. The use of the developed platform greatly simplifies the alignment procedure of the MLL optics and reduces the complexity of the X-ray microscope. It is a significant step forward for the development of monolithic 2D MLL nanofocusing optics for high-resolution X-ray microscopy.},
doi = {10.3390/mi11100939},
journal = {Micromachines},
number = 10,
volume = 11,
place = {Switzerland},
year = {Thu Oct 15 00:00:00 EDT 2020},
month = {Thu Oct 15 00:00:00 EDT 2020}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.3390/mi11100939

Save / Share:

Works referenced in this record:

Optical Properties of MoSi 2 /Si Multilayer Laue Lens as Nanometer X-ray Focusing Device
journal, October 2008

  • Koyama, Takahisa; Ichimaru, Satoshi; Tsuji, Takuya
  • Applied Physics Express, Vol. 1
  • DOI: 10.1143/APEX.1.117003

Lanthanide-Binding Tags for 3D X-ray Imaging of Proteins in Cells at Nanoscale Resolution
journal, January 2020

  • Victor, Tiffany W.; O’Toole, Katherine H.; Easthon, Lindsey M.
  • Journal of the American Chemical Society, Vol. 142, Issue 5
  • DOI: 10.1021/jacs.9b11571

Multilayer Laue Lens: A Brief History and Current Status
journal, July 2016


Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material science
journal, March 2018


Two dimensional hard x-ray nanofocusing with crossed multilayer Laue lenses
journal, January 2011

  • Yan, Hanfei; Rose, Volker; Shu, Deming
  • Optics Express, Vol. 19, Issue 16
  • DOI: 10.1364/OE.19.015069

2D MEMS-based multilayer Laue lens nanofocusing optics for high-resolution hard x-ray microscopy
journal, January 2020

  • Xu, Wei; Xu, Weihe; Bouet, Nathalie
  • Optics Express, Vol. 28, Issue 12
  • DOI: 10.1364/OE.389555

Breaking the 10 nm barrier in hard-X-ray focusing
journal, November 2009

  • Mimura, Hidekazu; Handa, Soichiro; Kimura, Takashi
  • Nature Physics, Vol. 6, Issue 2
  • DOI: 10.1038/nphys1457

X-ray focusing with efficient high-NA multilayer Laue lenses
journal, November 2017

  • Bajt, Saša; Prasciolu, Mauro; Fleckenstein, Holger
  • Light: Science & Applications, Vol. 7, Issue 3
  • DOI: 10.1038/lsa.2017.162

ID16B: a hard X-ray nanoprobe beamline at the ESRF for nano-analysis
journal, January 2016

  • Martínez-Criado, Gema; Villanova, Julie; Tucoulou, Rémi
  • Journal of Synchrotron Radiation, Vol. 23, Issue 1
  • DOI: 10.1107/S1600577515019839

Multimodal X-ray imaging of grain-level properties and performance in a polycrystalline solar cell
journal, May 2019

  • Ulvestad, A.; Hruszkewycz, S. O.; Holt, M. V.
  • Journal of Synchrotron Radiation, Vol. 26, Issue 4
  • DOI: 10.1107/S1600577519003606

Tunable hard x-ray nanofocusing with Fresnel zone plates fabricated using deep etching
journal, January 2020


Performance and characterization of the prototype nm-scale spatial resolution scanning multilayer Laue lenses microscope
journal, March 2013

  • Nazaretski, E.; Kim, Jungdae; Yan, H.
  • Review of Scientific Instruments, Vol. 84, Issue 3
  • DOI: 10.1063/1.4774387

Ptychography with multilayer Laue lenses
journal, August 2014


Fabrication of multilayer Laue lenses by a combination of pulsed laser deposition and focused ion beam
journal, July 2010

  • Liese, Tobias; Radisch, Volker; Krebs, Hans-Ulrich
  • Review of Scientific Instruments, Vol. 81, Issue 7
  • DOI: 10.1063/1.3462985

Design and performance of a scanning ptychography microscope
journal, March 2014

  • Nazaretski, E.; Huang, X.; Yan, H.
  • Review of Scientific Instruments, Vol. 85, Issue 3
  • DOI: 10.1063/1.4868968

Strain Mapping of CdTe Grains in Photovoltaic Devices
journal, November 2019


Multimodality hard-x-ray imaging of a chromosome with nanoscale spatial resolution
journal, February 2016

  • Yan, Hanfei; Nazaretski, Evgeny; Lauer, Kenneth
  • Scientific Reports, Vol. 6, Issue 1
  • DOI: 10.1038/srep20112

OMNY—A tOMography Nano crYo stage
journal, April 2018

  • Holler, M.; Raabe, J.; Diaz, A.
  • Review of Scientific Instruments, Vol. 89, Issue 4
  • DOI: 10.1063/1.5020247

Focusing of hard x-rays to 16 nanometers with a multilayer Laue lens
journal, June 2008

  • Kang, Hyon Chol; Yan, Hanfei; Winarski, Robert P.
  • Applied Physics Letters, Vol. 92, Issue 22
  • DOI: 10.1063/1.2912503

In-situ synchrotron x-ray studies of the microstructure and stability of In 2 O 3 epitaxial films
journal, October 2017

  • Highland, M. J.; Hruszkewycz, S. O.; Fong, D. D.
  • Applied Physics Letters, Vol. 111, Issue 16
  • DOI: 10.1063/1.4997773

Fabrication and efficiency measurement of a Mo/C/Si/C three material system multilayer Laue lens
journal, March 2017

  • Kubec, A.; Maser, J.; Formánek, P.
  • Applied Physics Letters, Vol. 110, Issue 11
  • DOI: 10.1063/1.4978610

Pushing the limits: an instrument for hard X-ray imaging below 20 nm
journal, January 2015


Optomechanical Design of a Multilayer Laue Lens Test Bed for 10-nm Focusing of Hard X-rays
journal, October 2013


Design and performance of an X-ray scanning microscope at the Hard X-ray Nanoprobe beamline of NSLS-II
journal, October 2017


Development and characterization of monolithic multilayer Laue lens nanofocusing optics
journal, June 2016

  • Nazaretski, E.; Xu, W.; Bouet, N.
  • Applied Physics Letters, Vol. 108, Issue 26
  • DOI: 10.1063/1.4955022

Hard x-ray nanofocusing by multilayer Laue lenses
journal, June 2014


Point focusing with flat and wedged crossed multilayer Laue lenses
journal, February 2017

  • Kubec, Adam; Melzer, Kathleen; Gluch, Jürgen
  • Journal of Synchrotron Radiation, Vol. 24, Issue 2
  • DOI: 10.1107/S1600577517001722

High-sensitivity nanoscale chemical imaging with hard x-ray nano-XANES
journal, September 2020


Efficient concentration of high-energy x-rays for diffraction-limited imaging resolution
journal, January 2017


Achieving diffraction-limited nanometer-scale X-ray point focus with two crossed multilayer Laue lenses: alignment challenges
journal, January 2017

  • Yan, Hanfei; Huang, Xiaojing; Bouet, Nathalie
  • Optics Express, Vol. 25, Issue 21
  • DOI: 10.1364/OE.25.025234